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EP1107011
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EP About this file: EP1107011
| EP1107011 - Method and device for measuring the temperature of high frequency components [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 03.10.2008 Database last updated on 14.06.2024 | Most recent event Tooltip | 03.10.2008 | Application deemed to be withdrawn | published on 05.11.2008 [2008/45] | Applicant(s) | For all designated states Thales 173, boulevard Haussmann 75008 Paris / FR | [2001/40] |
| Former [2001/24] | For all designated states THOMSON-CSF 173, Boulevard Haussmann 75008 Paris / FR | Inventor(s) | 01 /
Tolant, Clément THOMSON-CSF, SCPI, 13, av. du Président S. Allende 94117 Arcueil Cedex / FR | 02 /
Cordier, Joel THOMSON-CSF, SCPI, 13, av. du Président S. Allende 94117 Arcueil Cedex / FR | 03 /
Eudeline, Philippe THOMSON-CSF, SCPI, 13, av. du Président S. Allende 94117 Arcueil Cedex / FR | 04 /
Servain, Patrick THOMSON-CSF, SCPI, 13, av. du Président S. Allende 94117 Arcueil Cedex / FR | [2001/24] | Representative(s) | Lucas, Laurent Jacques Marks & Clerk France Conseils en Propriété Industrielle Immeuble Visium 22, Avenue Aristide Briand 94117 Arcueil Cedex / FR | [N/P] |
| Former [2001/24] | Lucas, Laurent Jacques Thomson-CSF Propriété Intellectuelle 13, avenue du Président S. Allende 94117 Arcueil Cedex / FR | Application number, filing date | 00403300.7 | 24.11.2000 | [2001/24] | Priority number, date | FR19990015094 | 30.11.1999 Original published format: FR 9915094 | [2001/24] | Filing language | FR | Procedural language | FR | Publication | Type: | A1 Application with search report | No.: | EP1107011 | Date: | 13.06.2001 | Language: | FR | [2001/24] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 06.04.2001 | Classification | IPC: | G01R31/26 | [2001/24] | CPC: |
G01R19/25 (EP,US);
G01R31/2619 (EP,US);
G01R31/2628 (EP,US);
G01R31/2632 (EP,US)
| Designated contracting states | DE, FR, GB, IT [2002/10] |
| Former [2001/24] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR | Title | German: | Verfahren und Vorrichtung zum Messen der Temperatur von Hochfrequenzbauteilen | [2001/24] | English: | Method and device for measuring the temperature of high frequency components | [2001/24] | French: | Procédé et dispositif de mesure de la température de composants hyperfréquence | [2001/24] | Examination procedure | 27.11.2001 | Examination requested [2002/04] | 14.12.2001 | Loss of particular rights, legal effect: designated state(s) | 09.04.2002 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, CY, DK, ES, FI, GR, IE, LU, MC, NL, PT, SE, TR | 08.09.2005 | Despatch of a communication from the examining division (Time limit: M06) | 07.06.2006 | Reply to a communication from the examining division | 31.10.2007 | Despatch of a communication from the examining division (Time limit: M06) | 11.05.2008 | Application deemed to be withdrawn, date of legal effect [2008/45] | 17.06.2008 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2008/45] | Request for further processing for: | 07.06.2006 | Request for further processing filed | 07.06.2006 | Full payment received (date of receipt of payment) Request granted | 10.07.2006 | Decision despatched | Fees paid | Renewal fee | 13.11.2002 | Renewal fee patent year 03 | 12.11.2003 | Renewal fee patent year 04 | 12.11.2004 | Renewal fee patent year 05 | 14.11.2005 | Renewal fee patent year 06 | 14.11.2006 | Renewal fee patent year 07 | 15.11.2007 | Renewal fee patent year 08 | Penalty fee | Penalty fee Rule 85a EPC 1973 | 17.01.2002 | AT M01 Not yet paid | 17.01.2002 | BE M01 Not yet paid | 17.01.2002 | CH M01 Not yet paid | 17.01.2002 | CY M01 Not yet paid | 17.01.2002 | DK M01 Not yet paid | 17.01.2002 | ES M01 Not yet paid | 17.01.2002 | FI M01 Not yet paid | 17.01.2002 | GR M01 Not yet paid | 17.01.2002 | IE M01 Not yet paid | 17.01.2002 | LU M01 Not yet paid | 17.01.2002 | MC M01 Not yet paid | 17.01.2002 | NL M01 Not yet paid | 17.01.2002 | PT M01 Not yet paid | 17.01.2002 | SE M01 Not yet paid | 17.01.2002 | TR M01 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]EP0336814 (THOMSON CSF [FR]) [A] 1,10 * abstract * | [X] - BERLIOUX R., "Le test des semiconducteurs de puissance", TOUTE L'ELECTRONIQUE,FR,SOCIETE DES EDITIONS RADIO. PARIS, (198502), no. 501, pages 59 - 62, XP002143985 [X] 1-10 * page 59, column 2, line 1 - page 60, column 3, line L * | [A] - LEIFER M C, "JUNCTION TEMPERATURE MEASUREMENTS IN REVERSE-BIASED PIN DIODES", REVIEW OF SCIENTIFIC INSTRUMENTS,US,AMERICAN INSTITUTE OF PHYSICS. NEW YORK, (19940201), vol. 65, no. 2, ISSN 0034-6748, pages 472 - 476, XP000439442 [A] 1 * abstract * DOI: http://dx.doi.org/10.1063/1.1145159 |