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Extract from the Register of European Patents

EP About this file: EP1204887

EP1204887 - METHOD FOR RADIAL PROFILING OF RESISTIVITY AT MULTIPLE DEPTHS OF INVESTIGATION [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  06.05.2005
Database last updated on 03.10.2024
Most recent event   Tooltip06.05.2005Withdrawal of applicationpublished on 22.06.2005  [2005/25]
Applicant(s)For all designated states
HALLIBURTON ENERGY SERVICES, INC.
4100 Clinton Drive
Building 1, 6th Floor
Houston
Texas 77020 / US
[N/P]
Former [2002/20]For all designated states
Halliburton Energy Services, Inc.
4100 Clinton Drive, Building 1, 6th Floor
Houston, Texas 77020 / US
Inventor(s)01 / HAGIWARA, Teruhiko
9415 Bassoon Drive
Houston, TX 77025 / US
 [2002/20]
Representative(s)Wain, Christopher Paul, et al
A.A. Thornton & Co. 235 High Holborn London
WC1V 7LE / GB
[N/P]
Former [2002/20]Wain, Christopher Paul, et al
A.A. Thornton & Co. 235 High Holborn
London WC1V 7LE / GB
Application number, filing date00923148.107.04.2000
[2002/20]
WO2000US09162
Priority number, dateUS1999033760121.06.1999         Original published format: US 337601
[2002/20]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO0079306
Date:28.12.2000
Language:EN
[2000/52]
Type: A1 Application with search report 
No.:EP1204887
Date:15.05.2002
Language:EN
The application published by WIPO in one of the EPO official languages on 28.12.2000 takes the place of the publication of the European patent application.
[2002/20]
Search report(s)International search report - published on:US28.12.2000
(Supplementary) European search report - dispatched on:EP10.06.2003
ClassificationIPC:G01V3/18, G01V3/30, G01V3/38
[2002/20]
CPC:
G01V3/30 (EP,US)
Designated contracting statesGB [2004/22]
Former [2002/20]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
Extension statesALNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
RONot yet paid
SINot yet paid
TitleGerman:VERFAHREN ZUM RADIALEN PROFILIEREN VOM WIDERSTAND AUF MEHRFACHEN VERMESSUNGSTIEFEN[2002/20]
English:METHOD FOR RADIAL PROFILING OF RESISTIVITY AT MULTIPLE DEPTHS OF INVESTIGATION[2002/20]
French:PROCEDE D'ETABLISSEMENT DU PROFIL DE RESISTIVITE RADIALE A DES PROFONDEURS D'INVESTIGATION MULTIPLES[2002/20]
Entry into regional phase14.12.2001National basic fee paid 
14.12.2001Search fee paid 
14.12.2001Designation fee(s) paid 
14.12.2001Examination fee paid 
Examination procedure04.01.2001Request for preliminary examination filed
International Preliminary Examining Authority: US
14.12.2001Amendment by applicant (claims and/or description)
14.12.2001Examination requested  [2002/20]
23.03.2004Despatch of a communication from the examining division (Time limit: M04)
28.07.2004Reply to a communication from the examining division
18.08.2004Despatch of a communication from the examining division (Time limit: M04)
24.12.2004Reply to a communication from the examining division
27.04.2005Application withdrawn by applicant  [2005/25]
Fees paidRenewal fee
08.04.2002Renewal fee patent year 03
07.04.2003Renewal fee patent year 04
06.04.2004Renewal fee patent year 05
04.04.2005Renewal fee patent year 06
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[Y]US5448171  (CHEMALI ROLAND E [US], et al) [Y] 1-48 * column 1, line 29 - line 36 * * column 1, line 57 - line 61 * * column 2, line 34 - column 3, line 4 * * figure 2 *;
 [A]US5594343  (CLARK BRIAN [US], et al) [A] 1,12,24,35* figures 2,3; claim 1 *;
 [Y]EP0793119  (ANADRILL INT SA [PA], et al) [Y] 1-48 * column 2, line 4 - line 17 * * column 4, line 35 - line 57 * * figures 1,2; claim 1 *;
 [A]  - JONES V.L., "Extrapolation and interpolation formulae adaptable to desk and other types of digital computers", GEOPHYSICS, (19561001), vol. 21, no. 4, pages 1047 - 1054, XP002242488 [A] 1-48 * the whole document *

DOI:   http://dx.doi.org/10.1190/1.1438298
International search[A]US4899112  (CLARK BRIAN [US], et al);
 [A]US5389881  (BITTAR MICHAEL S [US], et al);
 [A]US5448171  (CHEMALI ROLAND E [US], et al);
 [A]US5469062  (THOMPSON LARRY W [US], et al);
 [A]US5594343  (CLARK BRIAN [US], et al)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.