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EP1220292
European procedure
Extract from the Register of European Patents
EP About this file: EP1220292
| EP1220292 - Monochromator for charged particles [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 20.02.2009 Database last updated on 03.08.2024 | Most recent event Tooltip | 20.02.2009 | No opposition filed within time limit | published on 25.03.2009 [2009/13] | Applicant(s) | For all designated states Carl Zeiss NTS GmbH Carl-Zeiss-Strasse 56 73447 Oberkochen / DE | [2007/42] |
| Former [2002/27] | For all designated states LEO Elektronenmikroskopie GmbH 73446 Oberkochen / DE | Inventor(s) | 01 /
Plies, Erich Stäudach 66/1 72074 Tübingen / DE | 02 /
Huber, Armin Hindenburgstrasse 33 72762 Reutlingen / DE | 03 /
Bärtle, Jan Frondsbergstrasse 29 72070 Tübingen / DE | [2002/27] | Representative(s) | Gnatzig, Klaus, et al Carl Zeiss Patentabteilung 73446 Oberkochen / DE | [N/P] |
| Former [2002/27] | Gnatzig, Klaus, et al Carl Zeiss Patentabteilung 73446 Oberkochen / DE | Application number, filing date | 01126990.9 | 14.11.2001 | [2002/27] | Priority number, date | DE2000161798 | 12.12.2000 Original published format: DE 10061798 | [2002/27] | Filing language | DE | Procedural language | DE | Publication | Type: | A2 Application without search report | No.: | EP1220292 | Date: | 03.07.2002 | Language: | DE | [2002/27] | Type: | A3 Search report | No.: | EP1220292 | Date: | 16.03.2005 | [2005/11] | Type: | B1 Patent specification | No.: | EP1220292 | Date: | 16.04.2008 | Language: | DE | [2008/16] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 01.02.2005 | Classification | IPC: | H01J49/46, H01J49/28, H01J37/05 | [2005/11] | CPC: |
H01J49/288 (EP,US);
H01J37/05 (EP);
H01J2237/1534 (EP)
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| Former IPC [2002/27] | H01J49/46 | Designated contracting states | DE, GB, NL [2005/49] |
| Former [2002/27] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR | Title | German: | Monochromator für geladene Teilchen | [2002/27] | English: | Monochromator for charged particles | [2002/27] | French: | Monochromateur pour particules chargées | [2002/27] | Examination procedure | 27.07.2005 | Examination requested [2005/38] | 02.03.2007 | Despatch of a communication from the examining division (Time limit: M04) | 20.07.2007 | Reply to a communication from the examining division | 15.11.2007 | Communication of intention to grant the patent | 20.02.2008 | Fee for grant paid | 20.02.2008 | Fee for publishing/printing paid | Opposition(s) | 19.01.2009 | No opposition filed within time limit [2009/13] | Request for further processing for: | 20.07.2007 | Request for further processing filed | 20.07.2007 | Full payment received (date of receipt of payment) Request granted | 30.07.2007 | Decision despatched | Fees paid | Renewal fee | 28.10.2003 | Renewal fee patent year 03 | 05.11.2004 | Renewal fee patent year 04 | 14.11.2005 | Renewal fee patent year 05 | 13.11.2006 | Renewal fee patent year 06 | 16.11.2007 | Renewal fee patent year 07 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]WO9946797 (ESSERS ERIK [DE]) [A] 1* page 24, line 11; claim 1 *; | [AD] - J. ANDERSON ET AL., "a double wienfilter as a high resolution ,high transmission electron energy analyser", JOURNAL OF PHYSICS E SCIENTIFIC INSTRUMENTS, (1970), no. 3, pages 121 - 126, XP008041578 [AD] * the whole document * DOI: http://dx.doi.org/10.1088/0022-3735/3/2/309 | [PAD] - M.TERAUCHI ET AL., "high energy-resolution electron energy-loss spectroscopy based on electron microscopy", INSTITUTE OF PHYSICS CONFERENCES SYMPOSIUM 6, (2000), no. 165, pages 217 - 218, XP008041579 [PAD] 1 * the whole document * | [PAD] - M.TANAKA ET AL., "an 0.2eV energy resolution analytical electron microscope", INSTITUTE OF PHYSICS CONFERENCES SYMPOSIUM 6, (2000), no. 165, pages 211 - 212, XP001202692 [PAD] 1 * the whole document * | [A] - X ET AL, "Aberration analysis of Wien filters and design of an electron energy-selective imaging system", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, SECTION - A: ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, NORTH-HOLLAND PUBLISHING COMPANY. AMSTERDAM, NL, (1995), vol. A363, no. 1, ISSN 0168-9002, pages 254 - 260, XP004009654 [A] 1 * pages 257-260 * DOI: http://dx.doi.org/10.1016/0168-9002(95)00262-6 |