EP1203257 - SCANNING INTERFEROMETRIC NEAR-FIELD CONFOCAL MICROSCOPY [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 21.10.2005 Database last updated on 17.08.2024 | Most recent event Tooltip | 14.12.2007 | Lapse of the patent in a contracting state New state(s): PT | published on 16.01.2008 [2008/03] | Applicant(s) | For all designated states Zetetic Institute Suite 206, 1665 E. 18th Street Tucson, AZ 85719 / US | [2002/19] | Inventor(s) | 01 /
HILL, Henry, Allen 340 S. Avenida de Palmas Tucson, AZ 85716 / US | [2002/19] | Representative(s) | Hoffmann Eitle Patent- und Rechtsanwälte PartmbB Arabellastrasse 30 81925 München / DE | [N/P] |
Former [2002/19] | HOFFMANN - EITLE Patent- und Rechtsanwälte Arabellastrasse 4 81925 München / DE | Application number, filing date | 00953800.0 | 02.08.2000 | [2002/19] | WO2000US21090 | Priority number, date | US19990147196P | 02.08.1999 Original published format: US 147196 P | US20000221200P | 27.07.2000 Original published format: US 221200 P | [2002/19] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | WO0109662 | Date: | 08.02.2001 | Language: | EN | [2001/06] | Type: | A2 Application without search report | No.: | EP1203257 | Date: | 08.05.2002 | Language: | EN | The application published by WIPO in one of the EPO official languages on 08.02.2001 takes the place of the publication of the European patent application. | [2002/19] | Type: | B1 Patent specification | No.: | EP1203257 | Date: | 15.12.2004 | Language: | EN | [2004/51] | Search report(s) | International search report - published on: | EP | 02.08.2001 | Classification | IPC: | G02B21/00, G11B7/12, G03F7/20, G01B9/04 | [2002/19] | CPC: |
G11B7/0045 (EP,US);
G01Q60/22 (EP,US);
G02B21/0056 (EP,US);
G02B21/0068 (EP,US);
G11B11/10534 (EP,US);
G11B11/10541 (EP,US);
G11B7/005 (EP,US);
G11B7/12 (EP,US);
G11B7/1356 (EP,US);
G11B7/1374 (EP,US);
G11B7/1381 (EP,US);
G11B7/1387 (EP,US);
| Designated contracting states | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE [2002/19] | Extension states | AL | Not yet paid | LT | Not yet paid | LV | Not yet paid | MK | Not yet paid | RO | Not yet paid | SI | Not yet paid | Title | German: | INTERFEROMETRISCHE KONFOKALE NAHFELD-ABTASTMIKROSKOPIE | [2002/19] | English: | SCANNING INTERFEROMETRIC NEAR-FIELD CONFOCAL MICROSCOPY | [2002/19] | French: | MICROSCOPIE INTERFEROMETRIQUE CONFOCALE A BALAYAGE A CHAMP PROCHE | [2002/19] | Entry into regional phase | 27.02.2002 | National basic fee paid | 27.02.2002 | Designation fee(s) paid | 27.02.2002 | Examination fee paid | Examination procedure | 27.02.2001 | Request for preliminary examination filed International Preliminary Examining Authority: EP | 27.02.2002 | Examination requested [2002/19] | 11.06.2002 | Despatch of a communication from the examining division (Time limit: M06) | 23.12.2002 | Reply to a communication from the examining division | 25.02.2004 | Despatch of a communication from the examining division (Time limit: M04) | 06.04.2004 | Reply to a communication from the examining division | 24.06.2004 | Communication of intention to grant the patent | 14.10.2004 | Fee for grant paid | 14.10.2004 | Fee for publishing/printing paid | Opposition(s) | 16.09.2005 | No opposition filed within time limit [2005/49] | Fees paid | Renewal fee | 21.08.2002 | Renewal fee patent year 03 | 25.08.2003 | Renewal fee patent year 04 | 23.08.2004 | Renewal fee patent year 05 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | AT | 15.12.2004 | BE | 15.12.2004 | CH | 15.12.2004 | FI | 15.12.2004 | IT | 15.12.2004 | LI | 15.12.2004 | NL | 15.12.2004 | DK | 15.03.2005 | GR | 15.03.2005 | SE | 15.03.2005 | ES | 26.03.2005 | PT | 15.05.2005 | CY | 02.08.2005 | IE | 02.08.2005 | LU | 02.08.2005 | MC | 31.08.2005 | [2008/03] |
Former [2007/35] | AT | 15.12.2004 | |
BE | 15.12.2004 | ||
CH | 15.12.2004 | ||
FI | 15.12.2004 | ||
IT | 15.12.2004 | ||
LI | 15.12.2004 | ||
NL | 15.12.2004 | ||
DK | 15.03.2005 | ||
GR | 15.03.2005 | ||
SE | 15.03.2005 | ||
ES | 26.03.2005 | ||
CY | 02.08.2005 | ||
IE | 02.08.2005 | ||
LU | 02.08.2005 | ||
MC | 31.08.2005 | ||
Former [2007/26] | AT | 15.12.2004 | |
BE | 15.12.2004 | ||
CH | 15.12.2004 | ||
FI | 15.12.2004 | ||
LI | 15.12.2004 | ||
NL | 15.12.2004 | ||
DK | 15.03.2005 | ||
GR | 15.03.2005 | ||
SE | 15.03.2005 | ||
ES | 26.03.2005 | ||
CY | 02.08.2005 | ||
IE | 02.08.2005 | ||
LU | 02.08.2005 | ||
MC | 31.08.2005 | ||
Former [2007/20] | AT | 15.12.2004 | |
BE | 15.12.2004 | ||
CH | 15.12.2004 | ||
FI | 15.12.2004 | ||
LI | 15.12.2004 | ||
NL | 15.12.2004 | ||
DK | 15.03.2005 | ||
GR | 15.03.2005 | ||
SE | 15.03.2005 | ||
ES | 26.03.2005 | ||
CY | 02.08.2005 | ||
IE | 02.08.2005 | ||
LU | 31.08.2005 | ||
MC | 31.08.2005 | ||
Former [2007/08] | AT | 15.12.2004 | |
BE | 15.12.2004 | ||
CH | 15.12.2004 | ||
FI | 15.12.2004 | ||
LI | 15.12.2004 | ||
NL | 15.12.2004 | ||
DK | 15.03.2005 | ||
GR | 15.03.2005 | ||
SE | 15.03.2005 | ||
ES | 26.03.2005 | ||
IE | 02.08.2005 | ||
LU | 31.08.2005 | ||
MC | 31.08.2005 | ||
Former [2006/40] | AT | 15.12.2004 | |
BE | 15.12.2004 | ||
CH | 15.12.2004 | ||
FI | 15.12.2004 | ||
LI | 15.12.2004 | ||
NL | 15.12.2004 | ||
DK | 15.03.2005 | ||
GR | 15.03.2005 | ||
ES | 26.03.2005 | ||
IE | 02.08.2005 | ||
MC | 31.08.2005 | ||
Former [2006/28] | AT | 15.12.2004 | |
BE | 15.12.2004 | ||
CH | 15.12.2004 | ||
FI | 15.12.2004 | ||
LI | 15.12.2004 | ||
NL | 15.12.2004 | ||
DK | 15.03.2005 | ||
GR | 15.03.2005 | ||
ES | 26.03.2005 | ||
MC | 31.08.2005 | ||
Former [2006/14] | AT | 15.12.2004 | |
BE | 15.12.2004 | ||
CH | 15.12.2004 | ||
FI | 15.12.2004 | ||
LI | 15.12.2004 | ||
NL | 15.12.2004 | ||
DK | 15.03.2005 | ||
GR | 15.03.2005 | ||
ES | 26.03.2005 | ||
Former [2006/12] | AT | 15.12.2004 | |
BE | 15.12.2004 | ||
CH | 15.12.2004 | ||
FI | 15.12.2004 | ||
LI | 15.12.2004 | ||
DK | 15.03.2005 | ||
GR | 15.03.2005 | ||
ES | 26.03.2005 | ||
Former [2005/51] | AT | 15.12.2004 | |
BE | 15.12.2004 | ||
CH | 15.12.2004 | ||
FI | 15.12.2004 | ||
LI | 15.12.2004 | ||
GR | 15.03.2005 | ||
Former [2005/36] | AT | 15.12.2004 | |
CH | 15.12.2004 | ||
FI | 15.12.2004 | ||
LI | 15.12.2004 | ||
GR | 15.03.2005 | ||
Former [2005/26] | CH | 15.12.2004 | |
FI | 15.12.2004 | ||
LI | 15.12.2004 | ||
GR | 15.03.2005 | ||
Former [2005/25] | CH | 15.12.2004 | |
FI | 15.12.2004 | ||
LI | 15.12.2004 | ||
Former [2005/24] | FI | 15.12.2004 | Cited in | International search | [Y]US4659429 (ISAACSON MICHAEL [US], et al) [Y] 1,51,96,99,102,103 * column 5, line 18 - line 43 * * column 10, line 41 - line 63 * * figures 4,6 *; | [A]US5371588 (DAVIS CHRISTOPHER C [US], et al) [A] 1-103 * abstract *; | [A]EP0757271 (IBM [US]) [A] 1-103 * column 8, line 35 - line 38; figure - *; | [A]US5602820 (WICKRAMASINGHE HEMANTHA K [US], et al) [A] 1-103 * abstract *; | [A]US5760901 (HILL HENRY A [US]) [A] 1-103 * column 10, line 13 - line 67 * * column 11, line 1 - line 56 * * figure - *; | [Y] - "PHASE CONTRAST AND AMPLITUDE PSEUDOHETERODYNE INTERFERENCE NEAR FIELD SCANNING OPTICAL MICROSCOPY", APPLIED PHYSICS LETTERS,US,AMERICAN INSTITUTE OF PHYSICS. NEW YORK, (19930308), vol. 62, no. 10, ISSN 0003-6951, pages 1044 - 1046, XP000345970 [Y] 1,51,96,99,102,103 * the whole document * DOI: http://dx.doi.org/10.1063/1.108789 | [A] - PILEVAR S ET AL, "Reflection Near Field Scanning Optical Microscopy: An Interferometric Approach", ULTRAMICROSCOPY, AMSTERDAM, NL, (1995), vol. 61, pages 233 - 236, XP000978294 [A] 1-103 * the whole document * DOI: http://dx.doi.org/10.1016/0304-3991(95)00115-8 | [A] - BAUER A ET AL, "Magnetic Domain Imaging with a Scanning Near-Field Optical Microscope using a Modified Sagnac Interferometer", JOURNAL OF MICROSCOPY., OXFORD, GB, (199905), vol. 194, ISSN 0022-2720, pages 507 - 511, XP000978165 [A] 1-103 * the whole document * DOI: http://dx.doi.org/10.1046/j.1365-2818.1999.00514.x | [A] - POHL D W ET AL, "NEAR-FIELD OPTICS: LIGHT FOR THE WORLD OF NANO", JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY: PART B,US,AMERICAN INSTITUTE OF PHYSICS. NEW YORK, (19940501), vol. 12, no. 3, ISSN 0734-211X, pages 1441 - 1446, XP000464719 [A] 1-103 * figure 1 * DOI: http://dx.doi.org/10.1116/1.587313 | [A] - COURJON D ET AL, "New Optical Near Field Developments: Some Perspectives in Interferometry", ULTRAMICROSCOPY, AMSTERDAM, NL, (1995), vol. 61, pages 117 - 125, XP000978339 [A] 1-103 * the whole document * DOI: http://dx.doi.org/10.1016/0304-3991(95)00132-8 | Examination | - CLINE J.A. ET AL, "RESOLUTION IN NEAR-FIELD OPTICAL IMAGING", PROCEEDINGS OF THE SPIE, LOS ANGELES, CA, USA, (19920120), vol. 1639, pages 2 - 11 |