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Extract from the Register of European Patents

EP About this file: EP1027997

EP1027997 - Method of testing light emission condition of exposing head and dot pattern for use in the method [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  03.04.2009
Database last updated on 12.07.2024
Most recent event   Tooltip07.05.2010Lapse of the patent in a contracting state
New state(s): GB
published on 09.06.2010  [2010/23]
Applicant(s)For all designated states
NORITSU KOKI CO., LTD.
579-1 Umehara Wakayama-shi
Wakayama / JP
[2008/22]
Former [2000/33]For all designated states
NORITSU KOKI CO., LTD.
579-1 Umehara
Wakayama-shi, Wakayama / JP
Inventor(s)01 / Nakatani, Yoshiyuki
c/o Noritsu Koki Co., Ltd., Umehara 579-1
Wakayama-shi, Wakayama-ken / JP
 [2008/22]
Former [2000/33]01 / Nakatani, Yoshiyuki
C/O Noritsu Koki Co., Ltd., Umehara 579-1
Wakayama-shi, Wakayama-ken / JP
Representative(s)LBP Lemcke, Brommer & Partner Patentanwälte mbB
Siegfried-Kühn-Straße 4
76135 Karlsruhe / DE
[N/P]
Former [2009/02]Lemcke, Brommer & Partner
Patentanwälte Bismarckstrasse 16
76133 Karlsruhe / DE
Former [2000/33]Petersen, Frank, Dipl.-Ing., et al
Lemcke, Brommer & Partner Patentanwälte Bismarckstrasse 16
76133 Karlsruhe / DE
Application number, filing date00102611.108.02.2000
[2000/33]
Priority number, dateJP1999003277710.02.1999         Original published format: JP 3277799
[2000/33]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1027997
Date:16.08.2000
Language:EN
[2000/33]
Type: A3 Search report 
No.:EP1027997
Date:29.11.2000
[2000/48]
Type: B1 Patent specification 
No.:EP1027997
Date:28.05.2008
Language:EN
[2008/22]
Search report(s)(Supplementary) European search report - dispatched on:EP18.10.2000
ClassificationIPC:B41J2/447, G06K15/12
[2000/48]
CPC:
B41J2/4476 (EP,US); G06K15/1247 (EP,US)
Former IPC [2000/33]B41J2/447
Designated contracting statesDE,   FR,   GB [2001/33]
Former [2000/33]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Verfahren zum Testen des Lichtemissionszustandes eines Belichtungskopfes und Punktmuster zur Verwendung in diesem Verfahren[2000/33]
English:Method of testing light emission condition of exposing head and dot pattern for use in the method[2000/33]
French:Procédé pour tester l'état d'émission de lumière d'une tête d'exposition et motif à points à utiliser dans ce procédé[2000/33]
Examination procedure08.02.2000Examination requested  [2000/33]
30.05.2001Loss of particular rights, legal effect: designated state(s)
20.09.2001Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, CY, DK, ES, FI, GR, IE, IT, LI, LU, MC, NL, PT, SE
13.07.2007Despatch of a communication from the examining division (Time limit: M04)
22.11.2007Reply to a communication from the examining division
21.12.2007Communication of intention to grant the patent
14.03.2008Fee for grant paid
14.03.2008Fee for publishing/printing paid
Opposition(s)03.03.2009No opposition filed within time limit [2009/19]
Fees paidRenewal fee
23.02.2002Renewal fee patent year 03
22.02.2003Renewal fee patent year 04
26.02.2004Renewal fee patent year 05
25.02.2005Renewal fee patent year 06
21.02.2006Renewal fee patent year 07
05.01.2007Renewal fee patent year 08
28.12.2007Renewal fee patent year 09
Penalty fee
Penalty fee Rule 85a EPC 1973
04.07.2001AT   M01   Not yet paid
04.07.2001BE   M01   Not yet paid
04.07.2001CH   M01   Not yet paid
04.07.2001CY   M01   Not yet paid
04.07.2001DK   M01   Not yet paid
04.07.2001ES   M01   Not yet paid
04.07.2001FI   M01   Not yet paid
04.07.2001GR   M01   Not yet paid
04.07.2001IE   M01   Not yet paid
04.07.2001IT   M01   Not yet paid
04.07.2001LU   M01   Not yet paid
04.07.2001MC   M01   Not yet paid
04.07.2001NL   M01   Not yet paid
04.07.2001PT   M01   Not yet paid
04.07.2001SE   M01   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipGB08.02.2009
FR02.03.2009
[2010/23]
Former [2010/21]FR02.03.2009
Documents cited:Search[A]US4757327  (HENZI MAX P [US]) [A] 1,4 * column 5, line 38 - column 8, line 35; figures 1,4,5 *;
 [A]WO9835834  (CITIZEN WATCH CO LTD [JP], et al) [A] 1,4 * abstract *;
 EP0941861  [ ] (CITIZEN WATCH CO LTD [JP]) [ ] * paragraph [0015] - paragraph [0035]; figure 2 *;
 [A]EP0529532  (EASTMAN KODAK CO [US]) [A] 1,4 * column 10, line 10 - column 11, line 57; figures 1,5-7 *;
 [A]EP0434449  (XEROX CORP [US]) [A] 1,4 * column 11, line 10 - column 16, line 39; figures 9-14 *
 [A]  - SHIMIZU Y ET AL, "COLOR VACUUM FLUORESCENT PRINTHEAD FOR THE SILVER-HALIDE PHOTOGRAPHIC SYSTEM", SID INTERNATIONAL SYMPOSIUM DIGEST OF PAPERS,US,PLAYA DEL REY, SID, (19920517), vol. 23, ISSN 0097-966X, pages 741 - 744, XP000479116 [A] 1,4 * page 743, column 1, line 1 - page 744, column 2, line 1; figures 2,7-9 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.