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Extract from the Register of European Patents

EP About this file: EP1176814

EP1176814 - Photoelectric conversion device, radiation detection apparatus, image processing system, and driving method thereof [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  19.04.2013
Database last updated on 24.04.2024
Most recent event   Tooltip03.05.2013Lapse of the patent in a contracting state
New state(s): FR
published on 05.06.2013  [2013/23]
Applicant(s)For all designated states
CANON KABUSHIKI KAISHA
30-2, 3-chome, Shimomaruko, Ohta-ku
Tokyo / JP
[2012/24]
Former [2002/05]For all designated states
CANON KABUSHIKI KAISHA
30-2, 3-chome, Shimomaruko, Ohta-ku
Tokyo / JP
Inventor(s)01 / Endo, Tadao, c/o Canon Kabushiki Kaisha
30-2, 3-chome Shimomaruko
Ohta-ku
Tokyo / JP
 [2012/24]
Former [2002/05]01 / Endo, Tadao, c/o Canon Kabushiki Kaisha
30-2, 3-chome Shimomaruko, Ohta-ku
Tokyo / JP
Representative(s)TBK
Bavariaring 4-6
80336 München / DE
[2012/24]
Former [2008/22]TBK-Patent
Bavariaring 4-6
80336 München / DE
Former [2002/05]Beresford, Keith Denis Lewis, et al
Beresford & Co., 2-5 Warwick Court, High Holborn
London WC1R 5DJ / GB
Application number, filing date01306400.126.07.2001
[2002/05]
Priority number, dateJP2000022969628.07.2000         Original published format: JP 2000229696
[2002/05]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1176814
Date:30.01.2002
Language:EN
[2002/05]
Type: A3 Search report 
No.:EP1176814
Date:28.05.2008
[2008/22]
Type: B1 Patent specification 
No.:EP1176814
Date:13.06.2012
Language:EN
[2012/24]
Search report(s)(Supplementary) European search report - dispatched on:EP02.05.2008
ClassificationIPC:H04N5/32, H04N5/361
[2011/52]
CPC:
G01T1/2928 (EP,US); H04N25/63 (EP,US); H04N5/32 (EP,US)
Former IPC [2002/05]H04N5/30
Designated contracting statesDE,   FR,   GB,   NL [2009/06]
Former [2002/05]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Photoelektrisches Umwandlungsgerät, Strahlungsdetektoreinrichtung, Bildverarbeitungssystem und Steuerverfahren[2012/03]
English:Photoelectric conversion device, radiation detection apparatus, image processing system, and driving method thereof[2002/05]
French:Dispositif de conversion photoélectrique, appareil détecteur de radiation, système de traitement d'images, et procédé de commande[2002/05]
Former [2002/05]Photoelektrisches Umwandlungsgerät, Strahlungsdetektoreinrichtung, Bildverarbeitungsverfahren und Steuerverfahren
Examination procedure28.11.2008Examination requested  [2009/02]
29.11.2008Loss of particular rights, legal effect: designated state(s)
24.02.2009Despatch of a communication from the examining division (Time limit: M04)
25.02.2009Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, CY, DK, ES, FI, GR, IE, IT, LU, MC, PT, SE, TR
01.07.2009Reply to a communication from the examining division
25.10.2011Date of oral proceedings
17.11.2011Minutes of oral proceedings despatched
27.12.2011Communication of intention to grant the patent
03.05.2012Fee for grant paid
03.05.2012Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  24.02.2009
Opposition(s)14.03.2013No opposition filed within time limit [2013/21]
Fees paidRenewal fee
23.07.2003Renewal fee patent year 03
22.07.2004Renewal fee patent year 04
20.07.2005Renewal fee patent year 05
31.07.2006Renewal fee patent year 06
31.07.2007Renewal fee patent year 07
13.03.2008Renewal fee patent year 08
31.07.2009Renewal fee patent year 09
02.08.2010Renewal fee patent year 10
01.08.2011Renewal fee patent year 11
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipNL13.06.2012
FR13.08.2012
[2013/23]
Former [2013/15]NL13.06.2012
Documents cited:Search[X]US4810881  (BERGER JEAN L [FR], et al) [X] 1-20 * column 1, line 61 - line 68 * * column 9, line 41 - column 12, line 32 * * figures 9a-9h,10-13 *;
 [X]WO9801992  (PHILIPS ELECTRONICS NV [NL], et al) [X] 1-20 * page 7, line 17 - page 9, line 34 * * figures 1-4 *;
 [A]US5777335  (MOCHIZUKI CHIORI [JP], et al) [A] 1 * column 3, line 32 - line 35 ** figure 1 *;
 [X]DE19743523  (SIEMENS AG [DE]) [X] 1-20 * the whole document *
ExaminationEP0245147
 EP0792062
    - CHABBAL J ET AL, "Amorphous silicon X-ray image sensor", PROCEEDINGS OF THE SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING SPIE, USA, (19960211), vol. 2708, ISSN 0277-786X, pages 499 - 510, XP002487371
by applicantUS4810881
 EP0792062
 WO9801992
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.