blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability
Register Forum

2022.02.11

More...
blank News flashes

News flashes

New version of the European Patent Register - SPC information for Unitary Patents.

2024-03-06

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP1354359

EP1354359 - SYSTEM AND METHOD FOR ONE-TIME PROGRAMMED MEMORY [Right-click to bookmark this link]
StatusThe application has been refused
Status updated on  27.05.2011
Database last updated on 03.06.2024
Most recent event   Tooltip27.05.2011Refusal of applicationpublished on 29.06.2011  [2011/26]
Applicant(s)For all designated states
Broadcom Corporation
5300 California Avenue
Irvine, CA 92617 / US
[2007/21]
Former [2003/43]For all designated states
Broadcom Corporation
16215 Alton Parkway
Irvine, California 92618 / US
Inventor(s)01 / CHEN, Vincent
17 Via Palladio
Newport Coast, CA 92657 / US
02 / CHEN, Henry
1 South Santa Teresita
Irvine, CA 92606 / US
03 / TSAU, Liming
14591 Fir Avenue
Irvine, CA 92606 / US
04 / SHIAU, Jay
15 Faith
Irvine, CA 92612 / US
05 / BATTACHARYA, Surya
31 Santa Catalina Aisle
Irvine, CA 92606 / US
06 / ITO, Akira
284 Stonecliff Aisle
Irvine, CA 92612 / US
 [2004/08]
Former [2003/43]01 / CHEN, Vincent
67 Melrose
Mission Viejo, CA 92692 / US
02 / CHEN, Henry
1 South Santa Teresita
Irvine, CA 92606 / US
03 / TSAU, Liming
14591 Fir Avenue
Irvine, CA 92606 / US
04 / SHIAU, Jay
15 Faith
Irvine, CA 92612 / US
05 / BATTACHARYA, Surya
31 Santa Catalina Aisle
Irvine, CA 92606 / US
06 / ITO, Akira
284 Stonecliff Aisle
Irvine, CA 92612 / US
Representative(s)Jehle, Volker Armin, et al
Bosch Jehle Patentanwaltsgesellschaft mbH
Flüggenstrasse 13
80639 München / DE
[N/P]
Former [2008/52]Jehle, Volker Armin, et al
Bosch Jehle Patentanwaltsgesellschaft mbH Flüggenstrasse 13
80639 München / DE
Former [2003/43]Jehle, Volker Armin, Dipl.-Ing.
Patentanwälte Bosch, Graf von Stosch, Jehle, Flüggenstrasse 13
80639 München / DE
Application number, filing date01994268.920.12.2001
[2003/43]
WO2001US48853
Priority number, dateUS2000073975220.12.2000         Original published format: US 739752
[2003/43]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO02063689
Date:15.08.2002
Language:EN
[2002/33]
Type: A1 Application with search report 
No.:EP1354359
Date:22.10.2003
Language:EN
The application published by WIPO in one of the EPO official languages on 15.08.2002 takes the place of the publication of the European patent application.
[2003/43]
Search report(s)International search report - published on:EP15.08.2002
ClassificationIPC:H01L27/112, H01L21/8246, G11C17/16, G11C17/18, H01L23/525
[2003/43]
CPC:
G11C17/18 (EP,US); H10B20/00 (EP,US); H01L2924/0002 (EP,US)
C-Set:
H01L2924/0002, H01L2924/00 (EP,US)
Designated contracting statesDE,   FR,   GB [2004/20]
Former [2003/43]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:SYSTEM UND VERFAHREN FÜR EINMAL-PROGRAMMIERBAREN SPEICHER[2003/43]
English:SYSTEM AND METHOD FOR ONE-TIME PROGRAMMED MEMORY[2003/43]
French:SYSTEME ET PROCEDE DE MEMOIRE A PROGRAMMATION UNIQUE[2003/43]
Entry into regional phase21.07.2003National basic fee paid 
21.07.2003Designation fee(s) paid 
21.07.2003Examination fee paid 
Examination procedure22.07.2002Request for preliminary examination filed
International Preliminary Examining Authority: US
21.07.2003Examination requested  [2003/43]
25.02.2008Despatch of a communication from the examining division (Time limit: M04)
08.05.2008Reply to a communication from the examining division
05.06.2008Invitation to provide information on prior art
03.09.2008Reply to the invitation to provide information on prior art
07.09.2009Despatch of a communication from the examining division (Time limit: M04)
02.10.2009Reply to a communication from the examining division
13.10.2009Despatch of a communication from the examining division (Time limit: M04)
08.01.2010Reply to a communication from the examining division
12.03.2010Despatch of a communication from the examining division (Time limit: M04)
13.04.2010Reply to a communication from the examining division
01.02.2011Application refused, date of legal effect [2011/26]
01.02.2011Date of oral proceedings
11.02.2011Minutes of oral proceedings despatched
14.02.2011Despatch of communication that the application is refused, reason: substantive examination [2011/26]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  25.02.2008
Fees paidRenewal fee
02.01.2004Renewal fee patent year 03
03.01.2005Renewal fee patent year 04
02.01.2006Renewal fee patent year 05
02.01.2007Renewal fee patent year 06
02.01.2008Renewal fee patent year 07
05.01.2009Renewal fee patent year 08
04.01.2010Renewal fee patent year 09
03.01.2011Renewal fee patent year 10
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Cited inInternational search[A]US5163180  (ELTOUKHY ABDELSHAFY A [US], et al) [A] 1-14 * column 4, line 23 - column 9, line 3; figures 1-4 *;
 [A]US5742555  (MARR KENNETH W [US], et al) [A] 1-14* column 3, line 11 - line 28; figures 1,2 *;
 [X]US5949712  (RAO KAMESWARA K [US], et al) [X] 1-14 * the whole document *;
 [DX]US6044012  (RAO KAMESWARA K [US], et al) [DX] 1-14 * the whole document *;
 [A]  - SHI Y ET AL, "POLARITY-DEPENDENT TUNNELING CURRENT AND OXIDE BREAKDOWN IN DUAL- GATE CMOSFET'S", IEEE ELECTRON DEVICE LETTERS, IEEE INC. NEW YORK, US, (19981001), vol. 19, no. 10, ISSN 0741-3106, pages 391 - 393, XP000779341 [A] 1-3,5,7-10,12,14 * the whole document *

DOI:   http://dx.doi.org/10.1109/55.720196
ExaminationUS6096610
    - CHIANG S. ET AL, "Antifuse structure comparison for field programmable gate arrays", ELECTRON DEVICES MEETING, 1992. TECHNICAL DIGEST., INTERNATIONAL SAN FRANCISCO, CA, USA 13-16 DEC. 1992, NEW YORK, NY, USA,IEEE, US LNKD- DOI:10.1109/IEDM.1992.307435, (19921213), ISBN 978-0-7803-0817-6, pages 611 - 614, XP010106574

DOI:   http://dx.doi.org/10.1109/IEDM.1992.307435
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.