EP1223451 - Interference microscope and method for operating an interference microscope [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 20.06.2008 Database last updated on 02.09.2024 | Most recent event Tooltip | 20.06.2008 | No opposition filed within time limit | published on 23.07.2008 [2008/30] | Applicant(s) | For all designated states Leica Microsystems CMS GmbH CPTD Ernst-Leitz-Strasse 17-37 35578 Wetzlar / DE | [N/P] |
Former [2006/20] | For all designated states Leica Microsystems CMS GmbH Ernst-Leitz-Strasse 17-37 35578 Wetzlar / DE | ||
Former [2002/29] | For all designated states Leica Microsystems Heidelberg GmbH Am Friedensplatz 3 68165 Mannheim / DE | Inventor(s) | 01 /
BEWERSDORF, Jörg Mühltalstrasse 90 69121, Heidelberg / DE | 02 /
GUGEL, Hilmar Konrad-Adenauer-Strasse 23b 69221, Dossenheim / DE | [2002/29] | Representative(s) | Reichert, Werner Franz Leica Microsystems GmbH Corporate Patents and Trademarks Ernst-Leitz-Strasse 17-37 35578 Wetzlar / DE | [N/P] |
Former [2002/29] | Reichert, Werner F., Dr. Leica Microsystems AG, Corporate Patents + Trademarks Department, Ernst-Leitz-Strasse 17-37 35578 Wetzlar / DE | Application number, filing date | 01000738.3 | 11.12.2001 | [2002/29] | Priority number, date | DE2001100247 | 05.01.2001 Original published format: DE 10100247 | [2002/29] | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1223451 | Date: | 17.07.2002 | Language: | EN | [2002/29] | Type: | A3 Search report | No.: | EP1223451 | Date: | 03.11.2004 | [2004/45] | Type: | B1 Patent specification | No.: | EP1223451 | Date: | 15.08.2007 | Language: | EN | [2007/33] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 16.09.2004 | Classification | IPC: | G02B21/06, G02B21/00 | [2002/29] | CPC: |
G02B21/082 (EP,US);
G02B21/06 (EP,US);
G02B21/18 (EP,US);
G02B21/34 (EP,US)
| Designated contracting states | DE, FR, GB [2005/29] |
Former [2002/29] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR | Title | German: | Interferenzmikroskop und Verfahren zum Betreiben eines Interferenzmikroskops | [2002/29] | English: | Interference microscope and method for operating an interference microscope | [2002/29] | French: | Microscope à interférence et procédé de fonctionnement d'un microscope à interférence | [2002/29] | Examination procedure | 05.04.2005 | Examination requested [2005/22] | 06.05.2005 | Despatch of a communication from the examining division (Time limit: M06) | 06.09.2005 | Reply to a communication from the examining division | 06.02.2006 | Despatch of a communication from the examining division (Time limit: M06) | 27.06.2006 | Reply to a communication from the examining division | 09.03.2007 | Communication of intention to grant the patent | 04.07.2007 | Fee for grant paid | 04.07.2007 | Fee for publishing/printing paid | Opposition(s) | 16.05.2008 | No opposition filed within time limit [2008/30] | Fees paid | Renewal fee | 27.11.2003 | Renewal fee patent year 03 | 07.12.2004 | Renewal fee patent year 04 | 13.12.2005 | Renewal fee patent year 05 | 12.12.2006 | Renewal fee patent year 06 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]JP2000221105 ; | [Y]US4302678 (SCHIFFERT PHILLIP W) [Y] 5,6* column 2, line 44 - column 3, line 8; figure 2 *; | [Y]US4998284 (BACUS JAMES W [US], et al) [Y] 5,6 * column 10, line 27 - line 40 * * column 11, line 36 - line 62 *; | [Y]GB2273994 (MORPHOMETRIX INC [CA]) [Y] 1-4,7-18 * abstract * * page 8, line 1 - page 11, line 26 *; | [YD]US5671085 (GUSTAFSSON MATS G L [US], et al) [YD] 1-18 * figures 1-6 * * column 8, line 32 - column 11, line 35 * | [X] - PATENT ABSTRACTS OF JAPAN, (20010103), vol. 2000, no. 11, & JP2000221105 A 20000811 (FUJIKURA LTD) [X] 1,3,4,7,11,13 * abstract * |