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EP0894567
European procedure
Extract from the Register of European Patents
EP About this file: EP0894567
| EP0894567 - Method and apparatus for measuring an eyeglass frame and eyeglass lens grinding apparatus using the same [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 21.01.2005 Database last updated on 19.04.2025 | Most recent event Tooltip | 21.01.2005 | No opposition filed within time limit | published on 09.03.2005 [2005/10] | Applicant(s) | For all designated states Nidek Co., Ltd. 7-9, Sakae-cho Gamagori-shi Aichi / JP | [N/P] |
| Former [1999/05] | For all designated states Nidek Co., Ltd. 7-9, Sakae-cho Gamagori-shi, Aichi / JP | Inventor(s) | 01 /
Mizuno, Toshiaki 28-16, Nagane, Kanehira-cho Gamagori-shi, Aichi / JP | [1999/05] | Representative(s) | Weber, Joachim Hoefer & Partner Patentanwälte Pilgersheimer Strasse 20 81543 München / DE | [N/P] |
| Former [1999/05] | Weber, Joachim, Dr. Hoefer, Schmitz, Weber Patentanwälte Gabriel-Max-Strasse 29 81545 München / DE | Application number, filing date | 98114475.1 | 31.07.1998 | [1999/05] | Priority number, date | JP19970220807 | 31.07.1997 Original published format: JP 22080797 | [1999/05] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0894567 | Date: | 03.02.1999 | Language: | EN | [1999/05] | Type: | A3 Search report | No.: | EP0894567 | Date: | 09.08.2000 | [2000/32] | Type: | B1 Patent specification | No.: | EP0894567 | Date: | 17.03.2004 | Language: | EN | [2004/12] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 26.06.2000 | Classification | IPC: | B24B49/00, B24B9/14, B24B17/02, B24B17/10 | [2000/30] | CPC: |
B24B17/026 (EP,US);
B24B17/10 (EP,US);
B24B49/00 (EP,US);
B24B9/144 (EP,US);
B24B9/148 (EP,US)
|
| Former IPC [1999/05] | B24B9/14, B24B17/00, B24B49/00 | Designated contracting states | DE, ES, FR, GB [2001/17] |
| Former [1999/05] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE | Title | German: | Verfahren und Vorrichtung zum Messen eines Brillenlinsengestellaufbaus und Brillenlinsenschleifmaschine unter Verwendung desselben | [1999/05] | English: | Method and apparatus for measuring an eyeglass frame and eyeglass lens grinding apparatus using the same | [1999/05] | French: | Procédé et dispositif pour mesurer une monture de lunettes et machine de meulage de verres de lunettes faisant usage de ces derniers | [1999/05] | Examination procedure | 14.12.2000 | Examination requested [2001/06] | 10.02.2001 | Loss of particular rights, legal effect: designated state(s) | 21.06.2001 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, CY, DK, FI, GR, IE, IT, LI, LU, MC, NL, PT, SE | 30.04.2002 | Despatch of a communication from the examining division (Time limit: M06) | 11.11.2002 | Reply to a communication from the examining division | 06.08.2003 | Communication of intention to grant the patent | 05.01.2004 | Fee for grant paid | 05.01.2004 | Fee for publishing/printing paid | Opposition(s) | 20.12.2004 | No opposition filed within time limit [2005/10] | Fees paid | Renewal fee | 25.07.2000 | Renewal fee patent year 03 | 27.07.2001 | Renewal fee patent year 04 | 29.07.2002 | Renewal fee patent year 05 | 31.07.2003 | Renewal fee patent year 06 | Penalty fee | Penalty fee Rule 85a EPC 1973 | 29.03.2001 | AT M01 Not yet paid | 29.03.2001 | BE M01 Not yet paid | 29.03.2001 | CH M01 Not yet paid | 29.03.2001 | CY M01 Not yet paid | 29.03.2001 | DK M01 Not yet paid | 29.03.2001 | FI M01 Not yet paid | 29.03.2001 | GR M01 Not yet paid | 29.03.2001 | IE M01 Not yet paid | 29.03.2001 | IT M01 Not yet paid | 29.03.2001 | LU M01 Not yet paid | 29.03.2001 | MC M01 Not yet paid | 29.03.2001 | NL M01 Not yet paid | 29.03.2001 | PT M01 Not yet paid | 29.03.2001 | SE M01 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [XY]EP0666139 (TOPCON CORP [JP]) [X] 1,2,5 * column 4, line 42 - column 6, line 3; figure 14 * [Y] 6-10; | [Y]EP0576268 (HOYA CORP [JP]) [Y] 6,7 * abstract *; | [Y]JPS6328550 ; | [PXL]EP0826460 (NIDEK KK [JP]) [PXL] 1,2,5-7 * abstract * | [Y] - PATENT ABSTRACTS OF JAPAN, (19880706), vol. 012, no. 236, Database accession no. (M - 715), & JP63028550 A 19880206 (TOKYO OPTICAL CO LTD) [Y] 8-10 * abstract * |