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EP1314972
European procedure
Extract from the Register of European Patents
EP About this file: EP1314972
| EP1314972 - Spectrophotometer and its use [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 20.05.2011 Database last updated on 15.08.2024 | Most recent event Tooltip | 21.10.2011 | Lapse of the patent in a contracting state New state(s): FR | published on 23.11.2011 [2011/47] | Applicant(s) | For all designated states X-Rite Europe GmbH Althardstrasse 70 8105 Regensdorf / CH | [2009/51] |
| Former [2003/22] | For all designated states Gretag-MacBeth AG Althardstrasse 70 8105 Regensdorf / CH | Inventor(s) | 01 /
Ehbets, Peter Schwandenholzstrasse 286 8046 Zürich / CH | [2003/22] | Representative(s) | SSM Sandmair Patentanwälte Rechtsanwalt Partnerschaft mbB Joseph-Wild-Straße 20 81829 München / DE | [N/P] |
| Former [2003/22] | Schwabe - Sandmair - Marx Stuntzstrasse 16 81677 München / DE | Application number, filing date | 01127427.1 | 26.11.2001 | [2003/22] | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | EP1314972 | Date: | 28.05.2003 | Language: | DE | [2003/22] | Type: | B1 Patent specification | No.: | EP1314972 | Date: | 14.07.2010 | Language: | DE | [2010/28] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 29.04.2002 | Classification | IPC: | G01N21/25 | [2003/22] | CPC: |
G01J3/50 (EP,US);
G01J3/02 (EP,US);
G01J3/0208 (EP,US);
G01J3/021 (EP,US);
G01J3/024 (EP,US);
G01J3/0256 (EP,US);
G01J3/0272 (EP,US);
G01J3/0278 (EP,US);
G01J3/0291 (EP,US);
G01J3/10 (EP,US);
G01J3/501 (EP,US);
G01N21/255 (EP,US);
| Designated contracting states | CH, DE, FR, GB, IT, LI [2004/08] |
| Former [2003/22] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR | Title | German: | Spektralphotometer und Verwendung desselben | [2003/22] | English: | Spectrophotometer and its use | [2003/22] | French: | Spectrophotomètre et son utilisation | [2003/22] | Examination procedure | 26.11.2003 | Examination requested [2004/05] | 29.11.2003 | Loss of particular rights, legal effect: designated state(s) | 29.03.2004 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, CY, DK, ES, FI, GR, IE, LU, MC, NL, PT, SE, TR | 26.01.2006 | Despatch of a communication from the examining division (Time limit: M04) | 24.05.2006 | Reply to a communication from the examining division | 18.01.2007 | Despatch of a communication from the examining division (Time limit: M06) | 17.07.2007 | Reply to a communication from the examining division | 12.03.2008 | Despatch of a communication from the examining division (Time limit: M06) | 12.09.2008 | Reply to a communication from the examining division | 22.10.2009 | Date of oral proceedings | 12.11.2009 | Date of oral proceedings | 21.01.2010 | Minutes of oral proceedings despatched | 28.01.2010 | Communication of intention to grant the patent | 26.05.2010 | Fee for grant paid | 26.05.2010 | Fee for publishing/printing paid | Opposition(s) | 15.04.2011 | No opposition filed within time limit [2011/25] | Fees paid | Renewal fee | 28.10.2003 | Renewal fee patent year 03 | 05.11.2004 | Renewal fee patent year 04 | 14.11.2005 | Renewal fee patent year 05 | 13.11.2006 | Renewal fee patent year 06 | 16.11.2007 | Renewal fee patent year 07 | 17.11.2008 | Renewal fee patent year 08 | 24.11.2009 | Renewal fee patent year 09 | Penalty fee | Penalty fee Rule 85a EPC 1973 | 09.01.2004 | AT M01 Not yet paid | 09.01.2004 | BE M01 Not yet paid | 09.01.2004 | CY M01 Not yet paid | 09.01.2004 | DK M01 Not yet paid | 09.01.2004 | ES M01 Not yet paid | 09.01.2004 | FI M01 Not yet paid | 09.01.2004 | GR M01 Not yet paid | 09.01.2004 | IE M01 Not yet paid | 09.01.2004 | LU M01 Not yet paid | 09.01.2004 | MC M01 Not yet paid | 09.01.2004 | NL M01 Not yet paid | 09.01.2004 | PT M01 Not yet paid | 09.01.2004 | SE M01 Not yet paid | 09.01.2004 | TR M01 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | IT | 14.07.2010 | FR | 30.11.2010 | [2011/47] |
| Former [2011/31] | IT | 14.07.2010 | Documents cited: | Search | [Y]EP0144188 (XEROX CORP [US]) [Y] 12 * the whole document *; | [Y]US4969037 (POLESCHINSKI RICHARD [DE], et al) [Y] 5 * column 1, line 61 - column 2, line 41 * * column 3, line 52 - column 5, line 15 *; | [Y]WO0040935 (IBSEN MICRO STRUCTURES A S [DK], et al) [Y] 6 * page 21, line 31 - page 23, line 30 * * page 39, line 14 - page 43, line 34 *; | [YA]US6147761 (WALOWIT ERIC [US], et al) [Y] 1-12 * column 3, line 3 - column 4, line 63 * * column 6, line 14 - column 13, line 16 * * figures 1,2,7,12A,16,17 * [A] ; | [Y]EP1072884 (KELLY WILLIAM M [IE]) [Y] 1-11 * column 7, line 56 - column 9, line 16 * * column 10, line 21 - line 35 * * figures 1,3,6 *; | [Y]WO0129542 (MV RES LTD [IE], et al) [Y] 3 * page 5, line 20 - page 7, line 16 *; | [A] - FLETCHER R, "HIGH EFFICIENCY", OPTICS AND PHOTONICS NEWS, OPTICAL SOCIETY OF AMERICA, WASHINGTON, DC, US, (199904), vol. 10, no. 4, ISSN 1047-6938, pages 18 - 23, XP000949867 [A] 1 * page 23, column 1, paragraph 1 * | by applicant | US4886355 | EP0375317 | US5377000 | EP0964244 | WO0040935 | US6147761 | EP1067369 | EP1072884 | WO0129542 | DE19962779 | EP1150154 |