blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability
Register Forum

2022.02.11

More...
blank News flashes

News flashes

New version of the European Patent Register - SPC information for Unitary Patents.

2024-03-06

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP1087036

EP1087036 - Method and apparatus for observing porous amorphous film, and method and apparatus for forming the same [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  16.09.2005
Database last updated on 24.04.2024
Most recent event   Tooltip16.09.2005No opposition filed within time limitpublished on 02.11.2005  [2005/44]
Applicant(s)For all designated states
TOKYO ELECTRON LIMITED
3-6 Akasaka, 5-chome, Minato-ku
Tokyo 107-8481 / JP
[N/P]
Former [2001/13]For all designated states
Tokyo Electron Limited
3-6 Akasaka, 5-chome, Minato-ku
Tokyo 107-8481 / JP
Inventor(s)01 / Kawamura, Shigeru, c/o Tokyo Electron Limited
650, Mitsuzawa, Hosaka-cho
Nirasaki-shi, Yamanashi 407-0192 / JP
 [2001/13]
Representative(s)Liesegang, Eva
Boehmert & Boehmert
Anwaltspartnerschaft mbB
Pettenkoferstrasse 22
80336 München / DE
[N/P]
Former [2001/13]Liesegang, Eva
Forrester & Boehmert, Franz-Joseph-Strasse 38
80801 München / DE
Application number, filing date00121042.627.09.2000
[2001/13]
Priority number, dateJP1999027207727.09.1999         Original published format: JP 27207799
[2001/13]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1087036
Date:28.03.2001
Language:EN
[2001/13]
Type: B1 Patent specification 
No.:EP1087036
Date:10.11.2004
Language:EN
[2004/46]
Search report(s)(Supplementary) European search report - dispatched on:EP07.02.2001
ClassificationIPC:C23C16/56, C23C16/22
[2001/13]
CPC:
C23C16/52 (EP,US); C23C16/045 (EP,US); G01R31/2653 (EP,US);
G01R31/2831 (EP,US)
Designated contracting statesBE,   DE,   FR,   GB,   NL [2001/51]
Former [2001/13]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Methode und Vorrichtung zur Beobachtung einer porösen, amorphen Schicht und Methode und Vorrichtung zur Herstellung derselben.[2004/18]
English:Method and apparatus for observing porous amorphous film, and method and apparatus for forming the same[2001/13]
French:Méthode et appareil pour observer le film amorphe poreux et la méthode et l'appareil pour fermer le film.[2001/13]
Former [2001/13]Methode und Vorrichtung zur Beobachtung einer porösen, amorphen Schucht und Methode und Vorrichtung zur Herstellung derselben.
Examination procedure27.09.2000Examination requested  [2001/13]
22.04.2004Communication of intention to grant the patent
04.08.2004Fee for grant paid
04.08.2004Fee for publishing/printing paid
Opposition(s)11.08.2005No opposition filed within time limit [2005/44]
Fees paidRenewal fee
12.09.2002Renewal fee patent year 03
12.09.2003Renewal fee patent year 04
14.09.2004Renewal fee patent year 05
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]EP0768388  (NEC CORP [JP]) [A] 12-17;
 [A]US5698901  (ENDO KAZUHIKO [JP]) [A] 12-17;
 [A]WO9919533  (APPLIED MATERIALS INC [US]) [A] 12-17;
 [A]US5900290  (YANG HONGNING [US], et al)[A] 12-17
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.