EP1354359 - SYSTEM AND METHOD FOR ONE-TIME PROGRAMMED MEMORY [Right-click to bookmark this link] | Status | The application has been refused Status updated on 27.05.2011 Database last updated on 03.06.2024 | Most recent event Tooltip | 27.05.2011 | Refusal of application | published on 29.06.2011 [2011/26] | Applicant(s) | For all designated states Broadcom Corporation 5300 California Avenue Irvine, CA 92617 / US | [2007/21] |
Former [2003/43] | For all designated states Broadcom Corporation 16215 Alton Parkway Irvine, California 92618 / US | Inventor(s) | 01 /
CHEN, Vincent 17 Via Palladio Newport Coast, CA 92657 / US | 02 /
CHEN, Henry 1 South Santa Teresita Irvine, CA 92606 / US | 03 /
TSAU, Liming 14591 Fir Avenue Irvine, CA 92606 / US | 04 /
SHIAU, Jay 15 Faith Irvine, CA 92612 / US | 05 /
BATTACHARYA, Surya 31 Santa Catalina Aisle Irvine, CA 92606 / US | 06 /
ITO, Akira 284 Stonecliff Aisle Irvine, CA 92612 / US | [2004/08] |
Former [2003/43] | 01 /
CHEN, Vincent 67 Melrose Mission Viejo, CA 92692 / US | ||
02 /
CHEN, Henry 1 South Santa Teresita Irvine, CA 92606 / US | |||
03 /
TSAU, Liming 14591 Fir Avenue Irvine, CA 92606 / US | |||
04 /
SHIAU, Jay 15 Faith Irvine, CA 92612 / US | |||
05 /
BATTACHARYA, Surya 31 Santa Catalina Aisle Irvine, CA 92606 / US | |||
06 /
ITO, Akira 284 Stonecliff Aisle Irvine, CA 92612 / US | Representative(s) | Jehle, Volker Armin, et al Bosch Jehle Patentanwaltsgesellschaft mbH Flüggenstrasse 13 80639 München / DE | [N/P] |
Former [2008/52] | Jehle, Volker Armin, et al Bosch Jehle Patentanwaltsgesellschaft mbH Flüggenstrasse 13 80639 München / DE | ||
Former [2003/43] | Jehle, Volker Armin, Dipl.-Ing. Patentanwälte Bosch, Graf von Stosch, Jehle, Flüggenstrasse 13 80639 München / DE | Application number, filing date | 01994268.9 | 20.12.2001 | [2003/43] | WO2001US48853 | Priority number, date | US20000739752 | 20.12.2000 Original published format: US 739752 | [2003/43] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO02063689 | Date: | 15.08.2002 | Language: | EN | [2002/33] | Type: | A1 Application with search report | No.: | EP1354359 | Date: | 22.10.2003 | Language: | EN | The application published by WIPO in one of the EPO official languages on 15.08.2002 takes the place of the publication of the European patent application. | [2003/43] | Search report(s) | International search report - published on: | EP | 15.08.2002 | Classification | IPC: | H01L27/112, H01L21/8246, G11C17/16, G11C17/18, H01L23/525 | [2003/43] | CPC: |
G11C17/18 (EP,US);
H10B20/00 (EP,US);
H01L2924/0002 (EP,US)
| C-Set: |
H01L2924/0002, H01L2924/00 (EP,US)
| Designated contracting states | DE, FR, GB [2004/20] |
Former [2003/43] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR | Title | German: | SYSTEM UND VERFAHREN FÜR EINMAL-PROGRAMMIERBAREN SPEICHER | [2003/43] | English: | SYSTEM AND METHOD FOR ONE-TIME PROGRAMMED MEMORY | [2003/43] | French: | SYSTEME ET PROCEDE DE MEMOIRE A PROGRAMMATION UNIQUE | [2003/43] | Entry into regional phase | 21.07.2003 | National basic fee paid | 21.07.2003 | Designation fee(s) paid | 21.07.2003 | Examination fee paid | Examination procedure | 22.07.2002 | Request for preliminary examination filed International Preliminary Examining Authority: US | 21.07.2003 | Examination requested [2003/43] | 25.02.2008 | Despatch of a communication from the examining division (Time limit: M04) | 08.05.2008 | Reply to a communication from the examining division | 05.06.2008 | Invitation to provide information on prior art | 03.09.2008 | Reply to the invitation to provide information on prior art | 07.09.2009 | Despatch of a communication from the examining division (Time limit: M04) | 02.10.2009 | Reply to a communication from the examining division | 13.10.2009 | Despatch of a communication from the examining division (Time limit: M04) | 08.01.2010 | Reply to a communication from the examining division | 12.03.2010 | Despatch of a communication from the examining division (Time limit: M04) | 13.04.2010 | Reply to a communication from the examining division | 01.02.2011 | Application refused, date of legal effect [2011/26] | 01.02.2011 | Date of oral proceedings | 11.02.2011 | Minutes of oral proceedings despatched | 14.02.2011 | Despatch of communication that the application is refused, reason: substantive examination [2011/26] | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 25.02.2008 | Fees paid | Renewal fee | 02.01.2004 | Renewal fee patent year 03 | 03.01.2005 | Renewal fee patent year 04 | 02.01.2006 | Renewal fee patent year 05 | 02.01.2007 | Renewal fee patent year 06 | 02.01.2008 | Renewal fee patent year 07 | 05.01.2009 | Renewal fee patent year 08 | 04.01.2010 | Renewal fee patent year 09 | 03.01.2011 | Renewal fee patent year 10 |
Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [A]US5163180 (ELTOUKHY ABDELSHAFY A [US], et al) [A] 1-14 * column 4, line 23 - column 9, line 3; figures 1-4 *; | [A]US5742555 (MARR KENNETH W [US], et al) [A] 1-14* column 3, line 11 - line 28; figures 1,2 *; | [X]US5949712 (RAO KAMESWARA K [US], et al) [X] 1-14 * the whole document *; | [DX]US6044012 (RAO KAMESWARA K [US], et al) [DX] 1-14 * the whole document *; | [A] - SHI Y ET AL, "POLARITY-DEPENDENT TUNNELING CURRENT AND OXIDE BREAKDOWN IN DUAL- GATE CMOSFET'S", IEEE ELECTRON DEVICE LETTERS, IEEE INC. NEW YORK, US, (19981001), vol. 19, no. 10, ISSN 0741-3106, pages 391 - 393, XP000779341 [A] 1-3,5,7-10,12,14 * the whole document * DOI: http://dx.doi.org/10.1109/55.720196 | Examination | US6096610 | - CHIANG S. ET AL, "Antifuse structure comparison for field programmable gate arrays", ELECTRON DEVICES MEETING, 1992. TECHNICAL DIGEST., INTERNATIONAL SAN FRANCISCO, CA, USA 13-16 DEC. 1992, NEW YORK, NY, USA,IEEE, US LNKD- DOI:10.1109/IEDM.1992.307435, (19921213), ISBN 978-0-7803-0817-6, pages 611 - 614, XP010106574 DOI: http://dx.doi.org/10.1109/IEDM.1992.307435 |