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Extract from the Register of European Patents

EP About this file: EP1248302

EP1248302 - HORIZONTAL JUNCTION FIELD-EFFECT TRANSISTOR [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  02.08.2013
Database last updated on 02.09.2024
Most recent event   Tooltip25.10.2013Lapse of the patent in a contracting statepublished on 27.11.2013  [2013/48]
Applicant(s)For all designated states
Sumitomo Electric Industries, Ltd.
5-33, Kitahama 4-chome Chuo-ku Osaka-shi
Osaka 541-0041 / JP
[2012/39]
Former [2002/41]For all designated states
Sumitomo Electric Industries, Ltd.
5-33, Kitahama 4-chome Chuo-ku
Osaka-shi, Osaka 541-0041 / JP
Inventor(s)01 / HARADA, Shin
Osaka Works of Sumitomo Electric Industries. Ltd.
1-3, Shimaya 1-chome
Konohana-ku
Osaka-shi, Osaka 554-8511 / JP
02 / HIROTSU, Kenichi
Osaka Works of Sumitomo Electric Industries. Ltd.
1-3, Shimaya 1-chome
Konohana-ku
Osaka-shi, Osaka 554-8511 / JP
 [2012/47]
Former [2012/39]01 / HARADA, Shin, Osaka Works of Sumitomo Elec.
Ind. Ltd.
1-3, Shimaya 1-chome
Konohana-ku
Osaka-shi, Osaka 554-8511 / JP
02 / HIROTSU, Kenichi, Osaka Works of Sumitomo Elec.
Ind., Ltd.
1-3, Shimaya 1-chome
Konohana-ku
Osaka-shi, Osaka 554-8511 / JP
Former [2002/41]01 / HARADA, Shin, Osaka Works of Sumitomo Elec.
Ind. Ltd., 1-3, Shimaya 1-chome, Konohana-ku
Osaka-shi, Osaka 554-8511 / JP
02 / HIROTSU, Kenichi, Osaka Works of Sumitomo Elec.
Ind., Ltd., 1-3, Shimaya 1-chome, Konohana-ku
Osaka-shi, Osaka 554-8511 / JP
Representative(s)Grünecker Patent- und Rechtsanwälte PartG mbB
Leopoldstraße 4
80802 München / DE
[N/P]
Former [2012/39]Grünecker, Kinkeldey, Stockmair & Schwanhäusser
Leopoldstrasse 4
80802 München / DE
Former [2002/41]Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
Maximilianstrasse 58
80538 München / DE
Application number, filing date00979959.406.12.2000
[2002/41]
WO2000JP08645
Priority number, dateJP1999036238421.12.1999         Original published format: JP 36238499
JP1999036238521.12.1999         Original published format: JP 36238599
JP1999036238621.12.1999         Original published format: JP 36238699
JP2000012988028.04.2000         Original published format: JP 2000129880
JP2000016570102.06.2000         Original published format: JP 2000165701
JP2000019446428.06.2000         Original published format: JP 2000194464
JP2000028652021.09.2000         Original published format: JP 2000286520
[2002/41]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO0147029
Date:28.06.2001
Language:EN
[2001/26]
Type: A1 Application with search report 
No.:EP1248302
Date:09.10.2002
Language:EN
The application published by WIPO in one of the EPO official languages on 28.06.2001 takes the place of the publication of the European patent application.
[2002/41]
Type: B1 Patent specification 
No.:EP1248302
Date:26.09.2012
Language:EN
[2012/39]
Search report(s)International search report - published on:JP28.06.2001
(Supplementary) European search report - dispatched on:EP03.08.2007
ClassificationIPC:H01L29/80, H01L21/338
[2002/41]
CPC:
H01L29/7722 (EP,US); H01L21/18 (KR); H01L29/808 (EP,US);
H01L29/8083 (EP,US); H01L29/1608 (EP,US)
Designated contracting statesCH,   DE,   FR,   GB,   LI,   SE [2004/22]
Former [2002/41]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:FELDEFFEKTTRANSISTOR MIT HORIZONTALEM ÜBERGANG[2002/41]
English:HORIZONTAL JUNCTION FIELD-EFFECT TRANSISTOR[2002/41]
French:TRANSISTOR A EFFET DE CHAMP ET A JONCTION HORIZONTALE[2002/41]
Entry into regional phase26.06.2002Translation filed 
26.06.2002National basic fee paid 
26.06.2002Search fee paid 
26.06.2002Designation fee(s) paid 
26.06.2002Examination fee paid 
Examination procedure10.05.2001Request for preliminary examination filed
International Preliminary Examining Authority: JP
26.06.2002Examination requested  [2002/41]
10.10.2007Despatch of a communication from the examining division (Time limit: M06)
27.02.2008Reply to a communication from the examining division
11.02.2009Despatch of a communication from the examining division (Time limit: M06)
31.07.2009Reply to a communication from the examining division
22.11.2011Cancellation of oral proceeding that was planned for 01.12.2011
28.11.2011Despatch of a communication from the examining division (Time limit: M04)
01.12.2011Date of oral proceedings (cancelled)
13.03.2012Reply to a communication from the examining division
15.05.2012Communication of intention to grant the patent
14.08.2012Fee for grant paid
14.08.2012Fee for publishing/printing paid
Divisional application(s)EP12185971.4   Application deemed to be withdrawn  : 25.09.2012
EP12185972.2   Application deemed to be withdrawn  : 25.09.2012
The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  10.10.2007
Opposition(s)27.06.2013No opposition filed within time limit [2013/36]
Fees paidRenewal fee
27.12.2002Renewal fee patent year 03
23.12.2003Renewal fee patent year 04
23.12.2004Renewal fee patent year 05
28.12.2005Renewal fee patent year 06
29.12.2006Renewal fee patent year 07
28.12.2007Renewal fee patent year 08
23.12.2008Renewal fee patent year 09
29.12.2009Renewal fee patent year 10
29.12.2010Renewal fee patent year 11
29.12.2011Renewal fee patent year 12
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipCH31.12.2012
LI31.12.2012
[2013/48]
Documents cited:Search[DY]US5264713  (PALMOUR JOHN W [US]) [DY] 4 * the whole document *;
 [XY]  - DMITRIEV V A ET AL, "High-temperature SiC-6H field-effect transistor with p-n gate", SOVIET TECHNICAL PHYSICS LETTERS USA, (198802), vol. 14, no. 2, ISSN 0360-120X, pages 127 - 128, XP008078458 [X] 1,3,12-15 * the whole document * [Y] 4,5
 [Y]  - DMITRIEV V A ET AL, "NORMALLY CLOSED SIC (6H) FIELD EFFECT TRANSISTOR WITH A P-N GATE", SOVIET TECHNICAL PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, (19910201), vol. 17, no. 2, pages 115 - 116, XP000235384 [Y] 5 * the whole document *
International search[Y]JPS6453476  (NIPPON TELEGRAPH & TELEPHONE);
 [Y]JPH01103878  (NEC CORP);
 [Y]  - MC GARRITY,J.M. ET AL, "Silicon Carbide JFET Radiation Response", IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (199212), vol. 39, no. 6, pages 1974 - 1981, XP002937497

DOI:   http://dx.doi.org/10.1109/23.211393
 [Y]  - TRANSACTIONS OF THE INSTITUTE OF ELECTRONICS, INFORMATION AND COMMUNICATION ENGINEERS, (1998), vol. J81-C-II, no. 1, pages 105 - 111, XP002937498
 [Y]  - DEV ALOK AND B.J. BALIGA, "High voltage (450V) 6H-SiC substrate gate JFET (SG-JFET)", SILICON CARBIDE AND RELATED MATERIALS, (1995), no. 142, pages 749 - 752, XP002937499
 [A]  - C.T. GARDNER ET AL, "Dynamic charge storage in 6H sillicon carbide", APPLIED PHYSICS LETTERS, (199209), vol. 61, no. 10, pages 1185 - 1186, XP002937500

DOI:   http://dx.doi.org/10.1063/1.107641
by applicantUS5264713
    - DMITRIEV V A ET AL., "High-temperature SiC-6H field-effect transistor with p-n gate", SOVIET TECHNICAL PHYSICS LETTERS USA, (198802), vol. 14, no. 2, pages 127 - 128
    - "NORMALLY CLOSED SiC (6H) FIELD EFFECT TRANSISTOR WITH A P-N GATE", DMITRIEV V A ET AL., SOVIET TECHNICAL PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS, (19910201), vol. 17, pages 115 - 116
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.