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Extract from the Register of European Patents

EP About this file: EP1127955

EP1127955 - Low resistivity silicon carbide [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  04.06.2010
Database last updated on 19.10.2024
Most recent event   Tooltip04.03.2011Lapse of the patent in a contracting state
New state(s): IT
published on 06.04.2011  [2011/14]
Applicant(s)For all designated states
Shipley Company LLC
455 Forest Street
Marlborough, MA 01752 / US
[2001/35]
Inventor(s)01 / Goela, Jitendra S.
12 Messina Drive
Andover, Massachusetts 01810 / US
02 / Pickering, Michael A.
246 Willard Street
Dracut, Massachusetts 01826 / US
 [2001/35]
Representative(s)Kent, Venetia Katherine
Patent Outsourcing Limited 1 King Street Bakewell
Derbyshire DE45 1DZ / GB
[N/P]
Former [2009/51]Kent, Venetia Katherine
Patent Outsourcing Limited 1 King Street Bakewell
Derbyshire DE 45 1DZ / GB
Former [2001/35]Kent, Venetia Katherine
Rohm and Haas (UK) Ltd European Operations Patent Dept. Lennig House 2 Mason's Avenue
Croydon, CR9 3NB / GB
Application number, filing date01301614.222.02.2001
[2001/35]
Priority number, dateUS20000184766P24.02.2000         Original published format: US 184766 P
[2001/35]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1127955
Date:29.08.2001
Language:EN
[2001/35]
Type: B1 Patent specification 
No.:EP1127955
Date:29.07.2009
Language:EN
[2009/31]
Search report(s)(Supplementary) European search report - dispatched on:EP28.06.2001
ClassificationIPC:C23C16/32, C23C16/44
[2001/35]
CPC:
C23C16/01 (EP,US); C23C16/32 (KR); C23C16/325 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT,   NL [2002/21]
Former [2001/35]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Siliziumkarbid mit geringem Widerstand[2001/35]
English:Low resistivity silicon carbide[2001/35]
French:Carbure de silicium à faible résistivité[2001/35]
Examination procedure03.03.2001Examination requested  [2001/35]
02.04.2007Despatch of a communication from the examining division (Time limit: M04)
28.06.2007Reply to a communication from the examining division
13.03.2009Communication of intention to grant the patent
12.06.2009Fee for grant paid
12.06.2009Fee for publishing/printing paid
Opposition(s)03.05.2010No opposition filed within time limit [2010/27]
Fees paidRenewal fee
25.02.2003Renewal fee patent year 03
23.02.2004Renewal fee patent year 04
22.02.2005Renewal fee patent year 05
27.02.2006Renewal fee patent year 06
27.02.2007Renewal fee patent year 07
25.02.2008Renewal fee patent year 08
26.02.2009Renewal fee patent year 09
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Lapses during opposition  TooltipIT29.07.2009
FR01.03.2010
[2011/14]
Former [2011/07]FR01.03.2010
Documents cited:Search[XY]US4772498  (BERTIN ROBERT [US], et al) [X] 1,12,15 * abstract * [Y] 2,3,10,11,13,14,16,17;
 [YA]EP0582444  (CVD INC [US]) [Y] 2,10,11,13,16,17 * abstract * * page 10, lines 1-20; example 1 * [A] 4-9;
 [Y]  - KIMOTO T ET AL, "Step-controlled epitaxy of SiC: High-quality homoepitaxial growth", DIAMOND AND RELATED MATERIALS,NL,ELSEVIER SCIENCE PUBLISHERS, AMSTERDAM, (19980201), vol. 7, no. 2-5, ISSN 0925-9635, pages 342 - 347, XP004115062 [Y] 3,14 * abstract * * page 345, column L, lines 29-34 *

DOI:   http://dx.doi.org/10.1016/S0925-9635(97)00166-0
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.