EP2811288 - Method for electron tomography [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 16.06.2017 Database last updated on 11.12.2019 | Most recent event Tooltip | 15.11.2019 | Lapse of the patent in a contracting state New state(s): MK | published on 18.12.2019 [2019/51] | Applicant(s) | For all designated states FEI COMPANY 5350 NE Dawson Creek Drive Hillsboro, Oregon 97124-5793 / US | [2014/50] | Inventor(s) | 01 /
Luecken, Uwe Charlevillehof 23 5627 DG EINDHOVEN / NL | 02 /
Schoenmakers, Remco Koevelden 17 5685 HE Best / NL | 03 /
Van den Oetelaar, Johannes Boerhaavelaan 50 5644 BE Eindhoven / NL | [2014/50] | Representative(s) | Bakker, Hendrik FEI Company Patent Department P.O. Box 1745 5602 BS Eindhoven / NL | [N/P] |
Former [2014/50] | Bakker, Hendrik FEI Company Patent Department P.O. Box 1745 5602 BS Eindhoven / NL | Application number, filing date | 13170871.1 | 06.06.2013 | [2014/50] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP2811288 | Date: | 10.12.2014 | Language: | EN | [2014/50] | Type: | B1 Patent specification | No.: | EP2811288 | Date: | 10.08.2016 | Language: | EN | [2016/32] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 30.08.2013 | Classification | International: | G01N23/04 | [2014/50] | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2015/26] |
Former [2014/50] | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR | Title | German: | Verfahren zur Elektronentomographie | [2014/50] | English: | Method for electron tomography | [2014/50] | French: | Procédé de tomographie d'électrons | [2014/50] | Examination procedure | 13.05.2015 | Amendment by applicant (claims and/or description) | 13.05.2015 | Examination requested [2015/26] | 20.08.2015 | Despatch of a communication from the examining division (Time limit: M06) | 01.02.2016 | Reply to a communication from the examining division | 29.03.2016 | Communication of intention to grant the patent | 01.06.2016 | Fee for grant paid | 01.06.2016 | Fee for publishing/printing paid | 01.06.2016 | Receipt of the translation of the claim(s) | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 20.08.2015 | Opposition(s) | 11.05.2017 | No opposition filed within time limit [2017/29] | Fees paid | Renewal fee | 29.06.2015 | Renewal fee patent year 03 | 27.06.2016 | Renewal fee patent year 04 | Lapses during opposition Tooltip | HU | 06.06.2013 | AL | 10.08.2016 | AT | 10.08.2016 | BE | 10.08.2016 | CY | 10.08.2016 | CZ | 10.08.2016 | DK | 10.08.2016 | EE | 10.08.2016 | ES | 10.08.2016 | FI | 10.08.2016 | HR | 10.08.2016 | IT | 10.08.2016 | LT | 10.08.2016 | LV | 10.08.2016 | MC | 10.08.2016 | MK | 10.08.2016 | NL | 10.08.2016 | PL | 10.08.2016 | RO | 10.08.2016 | RS | 10.08.2016 | SE | 10.08.2016 | SI | 10.08.2016 | SK | 10.08.2016 | SM | 10.08.2016 | BG | 10.11.2016 | NO | 10.11.2016 | GR | 11.11.2016 | IS | 10.12.2016 | PT | 12.12.2016 | [2019/51] |
Former [2019/47] | HU | 06.06.2013 | |
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CZ | 10.08.2016 | ||
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BG | 10.11.2016 | ||
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IS | 10.12.2016 | ||
PT | 12.12.2016 | ||
Former [2019/31] | HU | 06.06.2013 | |
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Former [2017/07] | LT | 10.08.2016 | Documents cited: | Search | [Y]EP1970936 (HITACHI HIGH TECH CORP [JP]) [Y] 1-10,12 * paragraph [0045] - paragraph [0049]; figures 1, 2, 11 *; | [IY]EP1975974 (JEOL LTD [JP]) [I] 11 * paragraphs [0024] , [ 0049] , [ 0050]; figure 1 * [Y] 1-10,12; | [Y]US2009065708 (MOON WON JIN [KR] ET AL) [Y] 1-10,12 * paragraph [0011] *; | [A] - W BAUMEISTER, "Electron tomography of molecules and cells", TRENDS IN CELL BIOLOGY, (19990201), vol. 9, no. 2, doi:10.1016/S0962-8924(98)01423-8, ISSN 0962-8924, pages 81 - 85, XP055074721 [A] 1-12 * the whole document * DOI: http://dx.doi.org/10.1016/S0962-8924(98)01423-8 | [AD] - Anonymous, "Functional description of Tecnai Tomography Software", (20031231), pages 1 - 20, FEI Company Technical Note, URL: http://www4.utsouthwestern.edu/mcif/manuals/tomography/tomography%20functional%20description.pdf, (20130814), XP002711126 [AD] 1-12 * the whole document * |