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Extract from the Register of European Patents

EP About this file: EP1223451

EP1223451 - Interference microscope and method for operating an interference microscope [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  20.06.2008
Database last updated on 02.09.2024
Most recent event   Tooltip20.06.2008No opposition filed within time limitpublished on 23.07.2008  [2008/30]
Applicant(s)For all designated states
Leica Microsystems CMS GmbH
CPTD
Ernst-Leitz-Strasse 17-37
35578 Wetzlar / DE
[N/P]
Former [2006/20]For all designated states
Leica Microsystems CMS GmbH
Ernst-Leitz-Strasse 17-37
35578 Wetzlar / DE
Former [2002/29]For all designated states
Leica Microsystems Heidelberg GmbH
Am Friedensplatz 3
68165 Mannheim / DE
Inventor(s)01 / BEWERSDORF, Jörg
Mühltalstrasse 90
69121, Heidelberg / DE
02 / GUGEL, Hilmar
Konrad-Adenauer-Strasse 23b
69221, Dossenheim / DE
 [2002/29]
Representative(s)Reichert, Werner Franz
Leica Microsystems GmbH
Corporate Patents and Trademarks
Ernst-Leitz-Strasse 17-37
35578 Wetzlar / DE
[N/P]
Former [2002/29]Reichert, Werner F., Dr.
Leica Microsystems AG, Corporate Patents + Trademarks Department, Ernst-Leitz-Strasse 17-37
35578 Wetzlar / DE
Application number, filing date01000738.311.12.2001
[2002/29]
Priority number, dateDE200110024705.01.2001         Original published format: DE 10100247
[2002/29]
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1223451
Date:17.07.2002
Language:EN
[2002/29]
Type: A3 Search report 
No.:EP1223451
Date:03.11.2004
[2004/45]
Type: B1 Patent specification 
No.:EP1223451
Date:15.08.2007
Language:EN
[2007/33]
Search report(s)(Supplementary) European search report - dispatched on:EP16.09.2004
ClassificationIPC:G02B21/06, G02B21/00
[2002/29]
CPC:
G02B21/082 (EP,US); G02B21/06 (EP,US); G02B21/18 (EP,US);
G02B21/34 (EP,US)
Designated contracting statesDE,   FR,   GB [2005/29]
Former [2002/29]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Interferenzmikroskop und Verfahren zum Betreiben eines Interferenzmikroskops[2002/29]
English:Interference microscope and method for operating an interference microscope[2002/29]
French:Microscope à interférence et procédé de fonctionnement d'un microscope à interférence[2002/29]
Examination procedure05.04.2005Examination requested  [2005/22]
06.05.2005Despatch of a communication from the examining division (Time limit: M06)
06.09.2005Reply to a communication from the examining division
06.02.2006Despatch of a communication from the examining division (Time limit: M06)
27.06.2006Reply to a communication from the examining division
09.03.2007Communication of intention to grant the patent
04.07.2007Fee for grant paid
04.07.2007Fee for publishing/printing paid
Opposition(s)16.05.2008No opposition filed within time limit [2008/30]
Fees paidRenewal fee
27.11.2003Renewal fee patent year 03
07.12.2004Renewal fee patent year 04
13.12.2005Renewal fee patent year 05
12.12.2006Renewal fee patent year 06
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]JP2000221105  ;
 [Y]US4302678  (SCHIFFERT PHILLIP W) [Y] 5,6* column 2, line 44 - column 3, line 8; figure 2 *;
 [Y]US4998284  (BACUS JAMES W [US], et al) [Y] 5,6 * column 10, line 27 - line 40 * * column 11, line 36 - line 62 *;
 [Y]GB2273994  (MORPHOMETRIX INC [CA]) [Y] 1-4,7-18 * abstract * * page 8, line 1 - page 11, line 26 *;
 [YD]US5671085  (GUSTAFSSON MATS G L [US], et al) [YD] 1-18 * figures 1-6 * * column 8, line 32 - column 11, line 35 *
 [X]  - PATENT ABSTRACTS OF JAPAN, (20010103), vol. 2000, no. 11, & JP2000221105 A 20000811 (FUJIKURA LTD) [X] 1,3,4,7,11,13 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.