Extract from the Register of European Patents

About this file: EP0375097

EP0375097 - Stereolithographic beam profiling [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  16.10.1998
Database last updated on 28.07.2017
Most recent event   Tooltip30.11.2007Lapse of the patent in a contracting state
New state(s): LU		published on 02.01.2008  [2008/01]
Applicant(s)For all designated states
3D SYSTEMS, INC.
26081 Avenue Hall Valencia
California 91355 / US
[N/P]
Former [1990/26]For all designated states
3D SYSTEMS, INC.
26081 Avenue Hall
Valencia California 91355 / US
Inventor(s)01 / Spence, Stuart Thomas
333 Grand Avenue
South Pasedena California 91030 / US
02 / Almquist, Thomas
9035 Duarte Road
San Gabriel California 91775 / US
03 / Tarnoff, Harry L.
6025 Sepulveda Boulevard
Van Nuys California 91411 / US
[1990/26]
Representative(s)Frohwitter, Bernhard
Bardehle Pagenberg
Postfach 86 06 20
81633 München / DE
[N/P]
Former [1993/33]Frohwitter, Bernhard, Dipl.-Ing.
Patent- und Rechtsanwälte Bardehle . Pagenberg . Dost . Altenburg . Frohwitter . Geissler & Partner Galileiplatz 1
D-81679 München / DE
Former [1990/26]Ayers, Martyn Lewis Stanley
J.A. KEMP & CO. 14 South Square Gray's Inn
London WC1R 5LX / GB
Application number, filing date89303780.417.04.1989
[1990/26]
Priority number, dateUS1988026881608.11.1988         Original published format: US 268816
US1988026883708.11.1988         Original published format: US 268837
US1988026890708.11.1988         Original published format: US 268907
US1988026980108.11.1988         Original published format: US 269801
US1988018283018.04.1988         Original published format: US 182830
[1990/26]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0375097
Date:27.06.1990
Language:EN
[1990/26]
Type: A3 Search report 
No.:EP0375097
Date:25.09.1991
Language:EN
[1991/39]
Type: B1 Patent specification 
No.:EP0375097
Date:10.12.1997
Language:EN
[1997/50]
International and Supplementary
search report(s)		Supplementary European search report -
dispatched on:		EP08.08.1991
ClassificationInternational:B29C39/42, B23K26/00, G01J1/42
[1990/26]
Designated contracting statesAT,   BE,   CH,   DE,   ES,   FR,   GB,   GR,   IT,   LI,   LU,   NL,   SE [1990/26]
TitleGerman:Profilierung eines Strahlungsbündels für Stereolithographie[1990/26]
English:Stereolithographic beam profiling[1990/26]
French:Profilage d'un faisceau de rayonnement pour la stéréolithographie[1990/26]
MiscellaneousEPB 1997/12: Teilanmeldung 96120757.8 eingereicht am 23/12/96
EPB 1997/12: Divisional application 96120757.8 filed on 23/12/96
EPB 1997/12: Demande divisionnaire 96120757.8 déposée le 23/12/96
Examination procedure20.03.1992Examination requested  [1992/21]
16.08.1993Despatch of a communication from the examining division (Time limit: M08)
03.08.1994Reply to a communication from the examining division
19.12.1994Despatch of a communication from the examining division (Time limit: M08)
14.12.1995Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
23.02.1996Reply to a communication from the examining division
05.07.1996Despatch of a communication from the examining division (Time limit: M06)
19.12.1996Reply to a communication from the examining division
25.04.1997Despatch of communication of intention to grant (Approval: Yes)
16.06.1997Communication of intention to grant the patent
24.09.1997Fee for grant paid
24.09.1997Fee for publishing/printing paid
Divisional application(s)EP00128126.0  / EP1106332
EP96120757.8  / EP0860267
Opposition(s)11.09.1998No opposition filed within time limit [1998/49]
Request for further processing for:23.02.1996Request for further processing filed
23.02.1996Full payment received (date of receipt of payment)
Request granted
13.03.1996Decision despatched
23.02.1996Request for further processing filed
03.08.1994Full payment received (date of receipt of payment)
Request deemed not to be filed
09.02.1990Decision despatched
03.08.1994Request for further processing filed
03.08.1994Full payment received (date of receipt of payment)
Request deemed not to be filed
09.02.1990Decision despatched
Fees paidRenewal fee
12.04.1991Renewal fee patent year 03
18.05.1992Renewal fee patent year 04
15.03.1993Renewal fee patent year 05
25.10.1994Renewal fee patent year 06
25.04.1995Renewal fee patent year 07
25.04.1996Renewal fee patent year 08
28.04.1997Renewal fee patent year 09
Penalty fee
Additional fee for renewal fee
01.05.199204   M06   Fee paid on   18.05.1992
30.04.199406   M06   Fee paid on   25.10.1994
Licence(s)ID:01 00/exclusive
For:[FR]
Licencee:3D SYSTEMS FRANCE, SARL
Parc Club Orsay Université 27, rue Jean Rostand
91893 Orsay Cedex / FR
Date:26.08.1996
[1996/46]
Lapses during opposition  TooltipAT10.12.1997
BE10.12.1997
CH10.12.1997
ES10.12.1997
GR10.12.1997
IT10.12.1997
LI10.12.1997
LU10.12.1997
NL10.12.1997
SE10.03.1998
[2005/23]
Former [2003/07]AT10.12.1997
BE10.12.1997
CH10.12.1997
ES10.12.1997
GR10.12.1997
IT10.12.1997
LI10.12.1997
NL10.12.1997
SE10.03.1998
Former [2002/24]AT10.12.1997
BE10.12.1997
CH10.12.1997
ES10.12.1997
GR10.12.1997
IT10.12.1997
LI10.12.1997
SE10.03.1998
Former [2000/04]AT10.12.1997
BE10.12.1997
CH10.12.1997
GR10.12.1997
IT10.12.1997
LI10.12.1997
SE10.03.1998
Former [1999/42]AT10.12.1997
BE10.12.1997
CH10.12.1997
IT10.12.1997
LI10.12.1997
SE10.03.1998
Former [1998/46]AT10.12.1997
BE10.12.1997
CH10.12.1997
LI10.12.1997
SE10.03.1998
Former [1998/43]AT10.12.1997
CH10.12.1997
LI10.12.1997
SE10.03.1998
Former [1998/40]AT10.12.1997
SE10.03.1998
Former [1998/35]SE10.03.1998
Documents cited:Search[X]JP62163933  ;
 [YD]US4575330  (HULL CHARLES W [US])
 [X]  APPLIED OPTICS, vol. 17, no. 17, September 1978, pages 2673-2674; P.J. SHAYLER: "Laser beam distribution in the focal region",
 [X]  PATENT ABSTRACTS OF JAPAN, vol. 12, no. 2 (P-652)[2849], 7th January 1988; & JP-A-62 163 933 (NIPPON KOGAKU K.K.) 20-07-1987,
 [A]  REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 54, no. 7, July 1983, pages 856-860; J.T. KNUDTSON: "Laser beam spatial profile analysis using a two-dimensional photodiode array",
ExaminationEP0148138
    Reprint from Lasers & Applications, Aug.1985, pages 65-69, D.G. Tweed, "Linearizing Resonant Scanners",
    OPTICAL ENGINEERING, JULY/AUGUST 1974; pages 331-334; "Anamorphic Laser Beam Shaper with a Phase Step",
    LASER FOCUS / ELECTRO-OPTICS; MAY 1987; page 78,
    Reprint from PROCEEDINGS OF SPI - The International Society for Optical Engineering; Vol. 390; Jan. 20-21, 1983; pages 70-78 and cover page; K. Pelsue, "Precision, post-objective, two-axis, galvanometer scanning",
by applicantUS4575330
 JPS62163933
 EP0148138
    "Laser beam distribution in the focal region", APPLIED OPTICS, (19780901), vol. 17, no. 17, page 2673,
    "Laser beam spatial profile analysis using a two-dimensional photodiode array", REVIEW OF SCIENTIFIC INSTRUMENTS, (198307), vol. 54, no. 7, pages 856 - 860,
    "Linearizing Resonant Scanners", LASERS & APPLICATIONS, (198508), pages 65 - 69,
    Beta Site Users Manual and Service Manual, 3D SYSTEMS, INC.,
    Beta Release, First Draft, Software Manual, 3D SYSTEMS, INC.,