blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP1130135

EP1130135 - Silicon carbide film and method for manufacturing the same [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  13.06.2008
Database last updated on 11.09.2024
Most recent event   Tooltip13.06.2008No opposition filed within time limitpublished on 16.07.2008  [2008/29]
Applicant(s)For all designated states
HOYA CORPORATION
7-5, Naka-Ochiai 2-Chome
Shinjuku-ku
Tokyo 161-0032 / JP
[N/P]
Former [2007/32]For all designated states
HOYA CORPORATION
7-5, Naka-Ochiai 2-Chome Shinjuku-ku
Tokyo / JP
Former [2001/36]For all designated states
HOYA CORPORATION
7-5, Naka-Ochiai 2-Chome
Shinjuku-ku Tokyo / JP
Inventor(s)01 / Nakano, Yukitaka, c/o Hoya Corporation
7-5 Naka-Ochiai 2-chome, Shinjuku-ku
Tokyo / JP
02 / Nagasawa, Hiroyuki, c/o Hoya Corporation
7-5 Naka-Ochiai 2-chome, Shinjuku-ku
Tokyo / JP
03 / Yagi, Kuniaki, c/o Hoya Corporation
7-5 Naka-Ochiai 2-chome, Shinjuku-ku
Tokyo / JP
04 / Kawahara, Takamitsu, c/o Hoya Corporation
7-5 Naka-Ochiai 2-chome, Shinjuku-ku
Tokyo / JP
 [2001/36]
Representative(s)Schippan, Ralph
Cohausz & Florack
Patent- und Rechtsanwälte
Partnerschaftsgesellschaft mbB
Bleichstrasse 14
40211 Düsseldorf / DE
[N/P]
Former [2001/36]Schippan, Ralph, Dr.-Ing.
Cohausz & Florack, Kanzlerstrasse 8a
40472 Düsseldorf / DE
Application number, filing date00104123.529.02.2000
[2001/36]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1130135
Date:05.09.2001
Language:EN
[2001/36]
Type: B1 Patent specification 
No.:EP1130135
Date:08.08.2007
Language:EN
[2007/32]
Search report(s)(Supplementary) European search report - dispatched on:EP16.06.2000
ClassificationIPC:C30B25/02, C23C16/32
[2001/36]
CPC:
C23C16/325 (EP,US); C30B25/02 (EP,US); C30B25/18 (EP,US);
C30B29/36 (EP,US)
Designated contracting statesDE,   FR,   GB,   SE [2002/21]
Former [2001/36]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Siliziumkarbidschicht und Herstellungsverfahren[2001/36]
English:Silicon carbide film and method for manufacturing the same[2001/36]
French:Film de carbure de silicium et son procédé de fabrication[2001/36]
Examination procedure03.08.2001Amendment by applicant (claims and/or description)
03.08.2001Examination requested  [2001/40]
26.05.2003Despatch of a communication from the examining division (Time limit: M04)
10.09.2003Reply to a communication from the examining division
12.10.2005Despatch of a communication from the examining division (Time limit: M06)
21.04.2006Reply to a communication from the examining division
24.10.2006Despatch of a communication from the examining division (Time limit: M04)
13.01.2007Reply to a communication from the examining division
23.02.2007Communication of intention to grant the patent
14.06.2007Fee for grant paid
14.06.2007Fee for publishing/printing paid
Divisional application(s)EP07109336.3  / EP1840249
Opposition(s)09.05.2008No opposition filed within time limit [2008/29]
Fees paidRenewal fee
30.01.2002Renewal fee patent year 03
24.02.2003Renewal fee patent year 04
24.02.2004Renewal fee patent year 05
22.02.2005Renewal fee patent year 06
23.02.2006Renewal fee patent year 07
23.02.2007Renewal fee patent year 08
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]JPS63270398  ;
 [A]EP0020134  (MASSACHUSETTS INST TECHNOLOGY [US]) [A] 1,2,4-6 * abstract *;
 [A]US5501173  (BURK JR ALBERT A [US], et al) [A] 1,2,7,9 * abstract * * column 2, line 30 - line 64 *
 [XA]  - MITSUHIRO SHIGETA ET AL, "CHEMICAL VAPOR DEPOSITION OF SINGLE-CRYSTAL FILMS OF CUBIC SIC ON PATTERNED SI SUBSTRATES", APPLIED PHYSICS LETTERS,US,AMERICAN INSTITUTE OF PHYSICS. NEW YORK, (19891009), vol. 55, no. 15, ISSN 0003-6951, pages 1522 - 1524, XP000094807 [X] 1-4,8,9 * abstract * * page 1522, column R, line 9 - line 20 * [A] 5,6

DOI:   http://dx.doi.org/10.1063/1.102252
 [X]  - PATENT ABSTRACTS OF JAPAN, (19890227), vol. 013, no. 084, Database accession no. (C - 572), & JP63270398 A 19881108 (SHARP CORP) [X] 1,2,8,9 * abstract *
 [DA]  - K. SHIBAHARA, S. NISHINO AND H. MATSUNAMI, "Antiphase-domain-free growth of cubic SiC on Si(100)", APPLIED PHYSIC LETTERS, US, AMERICAN INSTITUTE OF PHYSICS, (19870629), vol. 50, no. 26, pages 1888 - 1890, XP000885091 [DA] 1,8,9 * the whole document *

DOI:   http://dx.doi.org/10.1063/1.97676
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.