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Extract from the Register of European Patents

EP About this file: EP1160866

EP1160866 - Semiconductor device with power wiring structure [Right-click to bookmark this link]
Former [2001/49]Power wiring structure and semiconductor device
[2006/36]
StatusNo opposition filed within time limit
Status updated on  11.01.2008
Database last updated on 22.01.2025
Most recent event   Tooltip11.01.2008No opposition filed within time limitpublished on 13.02.2008  [2008/07]
Applicant(s)For all designated states
NISSAN MOTOR CO., LTD.
2, Takara-cho, Kanagawa-ku
Yokohama-shi
Kanagawa-ken / JP
[N/P]
Former [2007/10]For all designated states
NISSAN MOTOR CO., LTD.
2 Takara-cho, Kanagawa-ku Yokohama-shi
Kanagawa-ken / JP
Former [2001/49]For all designated states
NISSAN MOTOR CO., LTD.
2 Takara-cho, Kanagawa-ku
Yokohama-shi Kanagawa-ken / JP
Inventor(s)01 / Hanamura, Akihiro
1235-39, Mutsuura-cho
Yokohama-shi, Kanagawa-ken / JP
 [2001/49]
Representative(s)Weber, Joachim
Hoefer & Partner
Patentanwälte
Pilgersheimer Strasse 20
81543 München / DE
[N/P]
Former [2001/49]Weber, Joachim, Dr.
Hoefer, Schmitz, Weber & Partner Patentanwälte Gabriel-Max-Strasse 29
81545 München / DE
Application number, filing date01112178.717.05.2001
[2001/49]
Priority number, dateJP2000015470425.05.2000         Original published format: JP 2000154704
[2001/49]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1160866
Date:05.12.2001
Language:EN
[2001/49]
Type: A3 Search report 
No.:EP1160866
Date:22.12.2004
[2004/52]
Type: B1 Patent specification 
No.:EP1160866
Date:07.03.2007
Language:EN
[2007/10]
Search report(s)(Supplementary) European search report - dispatched on:EP10.11.2004
ClassificationIPC:H01L25/07, H02M7/00, H02G5/00
[2004/52]
CPC:
H01L24/49 (EP,US); H01L23/50 (EP,US); H01L25/072 (EP,US);
H01L2223/6611 (EP,US); H01L2224/32145 (EP,US); H01L2224/48091 (EP,US);
H01L2224/49109 (EP,US); H01L2224/73265 (EP,US); H01L2225/06562 (EP,US);
H01L24/48 (EP,US); H01L2924/00014 (EP,US); H01L2924/01004 (EP,US);
H01L2924/01005 (EP,US); H01L2924/01006 (EP,US); H01L2924/01015 (EP,US);
H01L2924/01023 (EP,US); H01L2924/01074 (EP,US); H01L2924/1301 (EP,US);
H01L2924/15787 (EP,US); H01L2924/19041 (EP,US); H01L2924/19107 (EP,US);
H01L2924/30107 (EP,US) (-)
C-Set:
H01L2224/48091, H01L2924/00014 (US,EP);
H01L2924/00014, H01L2224/05599 (EP,US);
H01L2924/00014, H01L2224/45099 (EP,US);
H01L2924/1301, H01L2924/00 (US,EP);
H01L2924/15787, H01L2924/00 (US,EP)
(-)
Former IPC [2001/49]H01L25/07, H01L23/10
Designated contracting statesDE,   FR,   GB [2005/37]
Former [2001/49]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Halbleiterelement mit Leistungsverdrahtungsstruktur[2006/36]
English:Semiconductor device with power wiring structure[2006/36]
French:Dispositif semi-conducteur avec structure d'interconnexion[2006/36]
Former [2001/49]Leistungsverdrahtungsstruktur und Halbleiter
Former [2001/49]Power wiring structure and semiconductor device
Former [2001/49]Structure d interconnexion et semi-conducteur
Examination procedure17.05.2001Examination requested  [2001/49]
07.03.2005Despatch of a communication from the examining division (Time limit: M04)
18.07.2005Reply to a communication from the examining division
07.10.2005Despatch of a communication from the examining division (Time limit: M04)
16.02.2006Reply to a communication from the examining division
22.09.2006Communication of intention to grant the patent
24.01.2007Fee for grant paid
24.01.2007Fee for publishing/printing paid
Opposition(s)10.12.2007No opposition filed within time limit [2008/07]
Fees paidRenewal fee
28.05.2003Renewal fee patent year 03
28.05.2004Renewal fee patent year 04
31.05.2005Renewal fee patent year 05
26.05.2006Renewal fee patent year 06
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Documents cited:Search[XA]US5172310  (DEAM DAVID [US], et al) [X] 1,2 * abstract * * column 11, line 55 - column 15, line 35 * [A] 3-11;
 [X]EP0427143  (ABB IXYS SEMICONDUCTOR GMBH [DE]) [X] 1,3-11 * the whole document *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.