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Extract from the Register of European Patents

EP About this file: EP1190237

EP1190237 - METHOD AND APPARATUS FOR MONITORING AND ANALYZING THE SURFACE OF FLOATED MATERIAL [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  21.11.2008
Database last updated on 19.10.2024
Most recent event   Tooltip22.10.2010Lapse of the patent in a contracting state
New state(s): GR
published on 24.11.2010  [2010/47]
Applicant(s)For all designated states
Outotec Oyj
Riihitontuntie 7
02200 Espoo / FI
[2008/02]
Former [2004/44]For all designated states
Outokumpu Oyj
Riihitontuntie 7
02200 Espoo / FI
Former [2002/13]For all designated states
NIEMI, Antti Johannes
Yrjö Liipolantie 5
SF-02700 Kauniainen / FI
Inventor(s)01 / Niemi, Antti
Yrjö Liipolantie 5
02700 Kauniainen / FI
 [2004/44]
Former [2002/13]01 / see applicant
...
Representative(s)Nordin, Leif Göran
Berggren Oy Ab, P.O. Box 16
00101 Helsinki / FI
[N/P]
Former [2002/13]Nordin, Leif
Berggren Oy Ab, P.O. Box 16
00101 Helsinki / FI
Application number, filing date00927265.905.05.2000
[2002/13]
WO2000FI00400
Priority number, dateFI1999000102305.05.1999         Original published format: FI 991023
[2002/13]
Filing languageFI
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO0068672
Date:16.11.2000
Language:EN
[2000/46]
Type: A1 Application with search report 
No.:EP1190237
Date:27.03.2002
Language:EN
The application published by WIPO in one of the EPO official languages on 16.11.2000 takes the place of the publication of the European patent application.
[2002/13]
Type: B1 Patent specification 
No.:EP1190237
Date:16.01.2008
Language:EN
[2008/03]
Search report(s)International search report - published on:SE16.11.2000
ClassificationIPC:G01N21/85, B03B13/02
[2002/13]
CPC:
B03B13/02 (EP,US); B03D1/028 (EP,US); B03D1/14 (EP,US)
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE [2002/13]
Extension statesALNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
RONot yet paid
SINot yet paid
TitleGerman:VERFAHREN UND VORRICHTUNG ZUR ÜBERWACHUNG UND ANALYSE DER OBERFLÄCHE VON SCHWEBENDEM MATERIAL[2002/13]
English:METHOD AND APPARATUS FOR MONITORING AND ANALYZING THE SURFACE OF FLOATED MATERIAL[2002/13]
French:PROCEDE ET APPAREIL PERMETTANT DE SURVEILLER ET D'ANALYSER LA SURFACE DE MATIERES FLOTTANTES[2002/13]
Entry into regional phase05.12.2001Translation filed 
30.11.2001National basic fee paid 
30.11.2001Designation fee(s) paid 
30.11.2001Examination fee paid 
Examination procedure04.12.2000Request for preliminary examination filed
International Preliminary Examining Authority: EP
30.11.2001Examination requested  [2002/13]
05.12.2001Amendment by applicant (claims and/or description)
20.02.2006Despatch of a communication from the examining division (Time limit: M04)
15.06.2006Reply to a communication from the examining division
17.07.2007Communication of intention to grant the patent
17.11.2007Fee for grant paid
17.11.2007Fee for publishing/printing paid
Opposition(s)17.10.2008No opposition filed within time limit [2008/52]
Fees paidRenewal fee
11.07.2002Renewal fee patent year 03
20.05.2003Renewal fee patent year 04
21.05.2004Renewal fee patent year 05
15.04.2005Renewal fee patent year 06
13.04.2006Renewal fee patent year 07
16.04.2007Renewal fee patent year 08
Penalty fee
Additional fee for renewal fee
31.05.200203   M06   Fee paid on   11.07.2002
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See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT16.01.2008
BE16.01.2008
CH16.01.2008
CY16.01.2008
DK16.01.2008
FI16.01.2008
IT16.01.2008
LI16.01.2008
NL16.01.2008
DE17.04.2008
GR17.04.2008
ES27.04.2008
GB05.05.2008
IE05.05.2008
LU05.05.2008
MC31.05.2008
PT16.06.2008
[2010/47]
Former [2010/32]AT16.01.2008
BE16.01.2008
CH16.01.2008
CY16.01.2008
DK16.01.2008
FI16.01.2008
IT16.01.2008
LI16.01.2008
NL16.01.2008
DE17.04.2008
ES27.04.2008
GB05.05.2008
IE05.05.2008
LU05.05.2008
MC31.05.2008
PT16.06.2008
Former [2009/39]AT16.01.2008
BE16.01.2008
CH16.01.2008
CY16.01.2008
DK16.01.2008
FI16.01.2008
IT16.01.2008
LI16.01.2008
NL16.01.2008
DE17.04.2008
ES27.04.2008
GB05.05.2008
IE05.05.2008
MC31.05.2008
PT16.06.2008
Former [2009/33]AT16.01.2008
BE16.01.2008
CH16.01.2008
CY16.01.2008
DK16.01.2008
FI16.01.2008
LI16.01.2008
NL16.01.2008
DE17.04.2008
ES27.04.2008
GB05.05.2008
IE05.05.2008
MC31.05.2008
PT16.06.2008
Former [2009/29]AT16.01.2008
BE16.01.2008
CH16.01.2008
DK16.01.2008
FI16.01.2008
LI16.01.2008
NL16.01.2008
DE17.04.2008
ES27.04.2008
GB05.05.2008
IE05.05.2008
MC31.05.2008
PT16.06.2008
Former [2009/23]AT16.01.2008
BE16.01.2008
CH16.01.2008
DK16.01.2008
FI16.01.2008
LI16.01.2008
NL16.01.2008
DE17.04.2008
ES27.04.2008
IE05.05.2008
MC31.05.2008
PT16.06.2008
Former [2009/12]AT16.01.2008
BE16.01.2008
CH16.01.2008
DK16.01.2008
FI16.01.2008
LI16.01.2008
NL16.01.2008
DE17.04.2008
ES27.04.2008
MC31.05.2008
PT16.06.2008
Former [2009/04]AT16.01.2008
BE16.01.2008
CH16.01.2008
DK16.01.2008
FI16.01.2008
LI16.01.2008
NL16.01.2008
ES27.04.2008
MC31.05.2008
PT16.06.2008
Former [2008/46]AT16.01.2008
BE16.01.2008
CH16.01.2008
DK16.01.2008
FI16.01.2008
LI16.01.2008
NL16.01.2008
ES27.04.2008
PT16.06.2008
Former [2008/43]AT16.01.2008
BE16.01.2008
CH16.01.2008
FI16.01.2008
LI16.01.2008
NL16.01.2008
ES27.04.2008
PT16.06.2008
Former [2008/42]AT16.01.2008
CH16.01.2008
FI16.01.2008
LI16.01.2008
NL16.01.2008
ES27.04.2008
PT16.06.2008
Former [2008/39]AT16.01.2008
CH16.01.2008
FI16.01.2008
LI16.01.2008
NL16.01.2008
ES27.04.2008
Former [2008/35]CH16.01.2008
LI16.01.2008
NL16.01.2008
ES27.04.2008
Former [2008/27]NL16.01.2008
Cited inInternational search[A]GB2084723  (KLOECKNER HUMBOLDT DEUTZ AG);
 [A]US5024334  (MISRA MANJIT K [US], et al);
 [A]US5038258  (KOCH KLAUS-PETER [DE], et al);
 [X]  - CIPRIANO A. ET AL., "Expert system for supervision of mineral flotation cells using artifical vision", INDUSTRIAL ELECTRONICS, 1997, ISIE'1997, PROCEEDINGS OF THE IEEE INTERNATIONAL SYMPOSIUM, (19970707), pages 149 - 153, XP002933419
 [X]  - GUARINI M. ET AL., "A sensor for assessing the quality of mineral flotation process", INDUSTRIAL ELECTRONICS, 1994, SYMPOSIUM PROCEEDINGS, ISIE'94, IEEE INTERNATIONAL SYMPOSIUM, (19940525), pages 386 - 391, XP002933420
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.