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EP1348232
European procedure
Extract from the Register of European Patents
EP About this file: EP1348232
| EP1348232 - METHOD FOR CONTACTING A DOPING AREA ON A SEMICONDUCTOR ELEMENT [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 28.03.2008 Database last updated on 19.04.2025 | Most recent event Tooltip | 04.07.2008 | Lapse of the patent in a contracting state New state(s): FR | published on 06.08.2008 [2008/32] | Applicant(s) | For all designated states Infineon Technologies AG St.-Martin-Strasse 53 81669 München / DE | [2007/21] |
| Former [2003/40] | For all designated states Infineon Technologies AG St.-Martin-Strasse 53 81669 München / DE | Inventor(s) | 01 /
RUF, Alexander Scariastrasse 8 01277 Dresden / DE | 02 /
URBANSKY, Norbert Dahlienweg 8 01159 Dresden / DE | 03 /
CLAUSSEN, Wilhelm Dorothea-Erxleben-Strasse 10 01129 Dresden / DE | 04 /
GÄRTNER, Thomas Lindenweg 11 01458 Ottendorf-Okrilla / DE | 05 /
SCHMIDBAUER, Sven Forststrasse 27 01099 Dresden / DE | [2003/40] | Representative(s) | Epping - Hermann - Fischer Patentanwaltsgesellschaft mbH Schlossschmidstrasse 5 80639 München / DE | [N/P] |
| Former [2003/40] | Epping Hermann & Fischer Ridlerstrasse 55 80339 München / DE | Application number, filing date | 01995583.0 | 06.12.2001 | [2003/40] | WO2001DE04590 | Priority number, date | DE2001100178 | 04.01.2001 Original published format: DE 10100178 | [2003/40] | Filing language | DE | Procedural language | DE | Publication | Type: | A2 Application without search report | No.: | WO02054470 | Date: | 11.07.2002 | Language: | DE | [2002/28] | Type: | A2 Application without search report | No.: | EP1348232 | Date: | 01.10.2003 | Language: | DE | The application published by WIPO in one of the EPO official languages on 11.07.2002 takes the place of the publication of the European patent application. | [2003/40] | Type: | B1 Patent specification | No.: | EP1348232 | Date: | 23.05.2007 | Language: | DE | [2007/21] | Search report(s) | International search report - published on: | EP | 16.01.2003 | Classification | IPC: | H01L21/28, H01L21/285, H01L21/768 | [2003/40] | CPC: |
H01L21/76843 (EP,US);
H01L21/28 (KR);
H01L21/28518 (EP,US);
H01L21/76856 (EP,US)
| Designated contracting states | DE, FR, IT [2004/22] |
| Former [2003/40] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR | Title | German: | VERFAHREN ZUR KONTAKTIERUNG EINES DOTIERGEBIETS EINES HALBLEITERBAUELEMENTS | [2003/40] | English: | METHOD FOR CONTACTING A DOPING AREA ON A SEMICONDUCTOR ELEMENT | [2003/40] | French: | PROCEDE D'ETABLISSEMENT DES CONTACTS D'UNE ZONE DOPEE D'UN COMPOSANT A SEMI-CONDUCTEUR | [2003/40] | Entry into regional phase | 06.06.2003 | National basic fee paid | 06.06.2003 | Designation fee(s) paid | 06.06.2003 | Examination fee paid | Examination procedure | 05.08.2002 | Request for preliminary examination filed International Preliminary Examining Authority: EP | 06.06.2003 | Examination requested [2003/40] | 23.03.2004 | Despatch of a communication from the examining division (Time limit: M04) | 13.07.2004 | Reply to a communication from the examining division | 08.12.2006 | Communication of intention to grant the patent | 04.04.2007 | Fee for grant paid | 04.04.2007 | Fee for publishing/printing paid | Opposition(s) | 26.02.2008 | No opposition filed within time limit [2008/18] | Fees paid | Renewal fee | 29.12.2003 | Renewal fee patent year 03 | 23.12.2004 | Renewal fee patent year 04 | 28.12.2005 | Renewal fee patent year 05 | 27.12.2006 | Renewal fee patent year 06 |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | IT | 23.05.2007 | FR | 18.01.2008 | [2008/32] |
| Former [2008/23] | IT | 23.05.2007 | Cited in | International search | [XY]US4701349 (KOYANAGI MITSUMASA [JP], et al) [X] 1-3 * column 2, line 65 - column 5, line 46 * [Y] 4-6; | [Y]US6121134 (BURTON RANDLE D [US], et al) [Y] 4-6 * column 5, line 39 - column 6, line 3 *; | [X]US5639678 (LEE CHANG-JAE [KR], et al) [X] 1,3 * abstract * * column 5, line 4 - line 18 * |