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EP1292819
European procedure
Extract from the Register of European Patents
EP About this file: EP1292819
| EP1292819 - ION BEAM MILLING SYSTEM AND METHOD FOR ELECTRON MICROSCOPY SPECIMEN PREPARATION [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 15.08.2008 Database last updated on 18.10.2024 | Most recent event Tooltip | 15.08.2008 | No opposition filed within time limit | published on 17.09.2008 [2008/38] | Applicant(s) | For all designated states Gatan, Inc. 5933 Coronado Lane Pleasanton, CA 94588-3334 / US | [2003/12] | Inventor(s) | 01 /
ALANI, Reza / deceased / US | [2003/12] | Representative(s) | Ahmad, Sheikh Shakeel, et al Keltie LLP No.1 London Bridge London SE1 9BA / GB | [N/P] |
| Former [2003/12] | Ahmad, Sheikh Shakeel, et al David Keltie Associates Fleet Place House 2 Fleet Place London EC4M 7ET / GB | Application number, filing date | 01948455.9 | 18.06.2001 | [2003/12] | WO2001US19504 | Priority number, date | US20000212963P | 21.06.2000 Original published format: US 212963 P | US20010874766 | 05.06.2001 Original published format: US 874766 | [2003/12] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO0198749 | Date: | 27.12.2001 | Language: | EN | [2001/52] | Type: | A1 Application with search report | No.: | EP1292819 | Date: | 19.03.2003 | Language: | EN | The application published by WIPO in one of the EPO official languages on 27.12.2001 takes the place of the publication of the European patent application. | [2003/12] | Type: | B1 Patent specification | No.: | EP1292819 | Date: | 10.10.2007 | Language: | EN | [2007/41] | Search report(s) | International search report - published on: | EP | 27.12.2001 | Classification | IPC: | G01N1/32, H01J37/305 | [2003/12] | CPC: |
G01N1/32 (EP,US);
H01J37/3053 (EP,US);
H01J2237/31745 (EP,US)
| Designated contracting states | DE, FR, GB [2004/20] |
| Former [2003/12] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR | Extension states | AL | Not yet paid | LT | Not yet paid | LV | Not yet paid | MK | Not yet paid | RO | Not yet paid | SI | Not yet paid | Title | German: | IONENSTRAHL-FRÄSSYSTEM UND VERFAHREN ZUR VORBEREITUNG VON PROBEN FÜR DIE ELEKTRONENMIKROSKOPIE | [2003/12] | English: | ION BEAM MILLING SYSTEM AND METHOD FOR ELECTRON MICROSCOPY SPECIMEN PREPARATION | [2003/12] | French: | SYSTEME DE FRAISAGE PAR FAISCEAU IONIQUE ET PROCEDE DE PREPARATION D'EPROUVETTES POUR MICROSCOPIE ELECTRONIQUE | [2003/12] | Entry into regional phase | 17.12.2002 | National basic fee paid | 17.12.2002 | Designation fee(s) paid | 17.12.2002 | Examination fee paid | Examination procedure | 15.01.2002 | Request for preliminary examination filed International Preliminary Examining Authority: EP | 17.12.2002 | Examination requested [2003/12] | 21.02.2005 | Despatch of a communication from the examining division (Time limit: M04) | 04.07.2005 | Reply to a communication from the examining division | 02.02.2006 | Despatch of a communication from the examining division (Time limit: M04) | 29.05.2006 | Reply to a communication from the examining division | 02.05.2007 | Communication of intention to grant the patent | 21.08.2007 | Fee for grant paid | 21.08.2007 | Fee for publishing/printing paid | Opposition(s) | 11.07.2008 | No opposition filed within time limit [2008/38] | Fees paid | Renewal fee | 23.06.2003 | Renewal fee patent year 03 | 23.06.2004 | Renewal fee patent year 04 | 21.06.2005 | Renewal fee patent year 05 | 28.06.2006 | Renewal fee patent year 06 | 27.06.2007 | Renewal fee patent year 07 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [YD]US5472566 (SWANN PETER R [US], et al) [YD] 1-3,9-18,26-32,36,42-49,57-61 * column 6, line 33 - column 7, line 5; figure 5 *; | [Y]US5940678 (DOONG YIH-YUH [TW], et al) [Y] 1-3,9-18,26-32,36,42-49,57-61 * abstract * * column 1, lines 7-25 *; | [YD]US5986264 (GRUENEWALD WOLFGANG [DE]) [YD] 9-11,14,15,26-28,30,31,57-59 * abstract *; | [Y]US4128765 (FRANKS JOSEPH) [Y] 17 * abstract *; | [A]US5708267 (HATAKEYAMA MASAHIRO [JP]) [A] 6,23,39,54 * abstract *; | [A]DD139670 (HAUFFE WOLFGANG) [A] 1,18 * the whole document *; | [AD]US5907157 (YOSHIOKA TADANORI [JP], et al) [AD] 1,18,36,49 * the whole document *; | [AD]US5922179 (MITRO RICHARD J [US], et al) [AD] 1,18,36,49 * the whole document *; | [AD]US4272682 (SWANN PETER R) [AD] 35 * abstract * | [A] - KAWASAKI M ET AL, "A NEW SPECIMEN PREPARATION METHOD FOR CROSS-SECTION TEM USING DIAMOND POWDERS", JOURNAL OF ELECTRON MICROSCOPY, JAPANESE SOCIETY FOR ELECTRON MICROSCOPY. TOKYO, JP, (1999), vol. 48, no. 2, ISSN 0022-0744, pages 131 - 137, XP000805799 [A] 5,22,38,53 * abstract * |