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Extract from the Register of European Patents

EP About this file: EP1595211

EP1595211 - COMPRESSING TEST RESPONSES USING A COMPACTOR [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  15.05.2009
Database last updated on 21.03.2025
Most recent event   Tooltip30.09.2011Lapse of the patent in a contracting state
New state(s): CY, TR		published on 02.11.2011  [2011/44]
Applicant(s)For all designated states
Mentor Graphics Corporation
8005 S.W. Boeckman Road
Wilsonville, OR 97070 / US
[2008/28]
Former [2005/46]For all designated states
Mentor Graphics Corporation
8005 S.W. Boeckman Road Wilsonville
Oregon 97070 / US
Inventor(s)01 / RAJSKI, Janusz
6502 Horton Road
West Linn, OR 97068 / US
02 / TYSZER, Jerzy
Os. Stare Zegrze 89C/2
PL-61-249 Poznan / PL
03 / WANG, Chen
10921 SW 111th Avenue
Tigard, OR 97223 / US
04 / MRUGALSKI, Grzegorz
7114 SW Bouchaine Street
Wilsonville, OR 97070 / US
05 / POGIEL, Artur
Ul. Lesna 34
PL-89-200 Szubin / PL
 [2005/46]
Representative(s)Hoarton, Lloyd Douglas Charles, et al
Forresters IP LLP
Skygarden
Erika-Mann-Strasse 11
80636 München / DE
[N/P]
Former [2008/44]Hoarton, Lloyd Douglas Charles, et al
Forrester & Boehmert Pettenkoferstrasse 20-22
80336 Munich / DE
Former [2007/31]Hoarton, Lloyd Douglas Charles, et al
Forrester & Boehmert Pettenkoferstrasse 20-22
80336 München / DE
Former [2006/52]Lobban, Colin
Forrester & Boehmert Pettenkoferstrasse 20-22
80336 München / DE
Former [2005/46]Hoarton, Lloyd Douglas Charles
Forrester & Boehmert, Pettenkoferstrasse 20-22
80336 München / DE
Application number, filing date04700016.113.02.2004
[2005/46]
WO2004US04271
Priority number, dateUS20030447637P13.02.2003         Original published format: US 447637 P
US20030506499P26.09.2003         Original published format: US 506499 P
[2005/46]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2004072660
Date:26.08.2004
Language:EN
[2004/35]
Type: A2 Application without search report 
No.:EP1595211
Date:16.11.2005
Language:EN
The application published by WIPO in one of the EPO official languages on 26.08.2004 takes the place of the publication of the European patent application.
[2005/46]
Type: B1 Patent specification 
No.:EP1595211
Date:09.07.2008
Language:EN
[2008/28]
Search report(s)International search report - published on:US28.04.2005
(Supplementary) European search report - dispatched on:EP18.10.2005
ClassificationIPC:G06F11/00, G01R31/3185
[2005/48]
CPC:
G01R31/318566 (EP,US); G01R31/318583 (EP,US); G01R31/31921 (EP,US);
G11C29/40 (EP,US); G11C29/48 (EP,US); G01R31/31703 (EP,US);
G01R31/318536 (EP,US); G11C2029/3202 (EP,US) (-)
Former IPC [2005/46]G06F11/00
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   RO,   SE,   SI,   SK,   TR [2005/46]
Extension statesALNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
TitleGerman:KOMPRIMIEREN VON TESTANTWORTEN UNTER VERWENDUNG EINES KOMPAKTORS[2005/46]
English:COMPRESSING TEST RESPONSES USING A COMPACTOR[2005/46]
French:COMPRESSION DE REPONSES A DES TESTS AU MOYEN D'UN COMPACTEUR[2005/46]
Entry into regional phase28.06.2004National basic fee paid 
28.06.2004Search fee paid 
28.06.2004Designation fee(s) paid 
28.06.2004Examination fee paid 
Examination procedure28.06.2004Examination requested  [2005/46]
29.11.2005Despatch of a communication from the examining division (Time limit: M06)
06.04.2006Reply to a communication from the examining division
08.05.2006Despatch of a communication from the examining division (Time limit: M06)
08.11.2006Reply to a communication from the examining division
24.01.2007Despatch of a communication from the examining division (Time limit: M06)
27.07.2007Reply to a communication from the examining division
26.10.2007Communication of intention to grant the patent
18.03.2008Fee for grant paid
18.03.2008Fee for publishing/printing paid
Divisional application(s)EP08159782.5  / EP1978446
Opposition(s)14.04.2009No opposition filed within time limit [2009/25]
Request for further processing for:The application is deemed to be withdrawn due to failure to fulfill actions required for granting the patent
18.03.2008Request for further processing filed
18.03.2008Full payment received (date of receipt of payment)
Request granted
03.06.2008Decision despatched
Fees paidRenewal fee
14.02.2006Renewal fee patent year 03
14.02.2007Renewal fee patent year 04
13.02.2008Renewal fee patent year 05
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT09.07.2008
BE09.07.2008
CY09.07.2008
CZ09.07.2008
DK09.07.2008
EE09.07.2008
FI09.07.2008
IT09.07.2008
RO09.07.2008
SI09.07.2008
SK09.07.2008
TR09.07.2008
BG09.10.2008
SE09.10.2008
GR10.10.2008
ES20.10.2008
PT09.12.2008
HU10.01.2009
IE13.02.2009
LU13.02.2009
CH28.02.2009
LI28.02.2009
MC28.02.2009
[2011/43]
Former [2011/32]AT09.07.2008
BE09.07.2008
CZ09.07.2008
DK09.07.2008
EE09.07.2008
FI09.07.2008
IT09.07.2008
RO09.07.2008
SI09.07.2008
SK09.07.2008
BG09.10.2008
SE09.10.2008
GR10.10.2008
ES20.10.2008
PT09.12.2008
HU10.01.2009
IE13.02.2009
LU13.02.2009
CH28.02.2009
LI28.02.2009
MC28.02.2009
Former [2011/21]AT09.07.2008
BE09.07.2008
CZ09.07.2008
DK09.07.2008
EE09.07.2008
FI09.07.2008
IT09.07.2008
RO09.07.2008
SI09.07.2008
SK09.07.2008
BG09.10.2008
SE09.10.2008
GR10.10.2008
ES20.10.2008
PT09.12.2008
IE13.02.2009
LU13.02.2009
CH28.02.2009
LI28.02.2009
MC28.02.2009
Former [2010/50]AT09.07.2008
BE09.07.2008
CZ09.07.2008
DK09.07.2008
EE09.07.2008
FI09.07.2008
IT09.07.2008
RO09.07.2008
SI09.07.2008
SK09.07.2008
BG09.10.2008
SE09.10.2008
GR10.10.2008
ES20.10.2008
PT09.12.2008
IE13.02.2009
CH28.02.2009
LI28.02.2009
MC28.02.2009
Former [2010/09]AT09.07.2008
BE09.07.2008
CZ09.07.2008
DK09.07.2008
EE09.07.2008
FI09.07.2008
IT09.07.2008
RO09.07.2008
SI09.07.2008
SK09.07.2008
BG09.10.2008
SE09.10.2008
ES20.10.2008
PT09.12.2008
IE13.02.2009
CH28.02.2009
LI28.02.2009
MC28.02.2009
Former [2010/07]AT09.07.2008
BE09.07.2008
CZ09.07.2008
DK09.07.2008
EE09.07.2008
FI09.07.2008
IT09.07.2008
RO09.07.2008
SI09.07.2008
SK09.07.2008
BG09.10.2008
ES20.10.2008
PT09.12.2008
IE13.02.2009
CH28.02.2009
LI28.02.2009
MC28.02.2009
Former [2009/47]AT09.07.2008
BE09.07.2008
CZ09.07.2008
DK09.07.2008
EE09.07.2008
FI09.07.2008
IT09.07.2008
RO09.07.2008
SI09.07.2008
SK09.07.2008
BG09.10.2008
ES20.10.2008
PT09.12.2008
CH28.02.2009
LI28.02.2009
MC28.02.2009
Former [2009/41]AT09.07.2008
BE09.07.2008
CZ09.07.2008
DK09.07.2008
EE09.07.2008
FI09.07.2008
IT09.07.2008
RO09.07.2008
SI09.07.2008
SK09.07.2008
BG09.10.2008
ES20.10.2008
PT09.12.2008
MC28.02.2009
Former [2009/26]AT09.07.2008
BE09.07.2008
CZ09.07.2008
DK09.07.2008
EE09.07.2008
FI09.07.2008
RO09.07.2008
SI09.07.2008
SK09.07.2008
BG09.10.2008
ES20.10.2008
PT09.12.2008
Former [2009/24]AT09.07.2008
BE09.07.2008
CZ09.07.2008
DK09.07.2008
EE09.07.2008
FI09.07.2008
SI09.07.2008
SK09.07.2008
BG09.10.2008
ES20.10.2008
PT09.12.2008
Former [2009/22]AT09.07.2008
BE09.07.2008
DK09.07.2008
EE09.07.2008
FI09.07.2008
SI09.07.2008
BG09.10.2008
ES20.10.2008
PT09.12.2008
Former [2009/19]AT09.07.2008
BE09.07.2008
DK09.07.2008
FI09.07.2008
SI09.07.2008
BG09.10.2008
ES20.10.2008
PT09.12.2008
Former [2009/14]AT09.07.2008
FI09.07.2008
SI09.07.2008
BG09.10.2008
ES20.10.2008
PT09.12.2008
Former [2009/13]AT09.07.2008
FI09.07.2008
BG09.10.2008
ES20.10.2008
PT09.12.2008
Former [2009/09]ES20.10.2008
PT09.12.2008
Documents cited:Search[A]WO0139254  (MENTOR GRAPHICS CORP [US]) [A] 1-79 * page 6, line 16 - page 13, line 4 *;
 [DA]  - MITRA S ET AL, "X-compact an efficient response compaction technique for test cost reduction", PROCEEDINGS INTERNATIONAL TEST CONFERENCE 2002. ITC 2002. BALTIMORE, MD, OCT. 7-10, 2002, INTERNATIONAL TEST CONFERENCE, NEW YORK, NY : IEEE, US, (20021007), ISBN 0-7803-7542-4, pages 311 - 320, XP010609755 [DA] 1-79 * the whole document *

DOI:   http://dx.doi.org/10.1109/TEST.2002.1041774
 [A]  - RAJSKI J ET AL, "TEST DATA DECOMPRESSION FOR MULTIPLE SCAN DESIGNS WITH BOUNDARY SCAN", IEEE TRANSACTIONS ON COMPUTERS, IEEE SERVICE CENTER, LOS ALAMITOS, CA, US, (199811), vol. 47, no. 11, ISSN 0018-9340, pages 1188 - 1200, XP000831123 [A] 1-79 * the whole document *

DOI:   http://dx.doi.org/10.1109/12.736428
International search[A]US5790562  (MURRAY BRIAN THOMAS [US], et al);
 [A]US6272653  (AMSTUTZ KENNETH D [US]);
 [AP]US6543020  (RAJSKI JANUSZ [US], et al)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.