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Extract from the Register of European Patents

EP About this file: EP1203257

EP1203257 - SCANNING INTERFEROMETRIC NEAR-FIELD CONFOCAL MICROSCOPY [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  21.10.2005
Database last updated on 17.08.2024
Most recent event   Tooltip14.12.2007Lapse of the patent in a contracting state
New state(s): PT		published on 16.01.2008  [2008/03]
Applicant(s)For all designated states
Zetetic Institute
Suite 206, 1665 E. 18th Street
Tucson, AZ 85719 / US
[2002/19]
Inventor(s)01 / HILL, Henry, Allen
340 S. Avenida de Palmas
Tucson, AZ 85716 / US
 [2002/19]
Representative(s)Hoffmann Eitle
Patent- und Rechtsanwälte PartmbB
Arabellastrasse 30
81925 München / DE
[N/P]
Former [2002/19]HOFFMANN - EITLE
Patent- und Rechtsanwälte Arabellastrasse 4
81925 München / DE
Application number, filing date00953800.002.08.2000
[2002/19]
WO2000US21090
Priority number, dateUS19990147196P02.08.1999         Original published format: US 147196 P
US20000221200P27.07.2000         Original published format: US 221200 P
[2002/19]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO0109662
Date:08.02.2001
Language:EN
[2001/06]
Type: A2 Application without search report 
No.:EP1203257
Date:08.05.2002
Language:EN
The application published by WIPO in one of the EPO official languages on 08.02.2001 takes the place of the publication of the European patent application.
[2002/19]
Type: B1 Patent specification 
No.:EP1203257
Date:15.12.2004
Language:EN
[2004/51]
Search report(s)International search report - published on:EP02.08.2001
ClassificationIPC:G02B21/00, G11B7/12, G03F7/20, G01B9/04
[2002/19]
CPC:
G11B7/0045 (EP,US); G01Q60/22 (EP,US); G02B21/0056 (EP,US);
G02B21/0068 (EP,US); G11B11/10534 (EP,US); G11B11/10541 (EP,US);
G11B7/005 (EP,US); G11B7/12 (EP,US); G11B7/1356 (EP,US);
G11B7/1374 (EP,US); G11B7/1381 (EP,US); G11B7/1387 (EP,US);
G11B11/1058 (EP,US); G11B2007/13727 (EP,US) (-)
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE [2002/19]
Extension statesALNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
RONot yet paid
SINot yet paid
TitleGerman:INTERFEROMETRISCHE KONFOKALE NAHFELD-ABTASTMIKROSKOPIE[2002/19]
English:SCANNING INTERFEROMETRIC NEAR-FIELD CONFOCAL MICROSCOPY[2002/19]
French:MICROSCOPIE INTERFEROMETRIQUE CONFOCALE A BALAYAGE A CHAMP PROCHE[2002/19]
Entry into regional phase27.02.2002National basic fee paid 
27.02.2002Designation fee(s) paid 
27.02.2002Examination fee paid 
Examination procedure27.02.2001Request for preliminary examination filed
International Preliminary Examining Authority: EP
27.02.2002Examination requested  [2002/19]
11.06.2002Despatch of a communication from the examining division (Time limit: M06)
23.12.2002Reply to a communication from the examining division
25.02.2004Despatch of a communication from the examining division (Time limit: M04)
06.04.2004Reply to a communication from the examining division
24.06.2004Communication of intention to grant the patent
14.10.2004Fee for grant paid
14.10.2004Fee for publishing/printing paid
Opposition(s)16.09.2005No opposition filed within time limit [2005/49]
Fees paidRenewal fee
21.08.2002Renewal fee patent year 03
25.08.2003Renewal fee patent year 04
23.08.2004Renewal fee patent year 05
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT15.12.2004
BE15.12.2004
CH15.12.2004
FI15.12.2004
IT15.12.2004
LI15.12.2004
NL15.12.2004
DK15.03.2005
GR15.03.2005
SE15.03.2005
ES26.03.2005
PT15.05.2005
CY02.08.2005
IE02.08.2005
LU02.08.2005
MC31.08.2005
[2008/03]
Former [2007/35]AT15.12.2004
BE15.12.2004
CH15.12.2004
FI15.12.2004
IT15.12.2004
LI15.12.2004
NL15.12.2004
DK15.03.2005
GR15.03.2005
SE15.03.2005
ES26.03.2005
CY02.08.2005
IE02.08.2005
LU02.08.2005
MC31.08.2005
Former [2007/26]AT15.12.2004
BE15.12.2004
CH15.12.2004
FI15.12.2004
LI15.12.2004
NL15.12.2004
DK15.03.2005
GR15.03.2005
SE15.03.2005
ES26.03.2005
CY02.08.2005
IE02.08.2005
LU02.08.2005
MC31.08.2005
Former [2007/20]AT15.12.2004
BE15.12.2004
CH15.12.2004
FI15.12.2004
LI15.12.2004
NL15.12.2004
DK15.03.2005
GR15.03.2005
SE15.03.2005
ES26.03.2005
CY02.08.2005
IE02.08.2005
LU31.08.2005
MC31.08.2005
Former [2007/08]AT15.12.2004
BE15.12.2004
CH15.12.2004
FI15.12.2004
LI15.12.2004
NL15.12.2004
DK15.03.2005
GR15.03.2005
SE15.03.2005
ES26.03.2005
IE02.08.2005
LU31.08.2005
MC31.08.2005
Former [2006/40]AT15.12.2004
BE15.12.2004
CH15.12.2004
FI15.12.2004
LI15.12.2004
NL15.12.2004
DK15.03.2005
GR15.03.2005
ES26.03.2005
IE02.08.2005
MC31.08.2005
Former [2006/28]AT15.12.2004
BE15.12.2004
CH15.12.2004
FI15.12.2004
LI15.12.2004
NL15.12.2004
DK15.03.2005
GR15.03.2005
ES26.03.2005
MC31.08.2005
Former [2006/14]AT15.12.2004
BE15.12.2004
CH15.12.2004
FI15.12.2004
LI15.12.2004
NL15.12.2004
DK15.03.2005
GR15.03.2005
ES26.03.2005
Former [2006/12]AT15.12.2004
BE15.12.2004
CH15.12.2004
FI15.12.2004
LI15.12.2004
DK15.03.2005
GR15.03.2005
ES26.03.2005
Former [2005/51]AT15.12.2004
BE15.12.2004
CH15.12.2004
FI15.12.2004
LI15.12.2004
GR15.03.2005
Former [2005/36]AT15.12.2004
CH15.12.2004
FI15.12.2004
LI15.12.2004
GR15.03.2005
Former [2005/26]CH15.12.2004
FI15.12.2004
LI15.12.2004
GR15.03.2005
Former [2005/25]CH15.12.2004
FI15.12.2004
LI15.12.2004
Former [2005/24]FI15.12.2004
Cited inInternational search[Y]US4659429  (ISAACSON MICHAEL [US], et al) [Y] 1,51,96,99,102,103 * column 5, line 18 - line 43 * * column 10, line 41 - line 63 * * figures 4,6 *;
 [A]US5371588  (DAVIS CHRISTOPHER C [US], et al) [A] 1-103 * abstract *;
 [A]EP0757271  (IBM [US]) [A] 1-103 * column 8, line 35 - line 38; figure - *;
 [A]US5602820  (WICKRAMASINGHE HEMANTHA K [US], et al) [A] 1-103 * abstract *;
 [A]US5760901  (HILL HENRY A [US]) [A] 1-103 * column 10, line 13 - line 67 * * column 11, line 1 - line 56 * * figure - *;
 [Y]  - "PHASE CONTRAST AND AMPLITUDE PSEUDOHETERODYNE INTERFERENCE NEAR FIELD SCANNING OPTICAL MICROSCOPY", APPLIED PHYSICS LETTERS,US,AMERICAN INSTITUTE OF PHYSICS. NEW YORK, (19930308), vol. 62, no. 10, ISSN 0003-6951, pages 1044 - 1046, XP000345970 [Y] 1,51,96,99,102,103 * the whole document *

DOI:   http://dx.doi.org/10.1063/1.108789
 [A]  - PILEVAR S ET AL, "Reflection Near Field Scanning Optical Microscopy: An Interferometric Approach", ULTRAMICROSCOPY, AMSTERDAM, NL, (1995), vol. 61, pages 233 - 236, XP000978294 [A] 1-103 * the whole document *

DOI:   http://dx.doi.org/10.1016/0304-3991(95)00115-8
 [A]  - BAUER A ET AL, "Magnetic Domain Imaging with a Scanning Near-Field Optical Microscope using a Modified Sagnac Interferometer", JOURNAL OF MICROSCOPY., OXFORD, GB, (199905), vol. 194, ISSN 0022-2720, pages 507 - 511, XP000978165 [A] 1-103 * the whole document *

DOI:   http://dx.doi.org/10.1046/j.1365-2818.1999.00514.x
 [A]  - POHL D W ET AL, "NEAR-FIELD OPTICS: LIGHT FOR THE WORLD OF NANO", JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY: PART B,US,AMERICAN INSTITUTE OF PHYSICS. NEW YORK, (19940501), vol. 12, no. 3, ISSN 0734-211X, pages 1441 - 1446, XP000464719 [A] 1-103 * figure 1 *

DOI:   http://dx.doi.org/10.1116/1.587313
 [A]  - COURJON D ET AL, "New Optical Near Field Developments: Some Perspectives in Interferometry", ULTRAMICROSCOPY, AMSTERDAM, NL, (1995), vol. 61, pages 117 - 125, XP000978339 [A] 1-103 * the whole document *

DOI:   http://dx.doi.org/10.1016/0304-3991(95)00132-8
Examination   - CLINE J.A. ET AL, "RESOLUTION IN NEAR-FIELD OPTICAL IMAGING", PROCEEDINGS OF THE SPIE, LOS ANGELES, CA, USA, (19920120), vol. 1639, pages 2 - 11
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.