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Extract from the Register of European Patents

EP About this file: EP1218757

EP1218757 - METHOD FOR MAKING A PROBE CARD WITH MULTIPLE CONTACT TIPS FOR TESTING INTEGRATED CIRCUITS WITH MICROSPHERE CONTACTS [Right-click to bookmark this link]
Former [2002/27]METHOD FOR MAKING A CARD WITH MULTIPLE CONTACT TIPS FOR TESTING MICROSPHERE INTEGRATED CIRCUITS, AND TESTING DEVICE USING SAID CARD
[2003/42]
StatusNo opposition filed within time limit
Status updated on  21.01.2005
Database last updated on 29.07.2024
Most recent event   Tooltip14.12.2007Lapse of the patent in a contracting state
New state(s): PT		published on 16.01.2008  [2008/03]
Applicant(s)For all designated states
Mesatronic
ZAC de Champfeuillet, 130, rue de Placyre
38500 Voiron / FR
[2002/27]
Inventor(s)01 / BELMONT, André
Hameau Le Temple
F-38490 La Batie Divisin / FR
02 / ROBERT, Laurent
c/o Mesatronic 130, Rue du Placyre ZAC Champfeuill
et 38500 Voiron / FR
03 / AIT MANI, Abdel, Nacer
9, rue Gay
F-38400 Saint Martin d'Hères / FR
 [2003/23]
Former [2002/27]01 / BELMONT, André
Hameau Le Temple
F-38490 La Batie Divisin / FR
02 / ROBERT, Laurent
Clos Bérard Bate, 4, rue Brunetière
38500 Voiron / FR
03 / AIT MANI, Abdel, Nacer
9, rue Gay
F-38400 Saint Martin d'Hères / FR
Representative(s)Hecké, Gérard
Cabinet Hecké
10, rue d'Arménie - Europole
BP 1537
38025 Grenoble Cedex 1 / FR
[N/P]
Former [2002/27]Hecké, Gérard
Cabinet HECKE World Trade Center - Europole, 5, Place Robert Schuman, BP 1537
38025 Grenoble Cedex 1 / FR
Application number, filing date01956635.524.07.2001
[2002/27]
WO2001FR02411
Priority number, dateFR2000000993028.07.2000         Original published format: FR 0009930
[2002/27]
Filing languageFR
Procedural languageFR
PublicationType: A1 Application with search report
No.:WO0210779
Date:07.02.2002
Language:FR
[2002/06]
Type: A1 Application with search report 
No.:EP1218757
Date:03.07.2002
Language:FR
The application published by WIPO in one of the EPO official languages on 07.02.2002 takes the place of the publication of the European patent application.
[2002/27]
Type: B1 Patent specification 
No.:EP1218757
Date:17.03.2004
Language:FR
[2004/12]
Search report(s)International search report - published on:EP07.02.2002
ClassificationIPC:G01R1/073, G01R3/00
[2003/42]
CPC:
G01R1/0735 (EP,US); G01R1/06738 (EP,US); G01R3/00 (EP,US);
H05K3/243 (EP,US); H05K3/4007 (EP,US); Y10T29/49117 (EP,US);
Y10T29/49147 (EP,US); Y10T29/49155 (EP,US) (-)
Former IPC [2002/27]G01R1/073
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   TR [2002/27]
Extension statesALNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
RONot yet paid
SINot yet paid
TitleGerman:HERSTELLUNGSVERFAHREN FÜR EINE SONDENKARTE MIT MEHREREN KONTAKTPUNKTEN ZUR PRÜFUNG VON INTEGRIERTEN SCHALTUNGEN MIT KUGELMATRIX-VERPACKUNG (BGA)[2003/42]
English:METHOD FOR MAKING A PROBE CARD WITH MULTIPLE CONTACT TIPS FOR TESTING INTEGRATED CIRCUITS WITH MICROSPHERE CONTACTS[2003/42]
French:PROCEDE DE FABRICATION D'UNE CARTE A POINTES DE CONTACT MULTIPLE POUR LE TEST DE CIRCUITS INTEGRES A PLOTS DE CONNEXION EN FORME DE MICROBILLES[2003/42]
Former [2002/27]HERSTELLUNGSVERFAHREN FÜR EINE SONDENKARTE MIT MEHREREN KONTAKTPUNKTEN ZUR PRÜFUNG VON INTEGRIERTEN SCHALTUNGEN MIT KUGELMATRIX-VERPACKUNG (BGA) UND TESTVORRICHTUNG MIT SONDENKARTE
Former [2002/27]METHOD FOR MAKING A CARD WITH MULTIPLE CONTACT TIPS FOR TESTING MICROSPHERE INTEGRATED CIRCUITS, AND TESTING DEVICE USING SAID CARD
Former [2002/27]PROCEDE DE FABRICATION D'UNE CARTE A POINTES DE CONTACT MULTIPLE POUR LE TEST DE CIRCUITS INTEGRES A MICROBILLES, ET DISPOSITIF DE TEST UTILISANT LA CARTE
Entry into regional phase16.04.2002National basic fee paid 
16.04.2002Designation fee(s) paid 
16.04.2002Examination fee paid 
Examination procedure16.04.2002Examination requested  [2002/27]
20.11.2002Despatch of a communication from the examining division (Time limit: M04)
10.03.2003Reply to a communication from the examining division
24.03.2003Despatch of a communication from the examining division (Time limit: M04)
07.05.2003Reply to a communication from the examining division
19.09.2003Communication of intention to grant the patent
05.01.2004Fee for grant paid
05.01.2004Fee for publishing/printing paid
Opposition(s)20.12.2004No opposition filed within time limit [2005/10]
Fees paidRenewal fee
21.07.2003Renewal fee patent year 03
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Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipCY17.03.2004
FI17.03.2004
TR17.03.2004
DK17.06.2004
GR17.06.2004
SE17.06.2004
ES28.06.2004
LU24.07.2004
MC31.07.2004
PT17.08.2004
[2008/03]
Former [2007/10]CY17.03.2004
FI17.03.2004
TR17.03.2004
DK17.06.2004
GR17.06.2004
SE17.06.2004
ES28.06.2004
LU24.07.2004
MC31.07.2004
Former [2006/51]FI17.03.2004
TR17.03.2004
DK17.06.2004
GR17.06.2004
SE17.06.2004
ES28.06.2004
LU24.07.2004
MC31.07.2004
Former [2005/23]FI17.03.2004
DK17.06.2004
GR17.06.2004
SE17.06.2004
ES28.06.2004
LU24.07.2004
MC31.07.2004
Former [2005/22]FI17.03.2004
DK17.06.2004
GR17.06.2004
SE17.06.2004
ES28.06.2004
MC31.07.2004
Former [2005/18]FI17.03.2004
DK17.06.2004
GR17.06.2004
SE17.06.2004
ES28.06.2004
Former [2005/02]FI17.03.2004
GR17.06.2004
SE17.06.2004
ES28.06.2004
Former [2004/41]FI17.03.2004
GR17.06.2004
SE17.06.2004
Former [2004/40]FI17.03.2004
SE17.06.2004
Cited inInternational search[A]EP0772049  (NITTO DENKO CORP [JP]) [A] 1 * column 4, line 11 - column 5, line 14 * * column 8, line 47 - column 9, line 28; figures 1A-2C *;
 [AD]WO9845716  (MESATRONIC [FR], et al) [AD] 1 * abstract *;
 [A]WO9852218  (HITACHI LTD [JP], et al) [A] 7 * abstract *;
 [A]EP0999451  (NITTO DENKO CORP [JP]) [A] 1,7 * abstract *;
 [A]  - KONDOH Y ET AL, "UNIVERSAL MEMBRANE PROBE FOR KNOWN GOOD DIE", INTERNATIONAL JOURNAL OF MICROCIRCUITS AND ELECTRONIC PACKAGING,US,INTERNATIONAL MICROELECTRONICS & PACKAGING SOCIETY, (19941001), vol. 17, no. 4, ISSN 1063-1674, pages 323 - 329, XP000497394
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.