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Extract from the Register of European Patents

EP About this file: EP1213259

EP1213259 - Process for manufacturing micromechanical and microoptomechanical structures with single crystal silicon exposure step [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  28.03.2008
Database last updated on 18.05.2024
Most recent event   Tooltip28.03.2008No opposition filed within time limitpublished on 30.04.2008  [2008/18]
Applicant(s)For all designated states
MICROSCAN SYSTEMS INCORPORATED
1201 SW 7th Street Renton
Washington 98055 / US
For all designated states
Xerox Corporation
800 Long Ridge Rd., P.O. Box 1600
Stamford, CT 06904-1600 / US
[2007/21]
Former [2002/24]For all designated states
MICROSCAN SYSTEMS INCORPORATED
1201 SW 7th Street
Renton, Washington 98055 / US
For all designated states
XEROX CORPORATION
800 Long Ridge Rd., P.O. Box 1600
Stamford, CT 06904-1600 / US
Inventor(s)01 / Zosel, Andrew J.
19234 SE 259th Place
Covington, Washington 98042 / US
02 / Gulvin, Peter M.
11 Green Pine Lane
Webster, New York 14580 / US
03 / Chen, Jingkuang
100 Brittany Circle
Rochster, New York 14618 / US
04 / Kubby, Joel A.
63 Spring Valley Drive
Rochester, New York 14622 / US
05 / Lin, Chuang-Chia
3400 Richmond Parkway, Apt. 1321
San Pablo, California 94806 / US
06 / Tran, Alex T.
2250 N. Triphammer Road, Apt. K2A
Ithaca, New York 14850 / US
 [2002/24]
Representative(s)Grünecker Patent- und Rechtsanwälte PartG mbB
Leopoldstrasse 4
80802 München / DE
[N/P]
Former [2002/24]Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
Maximilianstrasse 58
80538 München / DE
Application number, filing date01128161.527.11.2001
[2002/24]
Priority number, dateUS2000072451427.11.2000         Original published format: US 724514
[2002/24]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1213259
Date:12.06.2002
Language:EN
[2002/24]
Type: A3 Search report 
No.:EP1213259
Date:16.06.2004
[2004/25]
Type: B1 Patent specification 
No.:EP1213259
Date:23.05.2007
Language:EN
[2007/21]
Search report(s)(Supplementary) European search report - dispatched on:EP04.05.2004
ClassificationIPC:B81B3/00
[2002/24]
CPC:
B81C1/00666 (EP,US); G02B26/0833 (EP,US); B81B2203/058 (EP,US);
B81C2201/014 (EP,US); B81C2201/0164 (EP,US); B81C2201/056 (EP,US)
Designated contracting statesDE,   FR,   GB [2005/10]
Former [2002/24]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Verfahren zur Herstellung von mikromechanischen und mikrooptomechanischen Strukturen mit Freilegen von einkristallinem Silizium[2006/50]
English:Process for manufacturing micromechanical and microoptomechanical structures with single crystal silicon exposure step[2002/24]
French:Procédé de fabrication de structures micromécaniques et microoptomecaniques avec un étage d'exposition de silicium monocristallin[2002/24]
Former [2002/24]Verfahren zur Herstellung von mikromechanischen und mikrooptomechanischen Strukturen mit einem Schritt von Belichtung von Silizium-Einkristall
Examination procedure30.10.2003Examination requested  [2004/01]
14.01.2005Despatch of a communication from the examining division (Time limit: M04)
24.05.2005Reply to a communication from the examining division
01.08.2005Despatch of a communication from the examining division (Time limit: M08)
23.03.2006Reply to a communication from the examining division
27.11.2006Communication of intention to grant the patent
04.04.2007Fee for grant paid
04.04.2007Fee for publishing/printing paid
Opposition(s)26.02.2008No opposition filed within time limit [2008/18]
Fees paidRenewal fee
21.11.2003Renewal fee patent year 03
22.11.2004Renewal fee patent year 04
29.11.2005Renewal fee patent year 05
27.11.2006Renewal fee patent year 06
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Documents cited:Search[XY]  - J. KUBBY, "Micro-Opto-Electromechanical Systems Manufacturing", PUBLIC PRESENTATION AT 1999 ADVANCED TECHNOLOGY PROGRAM NATIONAL MEETING, SAN JOSÉ, USA, (19991115), URL: www.atp.nist.gov/1999national/kubby.pdf, (20040311), XP002273953 [X] 1-16,22 * slides "SCS-SMM Process I & II", "Milestones", "Mask Set 1 Unit Process Development" * [Y] 17-21
 [Y]  - BROSNIHAN T J ET AL, Embedded interconnect and electrical isolation for high-aspect-ratio, SOI inertial instruments, 1997 INTERNATIONAL CONFERENCE ON SOLID-STATE SENSORS AND ACTUATORS. DIGEST OF TECHNICAL PAPERS. TRANSDUCERS 97. CHICAGO, IL, JUNE 16 - 19, 1997. SESSIONS 1A1 - 2D3. PAPERS NO. 1A1.01 - 2D3.14PL, INTERNATIONAL CONFERENCE ON SOLID-STATE SENSORS AND ACT, ISBN 0-7803-3829-4, XP002108481 [Y] 17-21 * paragraph "Summary" * * paragraph "Isolation and interconnect fabrication" * * figures 1,2 *

DOI:   http://dx.doi.org/10.1109/SENSOR.1997.613732
 [YA]  - ZIMMERMANN L ET AL, "AIRBAG APPLICATION: A MICROSYSTEM INCLUDING A SILICON CAPACITIVE ACCELEROMETER, CMOS SWITCHED CAPACITOR ELECTRONICS AND TRUE SELF-TEST CAPABILITY", SENSORS AND ACTUATORS A, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, (1995), vol. A46, no. 1/3, ISSN 0924-4247, pages 190 - 195, XP000514197 [Y] 1-4,12-15 * paragraph "3. Fabrication process" * * figure 1 * [A] 11,22

DOI:   http://dx.doi.org/10.1016/0924-4247(94)00888-O
 [Y]  - PISTER K S J, "MICROFABRICATED HINGES", SENSORS AND ACTUATORS A, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, (19920601), vol. A33, no. 3, ISSN 0924-4247, pages 249 - 256, XP000297416 [Y] 1-4,12-15 * paragraph "2. Process" *;; figures 2,3 *

DOI:   http://dx.doi.org/10.1016/0924-4247(92)80172-Y
ExaminationUS6002507
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