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Extract from the Register of European Patents

EP About this file: EP1241807

EP1241807 - Heterodyne optical spectrum analyzer with provisions for intensity noise subtraction [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  03.08.2007
Database last updated on 02.07.2024
Most recent event   Tooltip03.08.2007Application deemed to be withdrawnpublished on 05.09.2007  [2007/36]
Applicant(s)For all designated states
Agilent Technologies, Inc.
- a Delaware Corporation - 5301 Stevens Creek Boulevard
Santa Clara CA 95051 / US
[N/P]
Former [2007/04]For all designated states
Agilent Technologies, Inc.
- a Delaware Corporation - 5301 Stevens Creek Boulevard
Santa Clara, CA 95051 / US
Former [2002/38]For all designated states
Agilent Technologies, Inc. (a Delaware corporation)
395 Page Mill Road
Palo Alto, CA 94303 / US
Inventor(s)01 / Baney, Douglas M.
897 Clinton Rd.
Los Altos, California 94024 / US
02 / Szafraniec, Bogdan
1035 Castleton Terrace D
Sunnyvale, California 94087 / US
 [2002/38]
Representative(s)Liesegang, Eva, et al
Boehmert & Boehmert
Anwaltspartnerschaft mbB
Pettenkoferstrasse 22
80336 München / DE
[N/P]
Former [2002/38]Liesegang, Eva, et al
Forrester & Boehmert, Pettenkoferstrasse 20-22
80336 München / DE
Application number, filing date01130312.019.12.2001
[2002/38]
Priority number, dateUS2001081122017.03.2001         Original published format: US 811220
[2002/38]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1241807
Date:18.09.2002
Language:EN
[2002/38]
Type: A3 Search report 
No.:EP1241807
Date:11.08.2004
[2004/33]
Search report(s)(Supplementary) European search report - dispatched on:EP24.06.2004
ClassificationIPC:H04B10/148, H04B10/08, G01R23/17
[2004/33]
CPC:
H04B10/07 (EP,US); H04B10/60 (EP,US); H04B10/64 (EP,US)
Former IPC [2002/38]H04B10/148, H04B10/08
Designated contracting statesDE,   FR,   GB [2005/18]
Former [2002/38]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Heterodyner optischer Spektralanalysator mit Einrichtung zur Intensitätsrauschverminderung[2002/38]
English:Heterodyne optical spectrum analyzer with provisions for intensity noise subtraction[2002/38]
French:Analyseur de spectre hétérodyne optique avec dispositions pour soustraire le bruit d'intensité[2002/38]
Examination procedure12.01.2005Examination requested  [2005/11]
30.10.2006Communication of intention to grant the patent
10.03.2007Application deemed to be withdrawn, date of legal effect  [2007/36]
17.04.2007Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time  [2007/36]
Fees paidRenewal fee
29.12.2003Renewal fee patent year 03
23.12.2004Renewal fee patent year 04
27.12.2005Renewal fee patent year 05
27.12.2006Renewal fee patent year 06
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Documents cited:Search[A]  - YOSHIDA S ET AL, "High resolution optical spectrum analysis by coherent detection with multi-electrode DBR-LD's as local oscillators", INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, 1994. IMTC/94. CONFERENCE PROCEEDINGS. 10TH ANNIVERSARY. ADVANCED TECHNOLOGIES IN I & M., 1994 IEEE HAMAMATSU, JAPAN 10-12 MAY 1994, NEW YORK, NY, USA,IEEE, (19940510), ISBN 0-7803-1880-3, pages 230 - 233, XP010122102 [A] 1-10 * page 230, column R; figure 1A *

DOI:   http://dx.doi.org/10.1109/IMTC.1994.352070
 [A]  - KATAOKA T ET AL, "High resolution optical spectrum analyzer using a heterodyne detection technique", INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, 1994. IMTC/94. CONFERENCE PROCEEDINGS. 10TH ANNIVERSARY. ADVANCED TECHNOLOGIES IN I & M., 1994 IEEE HAMAMATSU, JAPAN 10-12 MAY 1994, NEW YORK, NY, USA,IEEE, (19940510), ISBN 0-7803-1880-3, pages 234 - 237, XP010121721 [A] 1-10 * page 234, column R; figure 1 *

DOI:   http://dx.doi.org/10.1109/IMTC.1994.352084
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.