EP1022571 - Apparatus and method for testing electric conductivity of circuit pathways on circuit board [Right-click to bookmark this link] | Status | The application has been withdrawn Status updated on 18.01.2002 Database last updated on 15.02.2019 | Most recent event Tooltip | 18.01.2002 | Withdrawal of application | published on 06.03.2002 [2002/10] | Applicant(s) | For all designated states Nihon Densan Read Kabushiki Kaisha, (Nidec-Read Corporation) 126, Megawa, Makishima-cho Uji-city Kyoto 611-0041 / JP | [N/P] |
Former [2000/30] | For all designated states Nihon Densan Read Kabushiki Kaisha, (Nidec-Read Corporation) 126, Megawa, Makishima-cho Uji-city, Kyoto 611-0041 / JP | Inventor(s) | 01 /
Yamashita, Munehiro, c/o Nihon Densan Read K.K. 126, Megawa, Makishimacho Uji-shi, Kyoto-fu / JP | [2000/30] | Representative(s) | Hoffmann Eitle Patent- und Rechtsanwälte PartmbB Arabellastrasse 30 81925 München / DE | [N/P] |
Former [2000/30] | HOFFMANN - EITLE Patent- und Rechtsanwälte Arabellastrasse 4 81925 München / DE | Application number, filing date | 00100271.6 | 19.01.2000 | [2000/30] | Priority number, date | JP19990011165 | 19.01.1999 Original published format: JP 1116599 | JP19990351587 | 10.12.1999 Original published format: JP 35158799 | [2000/30] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1022571 | Date: | 26.07.2000 | Language: | EN | [2000/30] | Type: | A3 Search report | No.: | EP1022571 | Date: | 07.11.2001 | [2001/45] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 24.09.2001 | Classification | International: | G01R31/28, G01R31/312 | [2001/45] |
Former International [2000/30] | G01R31/28 | Designated contracting states | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE [2000/30] | Extension states | AL | Not yet paid | LT | Not yet paid | LV | Not yet paid | MK | Not yet paid | RO | Not yet paid | SI | Not yet paid | Title | German: | Vorrichtung und Verfahren zum Prüfen der Leitfähigkeit von Leiterbahnen einer Leiterplatte | [2000/30] | English: | Apparatus and method for testing electric conductivity of circuit pathways on circuit board | [2000/30] | French: | Dispositif et méthode de test de la conductivité électrique des pistes d'un circuit | [2000/30] | Examination procedure | 10.01.2002 | Application withdrawn by applicant [2002/10] | Documents cited: | Search | [X]US5517110 (SOIFERMAN JACOB [CA]) [X] 1-18,21-24 * column 5, line 37 - column 6, line 29; figures 1,4 *; | [X]US5578930 (SHEEN TIMOTHY W [US]) [X] 1,16 * abstract *; | [PX]WO9965287 (ORBOTECH LTD [IL], et al) [PX] 1,16 * abstract * |