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Extract from the Register of European Patents

EP About this file: EP0580326

EP0580326 - Methods and circuits for measuring the conductivity of solutions [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  01.09.2000
Database last updated on 09.12.2024
Most recent event   Tooltip06.08.2004Lapse of the patent in a contracting state
New state(s): LU		published on 22.09.2004  [2004/39]
Applicant(s)For all designated states
ANATEL CORPORATION
2200 Central Avenue Boulder
Colorado 80301 / US
[N/P]
Former [1994/04]For all designated states
ANATEL CORPORATION
2200 Central Avenue
Boulder Colorado 80301 / US
Inventor(s)01 / Blades, Frederick K.
2450 Fourmile Canyon, Boulder
Colorado 80302 / US
[1994/04]
Representative(s)Colgan, Stephen James
CARPMAELS & RANSFORD 43 Bloomsbury Square
London WC1A 2RA / GB
[N/P]
Former [1994/04]Colgan, Stephen James
CARPMAELS & RANSFORD 43 Bloomsbury Square
London WC1A 2RA / GB
Application number, filing date93305366.208.07.1993
[1994/04]
Priority number, dateUS1992091302214.07.1992         Original published format: US 913022
[1994/04]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0580326
Date:26.01.1994
Language:EN
[1994/04]
Type: B1 Patent specification 
No.:EP0580326
Date:03.11.1999
Language:EN
[1999/44]
Search report(s)(Supplementary) European search report - dispatched on:EP28.10.1993
ClassificationIPC:G01R27/22
[1994/04]
CPC:
G01R27/22 (EP,US)
Designated contracting statesAT,   BE,   CH,   DE,   DK,   ES,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE [1994/04]
TitleGerman:Verfahren und Schaltungen zum Messen der Leitfähigkeit von Lösungen[1994/04]
English:Methods and circuits for measuring the conductivity of solutions[1994/04]
French:Méthodes et circuits pour mesurer la conductibilité de solutions[1994/04]
Examination procedure01.07.1994Examination requested  [1994/35]
20.01.1997Despatch of a communication from the examining division (Time limit: M06)
24.07.1997Reply to a communication from the examining division
20.08.1997Despatch of a communication from the examining division (Time limit: M06)
20.02.1998Reply to a communication from the examining division
28.08.1998Despatch of communication of intention to grant (Approval: No)
01.03.1999Despatch of communication of intention to grant (Approval: later approval)
05.03.1999Communication of intention to grant the patent
14.07.1999Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time
27.08.1999Fee for grant paid
27.08.1999Fee for publishing/printing paid
Opposition(s)04.08.2000No opposition filed within time limit [2000/42]
Request for further processing for:20.08.1999Request for further processing filed
27.08.1999Full payment received (date of receipt of payment)
Request granted
13.09.1999Decision despatched
Fees paidRenewal fee
11.07.1995Renewal fee patent year 03
11.07.1996Renewal fee patent year 04
14.07.1997Renewal fee patent year 05
08.07.1998Renewal fee patent year 06
13.07.1999Renewal fee patent year 07
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT03.11.1999
BE03.11.1999
CH03.11.1999
ES03.11.1999
GR03.11.1999
LI03.11.1999
NL03.11.1999
SE03.11.1999
DK03.02.2000
PT03.02.2000
IE08.07.2000
LU08.07.2000
MC31.07.2000
[2004/39]
Former [2004/07]AT03.11.1999
BE03.11.1999
CH03.11.1999
ES03.11.1999
GR03.11.1999
LI03.11.1999
NL03.11.1999
SE03.11.1999
DK03.02.2000
PT03.02.2000
IE08.07.2000
MC31.07.2000
Former [2003/45]AT03.11.1999
BE03.11.1999
CH03.11.1999
ES03.11.1999
LI03.11.1999
NL03.11.1999
SE03.11.1999
DK03.02.2000
PT03.02.2000
IE08.07.2000
MC31.07.2000
Former [2003/08]AT03.11.1999
BE03.11.1999
CH03.11.1999
ES03.11.1999
LI03.11.1999
NL03.11.1999
SE03.11.1999
PT03.02.2000
IE08.07.2000
MC31.07.2000
Former [2002/42]AT03.11.1999
BE03.11.1999
CH03.11.1999
ES03.11.1999
LI03.11.1999
SE03.11.1999
PT03.02.2000
IE08.07.2000
MC31.07.2000
Former [2002/26]AT03.11.1999
BE03.11.1999
CH03.11.1999
ES03.11.1999
LI03.11.1999
SE03.11.1999
PT03.02.2000
IE08.07.2000
Former [2002/23]AT03.11.1999
BE03.11.1999
CH03.11.1999
LI03.11.1999
SE03.11.1999
PT03.02.2000
IE08.07.2000
Former [2001/50]AT03.11.1999
BE03.11.1999
CH03.11.1999
LI03.11.1999
PT03.02.2000
IE08.07.2000
Former [2000/52]AT03.11.1999
BE03.11.1999
CH03.11.1999
LI03.11.1999
PT03.02.2000
Former [2000/51]AT03.11.1999
BE03.11.1999
PT03.02.2000
CH08.02.2000
LI08.02.2000
Former [2000/50]BE03.11.1999
PT03.02.2000
CH08.02.2000
LI08.02.2000
Former [2000/43]BE03.11.1999
PT03.02.2000
Documents cited:Search[A]US3470465  (WUSCHKE EDGAR EDWIN);
 [A]FR2581196  (CENTRE NAT RECH SCIENT [FR]);
 [X]EP0288099  (YOKOGAWA ELECTROFACT BV [NL]);
 [X]EP0459782  (CAPITAL CONTROLS CO INC [US]);
 [XP]WO9218856  (FRAUNHOFER GES FORSCHUNG [DE])
ExaminationUS4683435
by applicantFR2581196
 US4683435
 US5275957
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.