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Extract from the Register of European Patents

EP About this file: EP1182273

EP1182273 - Gas chemistry cycling to achieve high aspect ratio gapfill with hdp-cvd [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  16.10.2009
Database last updated on 10.07.2024
Most recent event   Tooltip03.12.2010Lapse of the patent in a contracting state
New state(s): GB
published on 05.01.2011  [2011/01]
Applicant(s)For all designated states
Applied Materials, Inc.
3050 Bowers Avenue
Santa Clara, CA 95054 / US
[N/P]
Former [2008/50]For all designated states
APPLIED MATERIALS, INC.
3050 Bowers Avenue
Santa Clara, California 95054 / US
Former [2002/09]For all designated states
Applied Materials, Inc.
3050 Bowers Avenue
Santa Clara, California 95054 / US
Inventor(s)01 / Kwan, Michael Chiu
307 Tadley Court
Redwood City, CA 94061 / US
02 / Liu, Eric
665 Roble Avenue Apartment B
Menlo Park, CA 94025 / US
 [2002/09]
Representative(s)Kirschner, Klaus Dieter, et al
Puschmann Borchert Bardehle
Patentanwälte Partnerschaft
Postfach 10 12 31
80086 München / DE
[N/P]
Former [2008/28]Kirschner, Klaus Dieter, et al
Puschmann & Borchert Patentanwälte Bajuwarenring 21
82041 Oberhaching / DE
Former [2006/40]Kirschner, Klaus Dieter, et al
Kirschner Patentanwaltskanzlei Südliche Münchnerstrasse 53
82031 Grünwald / DE
Former [2002/09]Kirschner, Klaus Dieter, Dipl.-Phys.
Schneiders & Behrendt Rechtsanwälte - Patentanwälte Sollner Strasse 38
81479 München / DE
Application number, filing date01119361.210.08.2001
[2002/09]
Priority number, dateUS2000064839524.08.2000         Original published format: US 648395
[2002/09]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1182273
Date:27.02.2002
Language:EN
[2002/09]
Type: A3 Search report 
No.:EP1182273
Date:07.01.2004
[2004/02]
Type: B1 Patent specification 
No.:EP1182273
Date:10.12.2008
Language:EN
[2008/50]
Search report(s)(Supplementary) European search report - dispatched on:EP26.11.2003
ClassificationIPC:C23C16/04, C23C16/40, C23C16/517, C23C16/52, H01J37/32, H01L21/316, C23C16/44, H01L21/768
[2004/02]
CPC:
C23C16/45523 (EP,KR,US); C23C16/045 (EP,US); C23C16/4405 (EP,KR,US);
C23C16/463 (EP,US); C23C16/517 (EP,KR,US); C23C16/52 (EP,KR,US);
H01J37/321 (EP,US); H01J37/3244 (EP,US); H01L21/02164 (EP,US);
H01L21/02274 (EP,KR,US); H01L21/30655 (EP,US); H01L21/31608 (US);
H01L21/31629 (US); H01J2237/3327 (EP,US); H01J2237/3347 (EP,US);
H01L21/02131 (EP); Y10S438/911 (EP,US) (-)
Former IPC [2002/09]C23C16/04, C23C16/40, C23C16/517, C23C16/52, H01J37/32, H01L21/316, C23C16/44
Designated contracting statesBE,   DE,   GB,   NL [2004/40]
Former [2002/09]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Zyklen der Gaszusammensetzung bei HDP-CVD zur Erhaltung der Lückenfüllung mit hohem Aspektverhältnis[2002/09]
English:Gas chemistry cycling to achieve high aspect ratio gapfill with hdp-cvd[2002/09]
French:Cyclage de la composition gazeuse d'un procédé HDP-CVD pour obtenir le remplissage de trou à rapport de forme élevé[2002/09]
Examination procedure06.07.2004Examination requested  [2004/37]
24.07.2008Communication of intention to grant the patent
23.10.2008Fee for grant paid
23.10.2008Fee for publishing/printing paid
Opposition(s)11.09.2009No opposition filed within time limit [2009/47]
Fees paidRenewal fee
06.08.2003Renewal fee patent year 03
06.08.2004Renewal fee patent year 04
08.08.2005Renewal fee patent year 05
07.08.2006Renewal fee patent year 06
03.08.2007Renewal fee patent year 07
08.08.2008Renewal fee patent year 08
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See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipBE10.12.2008
NL10.12.2008
GB10.08.2009
[2011/01]
Former [2009/32]BE10.12.2008
NL10.12.2008
Former [2009/26]NL10.12.2008
Documents cited:Search[X]JPH10340900  ;
 [XY]EP0549994  (TEXAS INSTRUMENTS INC [US]) [X] 1 * page 4 * [Y] 8-10;
 [X]GB2320133  (UNITED MICROELECTRONICS CORP [TW]) [X] 1,13 * abstract *;
 [YA]US5776834  (AVANZINO STEVEN [US], et al) [Y] 8-10 * the whole document * [A] 1-13;
 [A]US5908672  (RYU CHOON KUN [US], et al) [A] 1-13* the whole document *;
 [A]US6037018  (JANG SYUN-MING [TW], et al) [A] 1-13 * the whole document *;
 [X]US6093654  (KOYAMA KAZUHIDE [JP]) [X] 1 * claim 1 *;
 [PX]US6268274  (WANG YING-LANG [TW], et al) [PX] 1,2,4,11,12 * the whole document * * claim 3 *;
 [E]US2001030351  (WANG YING-LANG [TW], et al) [E] 1,2,4,11,12 * the whole document *
 [X]  - PATENT ABSTRACTS OF JAPAN, (19990331), vol. 1999, no. 03, & JP10340900 A 19981222 (APPLIED MATERIALS INC) [X] 14,15 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.