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Extract from the Register of European Patents

EP About this file: EP0009049

EP0009049 - Apparatus and method for fabricating microminiature devices [Right-click to bookmark this link]
Former [1980/07]VARIABLE-SPOT SCANNING IN AN ELECTRON BEAM EXPOSURE SYSTEM
[1982/11]
StatusNo opposition filed within time limit
Status updated on  14.09.2016
Database last updated on 28.09.2024
Most recent event   Tooltip14.09.2016No opposition filed within time limit 
Applicant(s)For all designated states
Western Electric Company, Incorporated
222 Broadway
New York, NY 10038 / US
[1983/10]
Former [1980/07]For all designated states
Western Electric Company, Incorporated
222 Broadway
New York, N.Y. 10038 / US
Inventor(s)01 / COLLIER, Robert, Jacob
76 Whitman Drive
New Providence, NJ 07974 / US
[1980/07]
Representative(s)Lawrence, Brian Richard, et al
Western Electric Company Limited 5, Mornington Road Woodford Green
Essex IG8 OTU / GB
[N/P]
Former [1980/07]Lawrence, Brian Richard, et al
Western Electric Company Limited 5, Mornington Road
Woodford Green Essex IG8 OTU / GB
Application number, filing date79900259.714.02.1979
[1980/07]
WO1979US00086
Priority number, dateUS1978087909721.02.1978         Original published format: US 879097
[1980/07]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO7900645
Date:06.09.1979
[1979/18]
Type: A1 Application with search report 
No.:EP0009049
Date:02.04.1980
Language:EN
The application published by WIPO in one of the EPO official languages on 06.09.1979 takes the place of the publication of the European patent application.
[1980/07]
Type: B1 Patent specification 
No.:EP0009049
Date:17.03.1982
Language:EN
[1982/11]
Search report(s)
ClassificationIPC:G21K5/00, H01J37/30
[1982/11]
CPC:
H01J37/302 (EP,US); H01J37/3007 (EP,US)
Former IPC [1980/21]G21K5/00, G21K5/04, H01J29/46
Former IPC [1980/07]G21K5/00, G21K5/04
Designated contracting statesFR,   GB [1980/07]
TitleGerman:Vorrichtung und Verfahren zur Herstellung von Mikrominiatur-Bauteilen[1982/11]
English:Apparatus and method for fabricating microminiature devices[1982/11]
French:Appareil et méthode pour la fabrication de dispositifs microminiaturisés[1982/11]
Former [1980/07]RASTERABLENKUNG MIT EINEM VARIABLEN BRENNFLECK FÜR EINE ELEKTRONENBÜNDELBESTRAHLUNGSANORDNUNG
Former [1980/07]VARIABLE-SPOT SCANNING IN AN ELECTRON BEAM EXPOSURE SYSTEM
Former [1980/07]POINT D'EXPLORATION VARIABLE DANS UN SYSTEME D'EXPOSITION A FAISCEAU ELECTRONIQUE
File destroyed:12.06.1999
Entry into regional phase11.10.1979National basic fee paid 
11.10.1979Search fee paid 
11.10.1979Designation fee(s) paid 
11.10.1979Examination fee paid 
Examination procedure11.10.1979Examination requested  [1980/20]
13.11.1980Despatch of a communication from the examining division (Time limit: M04)
23.02.1981Reply to a communication from the examining division
27.04.1981Despatch of a communication from the examining division (Time limit: M02)
19.06.1981Reply to a communication from the examining division
23.07.1981Despatch of communication of intention to grant (Approval: )
03.09.1981Communication of intention to grant the patent
29.10.1981Fee for grant paid
29.10.1981Fee for publishing/printing paid
Opposition(s)17.12.1982No opposition filed within time limit [ N /P ]
Fees paidRenewal fee
21.01.1981Renewal fee patent year 03
17.02.1982Renewal fee patent year 04
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Cited inInternational search[X]US3491236  (NEWBERRY STERLING P);
 [X]US4117340  (GOTO EIICHI, et al);
 [X]US4110622  (TROTEL JACQUES);
 [A]US3413517  (RUSSELL BARBER ROBERT, et al);
 [A]US3876883  (BROERS ALEC NIGEL, et al)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.