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Extract from the Register of European Patents

EP About this file: EP0884617

EP0884617 - Scanning near-field optic/atomic-force microscope, probe for use in same, and method of fabricating said probe [Right-click to bookmark this link]
Status	No opposition filed within time limit Status updated on 11.07.2003 Database last updated on 23.04.2024
Most recent event Tooltip	25.07.2008	Change - representative	published on 27.08.2008 [2008/35]
Applicant(s)	For all designated states SEIKO INSTRUMENTS INC. 31-1, Kameido 6-chome Koto-ku Tokyo / JP
	[1998/51]
Inventor(s)	01 / Muramatsu, Hiroshi c/0 Seiko Instruments Inc., 31-1, Kameido 6-chome Koto-ku, Tokyo / JP
	02 / Chiba, Norio c/0 Seiko Instruments Inc., 31-1, Kameido 6-chome Koto-ku, Tokyo / JP
	03 / Ataka, Tatsuaki c/0 Seiko Instruments Inc., 31-1, Kameido 6-chome Koto-ku, Tokyo / JP
	04 / Fujihira, Masamichi 2000-10-3-104 Kosugaya-cho, Sakae-ku Yokohama-shi, Kanagawa / JP
	[1999/42]
Former [1999/07]	01 / Matsumura, Hiroshi c/0 Seiko Instruments Inc., 31-1, Kameido 6-chome Koto-ku, Tokyo / JP
	02 / Chiba, Norio c/0 Seiko Instruments Inc., 31-1, Kameido 6-chome Koto-ku, Tokyo / JP
	03 / Ataka, Tatsuaki c/0 Seiko Instruments Inc., 31-1, Kameido 6-chome Koto-ku, Tokyo / JP
	04 / Fujihira, Masamichi 2000-10-3-104 Kosugaya-cho, Sakae-ku Yokohama-shi, Kanagawa / JP
Former [1999/02]	01 / Matsumura, Hiroshi c/0 Seiko Instruments Inc., 31-1, Kameido 6-chome Koto-ku, Tokyo / JP
	02 / Chiba, Norio c/0 Seiko Instruments Inc., 31-1, Kameido 6-chome Koto-ku, Tokyo / JP
	03 / Ataka, Tatsuaki c/0 Seiko Instruments Inc., 31-1, Kameido 6-chome Koto-ku, Tokyo / JP
	04 / Fujihira, Masamichi c/o Seiko Instruments Inc., 31-1, Kameido 6-chome Koto-ku, Tokyo / JP
Former [1998/51]	01 / Matsumura, Hiroshi c/0 Seiko Instruments Inc., 31-1, Kameido 6-chome Koto-ku, Tokyo / JP
	02 / Chiba, Norio c/0 Seiko Instruments Inc., 31-1, Kameido 6-chome Koto-ku, Tokyo / JP
	03 / Ataka, Tatsuaki c/0 Seiko Instruments Inc., 31-1, Kameido 6-chome Koto-ku, Tokyo / JP
	04 / Fujihira, Masamichi c/0 Seiko Instruments Inc., 31-1, Kameido 6-chome Koto-ku, Tokyo / JP
Representative(s)	Neugebauer, Jürgen, et al Schroeter Lehmann Fischer & Neugebauer Wolfratshauser Strasse 145 81479 München / DE
	[2008/35]
Former [2002/04]	Neugebauer, Jürgen, Dipl.-Phys., et al Schroeter Lehmann Fischer & Neugebauer Wolfratshauser Strasse 145 81479 München / DE
Former [2002/02]	Fischer, Matthias, et al Schroeter Lehmann Fischer & Neugebauer Wolfratshauser Strasse 145 81479 München / DE
Former [1998/51]	Fleuchaus, Leo, Dipl.-Ing., et al Melchiorstrasse 42 81479 München / DE
Application number, filing date	98112393.8	06.04.1994
	[1998/51]
Priority number, date	JP19930084952	12.04.1993 Original published format: JP 8495293
	JP19930276704	05.11.1993 Original published format: JP 27670493
	JP19930276706	05.11.1993 Original published format: JP 27670693
	JP19940052248	23.03.1994 Original published format: JP 5224894
	[1998/51]
Filing language	EN
Procedural language	EN
Publication	Type:	A1 Application with search report
	No.:	EP0884617
	Date:	16.12.1998
	Language:	EN
	[1998/51]
	Type:	B1 Patent specification
	No.:	EP0884617
	Date:	04.09.2002
	Language:	EN
	[2002/36]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	21.09.1998
Classification	IPC:	G02B21/00, G01B7/34	[1998/51]
	CPC:	G01Q30/02 (EP,KR,US); G01Q60/22 (EP,KR,US); B82Y20/00 (KR); B82Y35/00 (KR); G01Q60/06 (EP,KR,US); G01Q60/38 (EP,KR,US); (+) G01Q70/02 (EP,US); G02B6/241 (EP,KR,US); Y10S977/862 (EP,US); Y10S977/863 (EP,US); Y10S977/871 (EP,US); Y10S977/951 (EP,US) (-)
Designated contracting states	CH, DE, FR, GB, IT, LI, NL [1998/51]
Title	German:	Kombinierte Nahfeld- und Atomkraftrastermikroskop, Sonde dafür und Verfahren zur Herstellung der Sonde	[1998/51]
	English:	Scanning near-field optic/atomic-force microscope, probe for use in same, and method of fabricating said probe	[1998/51]
	French:	Microscope de balayage optique de champ proche/à force atomique combiné, sonde employée dans un tel système, et procédé de fabrication de ladite sonde	[1998/51]
Examination procedure	16.06.1999	Examination requested [1999/33]
	12.05.2000	Despatch of a communication from the examining division (Time limit: M06)
	22.11.2000	Reply to a communication from the examining division
	19.11.2001	Despatch of communication of intention to grant (Approval: Yes)
	13.03.2002	Communication of intention to grant the patent
	30.04.2002	Fee for grant paid
	30.04.2002	Fee for publishing/printing paid
Parent application(s) Tooltip	EP94105337.3 / EP0622652
Opposition(s)	05.06.2003	No opposition filed within time limit [2003/35]
Fees paid	Renewal fee
	17.07.1998	Renewal fee patent year 03
	17.07.1998	Renewal fee patent year 04
	17.07.1998	Renewal fee patent year 05
	03.09.1999	Renewal fee patent year 06
	27.10.2000	Renewal fee patent year 07
	12.04.2001	Renewal fee patent year 08
	12.04.2002	Renewal fee patent year 09
	Penalty fee
	Additional fee for renewal fee
	30.04.1999	06 M06 Fee paid on 03.09.1999
	30.04.2000	07 M06 Fee paid on 27.10.2000
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition Tooltip	CH	04.09.2002
	IT	04.09.2002
	LI	04.09.2002
	NL	04.09.2002
	GB	06.04.2003
	[2008/12]
Former [2004/22]	CH	04.09.2002
	LI	04.09.2002
	NL	04.09.2002
	GB	06.04.2003
Former [2003/31]	CH	04.09.2002
	LI	04.09.2002
	NL	04.09.2002
Former [2003/22]	NL	04.09.2002
Documents cited:	Search	[XAY]EP0535611 (FUJIHIRA MASAMICHI [JP], et al) [X] 1-3,5,6,12 * column 6, line 20 - column 7, line 49; figures 1A,5; example 4 * [A] 7 [Y] 4,8,9;
		[PX]EP0545538 (AMERICAN TELEPHONE & TELEGRAPH [US]) [PX] 1,5,7,8 * column 7, line 34 - column 9, line 36; figures 5-7,9-11,13; example . *
		[XAY] - SHALOM S ET AL, "A micropipette force probe suitable for near-field scanning optical microscopy", REVIEW OF SCIENTIFIC INSTRUMENTS, SEPT. 1992, USA, VOL. 63, NR. 9, PAGES 4061 - 4065, ISSN 0034-6748, XP000311659 [X] 7 * the whole document * [A] 1,10,11 [Y] 4,8,9 DOI: http://dx.doi.org/10.1063/1.1143212
		[A] - LEWIS A ET AL, "The optical near field and analytical chemistry", ANALYTICAL CHEMISTRY, JUN. 1991, USA, VOL. 63, NR.11, PAGES 625A - 638A, ISSN 0003-2700, XP000226379 [A] 1,7,8 * page 630A, column L, paragraph 2 - paragraph 3; figure 4 * DOI: http://dx.doi.org/10.1021/ac00006a014

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