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EP1158303
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EP About this file: EP1158303
| EP1158303 - A circuit for measuring absolute spread in capacitors implemented in planary technology [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 25.07.2003 Database last updated on 08.06.2024 | Most recent event Tooltip | 25.07.2003 | Application deemed to be withdrawn | published on 10.09.2003 [2003/37] | Applicant(s) | For all designated states Semiconductor Ideas to The Market (ItoM) BV Drielindendreef 53 4389 AH Breda / NL | [N/P] |
| Former [2001/48] | For all designated states Semiconductor Ideas to The Market (ItoM) BV Drielindendreef 53 4839 AH Breda / NL | Inventor(s) | 01 /
Kasperkowitz, Wolfdietrich George Eikenlaan 4 5581 HA Waalre / NL | [2001/48] | Representative(s) | van Straaten, Joop, et al Octrooibureau Van Straaten B.V. Monseigneur Bosstraat 22 5401 EB Uden / NL | [N/P] |
| Former [2001/48] | Van Straaten, Joop, et al Octrooibureau Van Straaten B.V. Monseigneur Bosstraat 22 5401 EB Uden / NL | Application number, filing date | 00201821.6 | 25.05.2000 | [2001/48] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP1158303 | Date: | 28.11.2001 | Language: | EN | [2001/48] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 20.11.2000 | Classification | IPC: | G01R27/26, G01R31/316 | [2001/48] | CPC: |
G01R31/2884 (EP,US);
G01R27/2605 (EP,US)
| Designated contracting states | [2002/33] |
| Former [2001/48] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE | Title | German: | In Planartechnik ausgeführter Schaltkreis zur Messung der absoluten Streuung von Kapazitäten | [2001/48] | English: | A circuit for measuring absolute spread in capacitors implemented in planary technology | [2001/48] | French: | Circuit de mesure de dispersion absolue de capacités réalisé en technologie planaire | [2001/48] | Examination procedure | 29.05.2002 | Application deemed to be withdrawn, date of legal effect [2003/37] | 22.01.2003 | Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time [2003/37] | Fees paid | Penalty fee | Penalty fee Rule 85a EPC 1973 | 02.10.2002 | AT M01 Not yet paid | 02.10.2002 | BE M01 Not yet paid | 02.10.2002 | CH M01 Not yet paid | 02.10.2002 | CY M01 Not yet paid | 02.10.2002 | DE M01 Not yet paid | 02.10.2002 | DK M01 Not yet paid | 02.10.2002 | ES M01 Not yet paid | 02.10.2002 | FI M01 Not yet paid | 02.10.2002 | FR M01 Not yet paid | 02.10.2002 | GB M01 Not yet paid | 02.10.2002 | GR M01 Not yet paid | 02.10.2002 | IE M01 Not yet paid | 02.10.2002 | IT M01 Not yet paid | 02.10.2002 | LU M01 Not yet paid | 02.10.2002 | MC M01 Not yet paid | 02.10.2002 | NL M01 Not yet paid | 02.10.2002 | PT M01 Not yet paid | 02.10.2002 | SE M01 Not yet paid | Penalty fee Rule 85b EPC 1973 | 02.10.2002 | M01 Not yet paid | Additional fee for renewal fee | 31.05.2002 | 03 M06 Not yet paid | 31.05.2003 | 04 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [AD]GB2184621 (CRYSTAL SEMICONDUCTOR CORP) [AD] 1 * abstract *; | [A]EP0520352 (TOYODA MACHINE WORKS LTD [JP]) [A] 1 * page 3, line 17 - line 29; figures 5,7,8 * * page 7, line 28 - line 48 *; | [A]EP0641080 (MOTOROLA INC [US]) [A] 1* abstract *; | [A]EP0644432 (PENBERTHY INC [US]) [A] 1 * abstract *; | [A] - ROHWER K C, "MEASURING CAPACITANCE", ELEKTOR ELECTRONICS,GB,ELEKTOR PUBLISHERS LTD. CANTERBURY, (19960201), vol. 22, no. 241, ISSN 0268-4519, pages 48 - 51, XP000552215 [A] 1 * abstract * | [A] - CHEN J C ET AL, "An on-chip, interconnect capacitance characterization method with sub-femto-farad resolution", IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING,IEEE INC, NEW YORK,US, (19980501), vol. 11, no. 2, ISSN 0894-6507, pages 204 - 210, XP002096116 [A] 1 * abstract * * page 204, column R, paragraph 2 - paragraph 4 * DOI: http://dx.doi.org/10.1109/66.670160 |