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Extract from the Register of European Patents

EP About this file: EP2411864

EP2411864 - PROCESS OF PREPARING AN ANISOTROPIC MULTILAYER USING PARTICLE BEAM ALIGNMENT [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  01.09.2017
Database last updated on 28.09.2024
FormerGrant of patent is intended
Status updated on  23.11.2016
Most recent event   Tooltip01.09.2017Application deemed to be withdrawnpublished on 04.10.2017  [2017/40]
Applicant(s)For all designated states
Merck Patent GmbH
Frankfurter Strasse 250
64293 Darmstadt / DE
[2012/05]
Inventor(s)01 / PARRI, Owain, Llyr
Ibis House
215A Christchurch Road
Ringwood
Hampshire BH24 3AN / GB
02 / YAROSHCHUK, Oleg
Ozerna Street 9
Apt. 62
Kyiv 03110 / UA
03 / KRAVCHUK, Ruslan
Kustanayska St., 11 Apt.15
03118 Kiew / UA
[N/P]
Former [2012/05]01 / PARRI, Owain, Llyr
Ibis House
215A Christchurch Road
Ringwood
Hampshire BH24 3AN / GB
02 / YAROSHCHUK, Oleg
Ozerna Street 9
Apt. 62
Kyiv 03110 / UA
03 / KRAVCHUK, Ruslan
Kustanayska St., 11 Apt.15
03118 Kiew / UA
Representative(s)(deleted)
[2012/05]
Application number, filing date10709414.611.03.2010
WO2010EP01500
Priority number, dateEP2009000433226.03.2009         Original published format: EP 09004332
EP2009000488602.04.2009         Original published format: EP 09004886
[2012/05]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2010108593
Date:30.09.2010
Language:EN
[2010/39]
Type: A1 Application with search report 
No.:EP2411864
Date:01.02.2012
Language:EN
The application published by WIPO in one of the EPO official languages on 30.09.2010 takes the place of the publication of the European patent application.
[2012/05]
Search report(s)International search report - published on:EP30.09.2010
ClassificationIPC:G02B5/30, G02F1/1337
[2016/45]
CPC:
G02B5/3016 (EP,US); G02F1/1337 (KR); B32B37/00 (KR);
G02F1/13363 (KR); G02F1/13378 (EP,KR,US); B32B2305/55 (EP,KR,US);
B32B2307/42 (EP,KR,US); B32B2310/0875 (EP,KR,US) (-)
Former IPC [2012/05]G02F1/1337, G02F1/13363, B32B37/00
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   SM,   TR [2012/05]
TitleGerman:VERFAHREN ZUR HERSTELLUNG EINER ANISOTROPEN MEHRFACHSCHICHT DURCH PARTIKELSTRAHLAUSRICHTUNG[2012/05]
English:PROCESS OF PREPARING AN ANISOTROPIC MULTILAYER USING PARTICLE BEAM ALIGNMENT[2012/05]
French:PROCÉDÉ DE FABRICATION D'UN ÉLÉMENT MULTI COUCHES ANISOTROPIQUE A L'AIDE D'UN FAISCEAU À PARTICULES[2016/45]
Former [2012/05]PROCÉDÉ DE PRÉPARATION D'UNE MULTICOUCHE ANISOTROPE À L'AIDE D'UN ALIGNEMENT DE FAISCEAU DE PARTICULES
Entry into regional phase14.07.2011National basic fee paid 
14.07.2011Designation fee(s) paid 
14.07.2011Examination fee paid 
Examination procedure14.07.2011Examination requested  [2012/05]
30.04.2012Amendment by applicant (claims and/or description)
24.11.2016Communication of intention to grant the patent
05.04.2017Application deemed to be withdrawn, date of legal effect  [2017/40]
15.05.2017Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time  [2017/40]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  24.11.2016
Fees paidRenewal fee
14.03.2012Renewal fee patent year 03
11.03.2013Renewal fee patent year 04
12.03.2014Renewal fee patent year 05
10.03.2015Renewal fee patent year 06
10.03.2016Renewal fee patent year 07
Penalty fee
Additional fee for renewal fee
31.03.201708   M06   Not yet paid
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Cited inInternational search[XDI]WO2008028553  (MERCK PATENT GMBH [DE], et al) [XD] 1,2,4,7-9,11-14 * page 39, lines 8-11 * * page 40, lines 4-11 * * figure 3 * [I] 3,5,6,10
by applicantUS7169447
 WO2008028553
 WO2004104862
 US4153529
 WO2004104682
 WO9322397
 EP0261712
 DE19504224
 WO9522586
 WO9700600
 US5518652
 US5750051
 US5770107
 US6514578
    - SCHADT ET AL., SID'99
    - M.SCHADT ET AL., JOURNAL OF THE SID, (2003), vol. 11/3, page 519
    - JPN. J. APPL. PHYS., (1995), vol. 34, pages L764 - 767
    - O. YAROSHCHUK; R. KRAVCHUK; O. PARRI ET AL., JOURNAL OF THE SID, (2008), vol. 16/9, pages 905 - 909
    - O. YAROSHCHUK; R. KRAVCHUK; O. PARRI ET AL., SID DIGEST, (2007), pages 694 - 697
    - KAUFMAN, R. ROBINSON, PLASMA SOURCES SCI. TECHNOL., (1999), vol. 8, page 1
    - C. TSCHIERSKE; G. PELZL; S. DIELE, ANGEW. CHEM., (2004), vol. 116, pages 6340 - 6368
    - P. CHAUDHARI; J. LACEY; S. A. LIEN; J. SPEIDELL, JPN J APPL PHYS, (1998), vol. 37, no. 1-2, pages L55 - L56
    - P.CHAUDHARI ET AL., NATURE, (2001), vol. 411, pages 56 - 59
    - O. YAROSHCHUK ET AL., LIQ. CRYST., (2004), vol. 31, no. 6, pages 859 - 869
    - J. STOEHR ET AL., SCIENCE
    - P. CHAUDHARI ET AL., NATURE, (2001), vol. 411, page 56
    - O. YAROSHCHUK ET AL., LIQ.CRYST., (2004), vol. 31, no. 6, pages 859 - 869
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.