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Extract from the Register of European Patents

EP About this file: EP1158524

EP1158524 - Semiconductor memory device having a boosted voltage generating circuit [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  03.07.2009
Database last updated on 03.06.2024
Most recent event   Tooltip03.07.2009Withdrawal of applicationpublished on 05.08.2009  [2009/32]
Applicant(s)For all designated states
Kabushiki Kaisha Toshiba
72, Horikawa-cho, Saiwai-ku Kawasaki-shi
Kanagawa-ken 210-8572 / JP
[N/P]
Former [2001/48]For all designated states
KABUSHIKI KAISHA TOSHIBA
72, Horikawa-cho, Saiwai-ku
Kawasaki-shi, Kanagawa-ken 210-8572 / JP
Inventor(s)01 / Tanzawa, Toru, Intellectual Property Division
Kabushiki Kaisha Toshiba, 1-1 Shibaura 1-chome
Minato-ku, Tokyo 105-8001 / JP
02 / Miyaba, Takeshi, Intellectual Property Division
Kabushiki Kaisha Toshiba, 1-1 Shibaura 1-chome
Minato-ku, Tokyo 105-8001 / JP
03 / Atsumi, Shigeru, Intellectual Property Division
Kabushiki Kaisha Toshiba, 1-1 Shibaura 1-chome
Minato-ku, Tokyo 105-8001 / JP
 [2001/48]
Representative(s)Hoffmann Eitle
Patent- und Rechtsanwälte PartmbB
Arabellastrasse 30
81925 München / DE
[N/P]
Former [2001/48]HOFFMANN - EITLE
Patent- und Rechtsanwälte Arabellastrasse 4
81925 München / DE
Application number, filing date01112062.325.05.2001
[2001/48]
Priority number, dateJP2000015498325.05.2000         Original published format: JP 2000154983
[2001/48]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1158524
Date:28.11.2001
Language:EN
[2001/48]
Search report(s)(Supplementary) European search report - dispatched on:EP06.09.2001
ClassificationIPC:G11C5/14, G11C16/12
[2001/48]
CPC:
G11C5/145 (EP,US); G11C16/12 (EP,US); G11C16/30 (EP,US);
G11C5/14 (EP,US); G11C5/147 (EP,US)
Designated contracting statesDE,   FR,   GB [2002/33]
Former [2001/48]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Halbleiterspeicher mit Spannungserhöhungsschaltung[2001/48]
English:Semiconductor memory device having a boosted voltage generating circuit[2001/48]
French:Mémoire a semiconducteur avec circuit élévateur de tension[2001/48]
Examination procedure25.05.2001Examination requested  [2001/48]
30.06.2009Application withdrawn by applicant  [2009/32]
Fees paidRenewal fee
13.05.2003Renewal fee patent year 03
13.05.2004Renewal fee patent year 04
12.05.2005Renewal fee patent year 05
23.03.2006Renewal fee patent year 06
14.05.2007Renewal fee patent year 07
28.03.2008Renewal fee patent year 08
12.05.2009Renewal fee patent year 09
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Documents cited:Search[A]US5483486  (JAVANIFARD JAHANSHIR J [US], et al) [A] 1* column 18, line 7 - column 19, line 29; figures 13A,13 *;
 [A]US6041012  (BANBA HIRONORI [JP], et al) [A] 1,10 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.