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Extract from the Register of European Patents

EP About this file: EP1197803

EP1197803 - Lithographic apparatus [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  07.12.2012
Database last updated on 04.06.2024
Most recent event   Tooltip19.07.2013Lapse of the patent in a contracting state
New state(s): GB
published on 21.08.2013  [2013/34]
Applicant(s)For all designated states
ASML Netherlands B.V.
De Run 6501
5504 DR Veldhoven / NL
[N/P]
Former [2004/39]For all designated states
ASML Netherlands B.V.
De Run 6501
5504 DR Veldhoven / NL
Former [2002/34]For all designated states
ASML Netherlands B.V.
De Run 1110
5503 LA Veldhoven / NL
Former [2002/16]For all designated states
ASM LITHOGRAPHY B.V.
De Run 1110
5503 LA Veldhoven / NL
Inventor(s)01 / Van Elp, Jan
Hoverniersstraat 21
2613 RM Delft / NL
02 / Leenders, Martinus Hendrikus Antonius
Stadhoudersplein 29b
3039 ER Rotterdam / NL
03 / Banine, Vadim Yevgenyevich
Nierslaan 2
5704 NK Helmond / NL
04 / Visser, Hugo Matthieu
Lange Lauwerstraat 52bis
3512 VK Utrecht / NL
05 / Bakker, Levinus Pieter
Echternachlaan 13
5625 KA Eindhoven / NL
 [2002/16]
Representative(s)Slenders, Petrus Johannes Waltherus, et al
ASML Netherlands B.V.
Corporate Intellectual Property
De Run 6501
P.O. Box 324
5500 AH Veldhoven / NL
[N/P]
Former [2009/23]Slenders, Petrus J. W., et al
ASML Netherlands B.V Corporate Intellectual Property P.O. Box 324
5500 AH Veldhoven / NL
Former [2009/09]Van den Hooven, Jan, et al
ASML Netherlands B.V. Corporate Intellectual Property P.O. Box 324
5500 AH Veldhoven / NL
Former [2002/16]Leeming, John Gerard
J.A. Kemp & Co., 14 South Square, Gray's Inn
London WC1R 5LX / GB
Application number, filing date01308572.508.10.2001
[2002/16]
Priority number, dateEP2000030890310.10.2000         Original published format: EP 00308903
[2002/16]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1197803
Date:17.04.2002
Language:EN
[2002/16]
Type: A3 Search report 
No.:EP1197803
Date:29.09.2004
[2004/40]
Type: B1 Patent specification 
No.:EP1197803
Date:01.02.2012
Language:EN
[2012/05]
Search report(s)(Supplementary) European search report - dispatched on:EP18.08.2004
ClassificationIPC:G03F7/20
[2002/16]
CPC:
G03F7/70575 (EP); G03F7/70191 (EP); G03F7/702 (EP)
Designated contracting statesDE,   FR,   GB,   IT,   NL [2005/24]
Former [2002/16]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Lithographischer Apparat[2002/16]
English:Lithographic apparatus[2002/16]
French:Appareil lithographique[2002/16]
Examination procedure10.03.2005Examination requested  [2005/19]
25.06.2009Despatch of a communication from the examining division (Time limit: M04)
28.10.2009Reply to a communication from the examining division
06.09.2011Cancellation of oral proceeding that was planned for 19.10.2011
19.09.2011Communication of intention to grant the patent
19.10.2011Date of oral proceedings (cancelled)
20.12.2011Fee for grant paid
20.12.2011Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  25.06.2009
Opposition(s)05.11.2012No opposition filed within time limit [2013/02]
Fees paidRenewal fee
14.11.2003Renewal fee patent year 03
07.10.2004Renewal fee patent year 04
25.10.2005Renewal fee patent year 05
13.10.2006Renewal fee patent year 06
16.10.2007Renewal fee patent year 07
14.10.2008Renewal fee patent year 08
27.10.2009Renewal fee patent year 09
25.10.2010Renewal fee patent year 10
20.10.2011Renewal fee patent year 11
Penalty fee
Additional fee for renewal fee
31.10.200303   M06   Fee paid on   14.11.2003
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipIT01.02.2012
NL01.02.2012
GB08.10.2012
[2013/34]
Former [2012/50]IT01.02.2012
NL01.02.2012
Former [2012/35]NL01.02.2012
Documents cited:Search[XY]JPH07301696  ;
 [X]JPH04248556  ;
 [Y]EP0532236  (CANON KK [JP]) [Y] 10-12 * figure 5 * * column 1, lines 19-27 * * column 9, lines 57,58 * * column 11, lines 36-38 *;
 [A]JPH11219891
 [XY]  - PATENT ABSTRACTS OF JAPAN, (19960329), vol. 1996, no. 03, & JP07301696 A 19951114 (HITACHI LTD) [X] 1-4,6,7,13-21 * abstract * * figure 1 * * paragraphs [0002] , [0005] , [0014] , [0020] , [0025] , [0027] , [0034] * [Y] 10-12
 [X]  - PATENT ABSTRACTS OF JAPAN, (19930118), vol. 017, no. 024, Database accession no. (P - 1471), & JP04248556 A 19920904 (NIPPON TELEGR & TELEPH CORP ) [X] 1,20,21 * abstract * * figures 1,2 *
 [A]  - KRASTEV K ET AL, "Spectral sampling of a soft X-ray tube emission by a lamellar multilayer grating in standard and conical mountings", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, SECTION - A: ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, NORTH-HOLLAND PUBLISHING COMPANY. AMSTERDAM, NL, (1996), vol. A368, no. 2, ISSN 0168-9002, pages 533 - 542, XP004000379 [A] 5 * Section 3.3 *

DOI:   http://dx.doi.org/10.1016/0168-9002(95)00729-6
 [A]  - PATENT ABSTRACTS OF JAPAN, (19991130), vol. 1999, no. 13, & JP11219891 A 19990810 (HITACHI LTD) [A] 1-19 * abstract *
ExaminationUS5848119
by applicantUS5296891
 US5523193
 US5229872
 US6046792
 US5969441
 WO9840791
    - W. PARTLO, I. FOMENKOV, R. OLIVER, D. BIN, "Development of an EUV (13.5 nm) Light Source Employing a Dense Plasma Focus in Lithium Vapor", PROC SPIE, (2000), vol. 3997, pages 136 - 156
    - M.W. MCGEOCH, "Power Scaling of a Z-pinch Extreme Ultraviolet Source", PROC SPIE, (2000), vol. 3997, pages 861 - 866
    - W.T. SILFVAST, M. KLOSNER, G. SHIMKAVEG, H. BENDER, G. KUBIAK, N. FOMACIARI, "High- power plasma discharge source at 13.5 and 11.4 nm for EUV lithography", PROC SPIE, (1999), vol. 3676, pages 272 - 275
    - FRANKE ET AL., J. VAC. SCI. TECHNOL., (1997), vol. 15, page 2940
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.