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Extract from the Register of European Patents

EP About this file: EP1230671

EP1230671 - SYSTEM AND METHOD FOR PROVIDING DEFECT FREE RAPID THERMAL PROCESSING [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  20.02.2009
Database last updated on 05.10.2024
Most recent event   Tooltip30.10.2009Change - representativepublished on 02.12.2009  [2009/49]
Applicant(s)For all designated states
Wafermasters Incorporated
246 East Gish Road
San Jose, CA 95112 / US
[2002/33]
Inventor(s)01 / YOO, Woo, Sik
3090 Stelling Drive
Palo Alto, CA 94303 / US
 [2002/33]
Representative(s)Freeman, Jacqueline Carol
WP Thompson
138 Fetter Lane
London EC4A 1BT / GB
[N/P]
Former [2009/49]Freeman, Jacqueline Carol
W.P.Thompson & Co. 55 Drury Lane
London WC2B 5SQ / GB
Former [2002/33]Freeman, Jacqueline Carol
W.P. THOMPSON & CO. Celcon House 289-293 High Holborn
London WC1V 7HU / GB
Application number, filing date01939341.222.05.2001
[2002/33]
WO2001US16710
Priority number, dateUS2000058985108.06.2000         Original published format: US 589851
[2002/33]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO0195372
Date:13.12.2001
Language:EN
[2001/50]
Type: A2 Application without search report 
No.:EP1230671
Date:14.08.2002
Language:EN
The application published by WIPO in one of the EPO official languages on 13.12.2001 takes the place of the publication of the European patent application.
[2002/33]
Type: B1 Patent specification 
No.:EP1230671
Date:16.04.2008
Language:EN
[2008/16]
Search report(s)International search report - published on:EP04.04.2002
ClassificationIPC:H01L21/00
[2002/33]
CPC:
H01L21/67115 (EP,US); H01L21/324 (KR)
Designated contracting statesDE,   FR,   GB,   IT,   NL [2004/21]
Former [2002/33]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:SYSTEM UND VERFAHREN ZUR ERZEUGUNG EINER FEHLERFREIEN SCHNELLEN THERMISCHEN BEHANDLUNG[2002/33]
English:SYSTEM AND METHOD FOR PROVIDING DEFECT FREE RAPID THERMAL PROCESSING[2002/33]
French:SYSTEME ET PROCEDE DE TRAITEMENT THERMIQUE RAPIDE DONNANT DES PIECES EXEMPTES DE DEFAUT[2002/33]
Entry into regional phase13.02.2002National basic fee paid 
13.02.2002Designation fee(s) paid 
13.02.2002Examination fee paid 
Examination procedure13.02.2002Examination requested  [2002/33]
28.12.2004Despatch of a communication from the examining division (Time limit: M04)
28.04.2005Reply to a communication from the examining division
13.01.2006Despatch of a communication from the examining division (Time limit: M04)
12.05.2006Reply to a communication from the examining division
22.08.2007Date of oral proceedings
10.09.2007Minutes of oral proceedings despatched
26.09.2007Communication of intention to grant the patent
14.01.2008Fee for grant paid
14.01.2008Fee for publishing/printing paid
Opposition(s)19.01.2009No opposition filed within time limit [2009/13]
Fees paidRenewal fee
02.06.2003Renewal fee patent year 03
17.05.2004Renewal fee patent year 04
12.05.2005Renewal fee patent year 05
23.03.2006Renewal fee patent year 06
14.05.2007Renewal fee patent year 07
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipIT16.04.2008
GB16.07.2008
[2009/39]
Former [2009/29]GB16.07.2008
Cited inInternational search[XY]US5884009  (OKASE WATARU [JP]) [X] 1,2,4-12,14-16 * figures 15A-15D * * column 22, lines 21-23 * * column 23, lines 29-63 * [Y] 13,17-20;
 [YA]JPH09330873  ;
 [A]JPH11251400  ;
 [A]US5592581  (OKASE WATARU [JP]) [A] 1,9,12,17 * figures 1,3,4 *;
 [A]US5399199  (KIYAMA HIROMI [JP], et al) [A] 1,9,12,17 * column 4, lines 24-39 *
 [YA]  - DATABASE WPI, 1, Derwent World Patents Index, vol. 1998, no. 10, Database accession no. 1998-107252, XP002184262 & JPH09330873 A 19971222 (MITSUBISHI ELECTRIC CORP) [Y] 13,17-20 * abstract * [A] 1,9,12,17
 [A]  - PATENT ABSTRACTS OF JAPAN, (19991222), vol. 1999, no. 14, & JP11251400 A 19990917 (HITACHI LTD) [A] 1,9,12,17 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.