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Extract from the Register of European Patents

EP About this file: EP1348134

EP1348134 - WEIGHTED RANDOM PATTERN TEST USING PRE-STORED WEIGHTS [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  25.08.2006
Database last updated on 14.06.2024
Most recent event   Tooltip10.08.2007Lapse of the patent in a contracting state
New state(s): IT		published on 12.09.2007  [2007/37]
Applicant(s)For all designated states
Intel Corporation
2200 Mission College Boulevard
Santa Clara, CA 95054 / US
[N/P]
Former [2003/40]For all designated states
INTEL CORPORATION
2200 Mission College Boulevard
Santa Clara, CA 95052 / US
Inventor(s)01 / LIN, Chih-Jen, M.
10612 Indigo Broom Loop
Austin, TX 78733 / US
02 / WU, David, M.
16 Radnor Drive
Austin, TX 78738 / US
 [2004/02]
Former [2003/40]01 / LIN, Chih-Jen, M.
10612 Indigo Broom Loop
Austin, TX 78733 / US
02 / WU, David, M.
16925 NW Park Court
Beaverton, OR 97006 / US
Representative(s)Molyneaux, Martyn William, et al
Harrison Goddard Foote
40- 43 Chancery Lane
London
WC2A 1JA / GB
[N/P]
Former [2004/10]Molyneaux, Martyn William, et al
Harrison Goddard Foote 40-43 Chancery Lane
London WC2A 1JA / GB
Former [2003/40]Molyneaux, Martyn William
Wildman, Harrold, Allen & Dixon 11th Floor, Tower 3, Clements Inn
London WC2A 2AZ / GB
Application number, filing date01991603.018.12.2001
[2003/40]
WO2001US50807
Priority number, dateUS2000075020027.12.2000         Original published format: US 750200
[2003/40]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO02052288
Date:04.07.2002
Language:EN
[2002/27]
Type: A2 Application without search report 
No.:EP1348134
Date:01.10.2003
Language:EN
The application published by WIPO in one of the EPO official languages on 04.07.2002 takes the place of the publication of the European patent application.
[2003/40]
Type: B1 Patent specification 
No.:EP1348134
Date:19.10.2005
Language:EN
[2005/42]
Search report(s)International search report - published on:EP01.05.2003
ClassificationIPC:G01R31/3185
[2003/40]
CPC:
G01R31/318385 (EP,US); G06F11/27 (KR); G01R31/318547 (EP,US)
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   TR [2003/40]
Extension statesALNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
RONot yet paid
SINot yet paid
TitleGerman:GEWICHTETER ZUFALLSMUSTERTEST MIT VORGESPEICHERTEN GEWICHTEN[2003/40]
English:WEIGHTED RANDOM PATTERN TEST USING PRE-STORED WEIGHTS[2003/40]
French:TEST ALEATOIRE ET PONDERE DE MOTIFS AU MOYEN DE PONDERATIONS PREENREGISTREES[2003/40]
Entry into regional phase01.07.2003National basic fee paid 
01.07.2003Designation fee(s) paid 
01.07.2003Examination fee paid 
Examination procedure19.07.2002Request for preliminary examination filed
International Preliminary Examining Authority: US
30.06.2003Amendment by applicant (claims and/or description)
01.07.2003Examination requested  [2003/40]
12.05.2004Despatch of a communication from the examining division (Time limit: M04)
10.09.2004Reply to a communication from the examining division
14.10.2004Despatch of a communication from the examining division (Time limit: M04)
14.02.2005Reply to a communication from the examining division
22.04.2005Communication of intention to grant the patent
16.08.2005Fee for grant paid
16.08.2005Fee for publishing/printing paid
Opposition(s)20.07.2006No opposition filed within time limit [2006/39]
Fees paidRenewal fee
29.12.2003Renewal fee patent year 03
23.12.2004Renewal fee patent year 04
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT19.10.2005
BE19.10.2005
CH19.10.2005
DK19.10.2005
FI19.10.2005
IT19.10.2005
LI19.10.2005
TR19.10.2005
CY18.12.2005
GR19.01.2006
SE19.01.2006
ES30.01.2006
PT20.03.2006
[2007/37]
Former [2007/20]AT19.10.2005
BE19.10.2005
CH19.10.2005
DK19.10.2005
FI19.10.2005
LI19.10.2005
TR19.10.2005
CY18.12.2005
GR19.01.2006
SE19.01.2006
ES30.01.2006
PT20.03.2006
Former [2006/52]AT19.10.2005
BE19.10.2005
CH19.10.2005
DK19.10.2005
FI19.10.2005
LI19.10.2005
TR19.10.2005
GR19.01.2006
SE19.01.2006
ES30.01.2006
PT20.03.2006
Former [2006/39]AT19.10.2005
BE19.10.2005
CH19.10.2005
DK19.10.2005
FI19.10.2005
LI19.10.2005
GR19.01.2006
SE19.01.2006
ES30.01.2006
PT20.03.2006
Former [2006/38]AT19.10.2005
BE19.10.2005
CH19.10.2005
FI19.10.2005
LI19.10.2005
DK19.01.2006
GR19.01.2006
SE19.01.2006
ES30.01.2006
PT20.03.2006
Former [2006/36]AT19.10.2005
BE19.10.2005
CH19.10.2005
FI19.10.2005
LI19.10.2005
DK19.01.2006
SE19.01.2006
ES30.01.2006
PT20.03.2006
Former [2006/34]AT19.10.2005
CH19.10.2005
FI19.10.2005
LI19.10.2005
DK19.01.2006
SE19.01.2006
ES30.01.2006
PT20.03.2006
Former [2006/33]CH19.10.2005
FI19.10.2005
LI19.10.2005
SE19.01.2006
ES30.01.2006
PT20.03.2006
Former [2006/27]FI19.10.2005
SE19.01.2006
PT20.03.2006
Former [2006/25]FI19.10.2005
PT20.03.2006
Former [2006/23]FI19.10.2005
Cited inInternational search[X]US4687988  (EICHELBERGER EDWARD B [US], et al) [X] 1-17 * abstract * * column 6, line 36 - column 8, line 61 *;
 [A]US5323400  (AGARWAL VINOD [CA], et al) [A] 1-17 * abstract *;
 [A]US5479414  (KELLER PAUL N [US], et al) [A] 1-17 * abstract *;
 [X]US5612963  (KOENEMANN BERND K F [US], et al) [X] 1-17 * abstract * * column 6, line 36 - column 8, line 27 *;
 [X]US5983380  (MOTIKA FRANCO [US], et al) [X] 1-17 * abstract * * column 6, line 28 - column 6, line 51 *;
 [A]  - BASSETT R W ET AL, "Low cost testing of high density logic components", 1999 INTERNATIONAL TEST CONFERENCE, XP010086450 [A] 1-17 * page 553 - page 555; figures 8,9 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.