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EP0654672
European procedure
Extract from the Register of European Patents
EP About this file: EP0654672
| EP0654672 - Integrated circuit test apparatus [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 11.01.2003 Database last updated on 22.01.2025 | Most recent event Tooltip | 11.01.2003 | No opposition filed within time limit | published on 26.02.2003 [2003/09] | Applicant(s) | For all designated states RAYTHEON COMPANY 141 Spring Street Lexington Massachusetts 02173 / US | [N/P] |
| Former [2002/10] | For all designated states RAYTHEON COMPANY 141 Spring Street Lexington, Massachusetts 02173 / US | ||
| Former [1999/04] | For all designated states RAYTHEON COMPANY 141 Spring Street Lexington Massachusetts 02173 / US | ||
| Former [1995/21] | For all designated states Hughes Aircraft Company 7200 Hughes Terrace, P.O. Box 80028 Los Angeles, California 90080-0028 / US | Inventor(s) | 01 /
Sobhani, Mohi 3676 Sappire Drive Encino, California 91436 / US | [1995/21] | Representative(s) | Kuhnen & Wacker Patent- und Rechtsanwaltsbüro PartG mbB Prinz-Ludwig-Straße 40A 85354 Freising / DE | [N/P] |
| Former [1999/04] | R.A. KUHNEN & P.A. WACKER Patentanwaltsgesellschaft mbH Alois-Steinecker-Strasse 22 85354 Freising / DE | ||
| Former [1995/21] | KUHNEN, WACKER & PARTNER Alois-Steinecker-Strasse 22 D-85354 Freising / DE | Application number, filing date | 94117937.6 | 14.11.1994 | [1995/21] | Priority number, date | US19930157556 | 23.11.1993 Original published format: US 157556 | [1995/21] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0654672 | Date: | 24.05.1995 | Language: | EN | [1995/21] | Type: | A3 Search report | No.: | EP0654672 | Date: | 14.02.1996 | [1996/07] | Type: | B1 Patent specification | No.: | EP0654672 | Date: | 06.03.2002 | Language: | EN | [2002/10] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 27.12.1995 | Classification | IPC: | G01R1/06, G01R1/073 | [1996/07] | CPC: |
G01R1/0735 (EP,US);
G01R31/26 (KR);
G01R1/06 (KR);
H01L22/00 (KR);
H01L2924/0002 (EP,US)
| C-Set: |
H01L2924/0002, H01L2924/00 (EP,US)
|
| Former IPC [1995/21] | G01R1/06 | Designated contracting states | DE, FR, GB, IT [1995/21] | Title | German: | Testvorrichtung für integrierte Schaltungen | [1995/21] | English: | Integrated circuit test apparatus | [1995/21] | French: | Appareil d'essai pour circuits intégrés | [1995/21] | Examination procedure | 13.08.1996 | Examination requested [1996/41] | 03.02.2000 | Despatch of a communication from the examining division (Time limit: M04) | 29.05.2000 | Reply to a communication from the examining division | 17.07.2001 | Despatch of communication of intention to grant (Approval: Yes) | 04.09.2001 | Communication of intention to grant the patent | 13.12.2001 | Fee for grant paid | 13.12.2001 | Fee for publishing/printing paid | Opposition(s) | 09.12.2002 | No opposition filed within time limit [2003/09] | Fees paid | Renewal fee | 21.10.1996 | Renewal fee patent year 03 | 20.10.1997 | Renewal fee patent year 04 | 27.10.1998 | Renewal fee patent year 05 | 22.10.1999 | Renewal fee patent year 06 | 16.10.2000 | Renewal fee patent year 07 | 22.10.2001 | Renewal fee patent year 08 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US4554505 (ZACHRY CLYDE L [US]) [A] 1 * column A; figures 1-4 *; | [A]EP0259162 (TEKTRONIX INC [US]) [A] 1-4 * column 1, line 9 - line 21 * * column 3, line 30 - column 4, line 22; figures 1,2,7 *; | [A]EP0343021 (AUGAT INC [US]) [A] 1-4 * abstract *; | [A]US5089772 (HATADA KENZO [JP], et al) [A] 1-4 * column 1, line 61 - column 3, line 18; figures 1-3,5,7,17 *; | [A]EP0484141 (HUGHES AIRCRAFT CO [US]) |