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Extract from the Register of European Patents

EP About this file: EP1239261

EP1239261 - Testing device and method for deformable objects [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  01.05.2009
Database last updated on 06.07.2024
Most recent event   Tooltip25.06.2010Lapse of the patent in a contracting state
New state(s): AT
published on 28.07.2010  [2010/30]
Applicant(s)For all designated states
Dengler, Stefan
Mauswiesenweg 10
75365 Calw-Stammheim / DE
[2002/37]
Inventor(s)01 / see applicant
...
 [2002/37]
Representative(s)Schober, Christoph D., et al
Flügel Preissner Kastel Schober
Patentanwälte PartG mbB
Postfach 31 02 03
80102 München / DE
[N/P]
Former [2007/09]Schober, Christoph D., et al
Flügel Preissner Kastel Schober, Patentanwälte Postfach 31 02 03
80102 München / DE
Former [2002/37]Patentanwälte Rüger, Barthelt & Abel
Postfach 10 04 61
73704 Esslingen a.N. / DE
Application number, filing date02001220.917.01.2002
[2002/37]
Priority number, dateDE2001101130109.03.2001         Original published format: DE 10111301
[2002/37]
Filing languageDE
Procedural languageDE
PublicationType: A2 Application without search report 
No.:EP1239261
Date:11.09.2002
Language:DE
[2002/37]
Type: A3 Search report 
No.:EP1239261
Date:01.06.2005
[2005/22]
Type: B1 Patent specification 
No.:EP1239261
Date:25.06.2008
Language:DE
[2008/26]
Search report(s)(Supplementary) European search report - dispatched on:EP19.04.2005
ClassificationIPC:G01B11/24, G01B11/16, G01M17/02, G01J1/02
[2005/22]
CPC:
G01B11/161 (EP)
Former IPC [2002/37]G01B11/24
Designated contracting statesAT,   DE,   IT [2006/08]
Former [2002/37]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Prüfeinrichtung und -verfahren für verformbare Prüflinge[2002/37]
English:Testing device and method for deformable objects[2002/37]
French:Appareil et procédé d'examen pour objets déformables[2002/37]
Examination procedure29.11.2005Examination requested  [2006/04]
02.12.2005Loss of particular rights, legal effect: designated state(s)
29.03.2006Despatch of communication of loss of particular rights: designated state(s) BE, CH, CY, DK, ES, FI, FR, GB, GR, IE, LU, MC, NL, PT, SE, TR
18.10.2006Despatch of a communication from the examining division (Time limit: M06)
30.04.2007Reply to a communication from the examining division
29.02.2008Communication of intention to grant the patent
07.05.2008Fee for grant paid
07.05.2008Fee for publishing/printing paid
Opposition(s)26.03.2009No opposition filed within time limit [2009/23]
Fees paidRenewal fee
18.12.2003Renewal fee patent year 03
01.12.2004Renewal fee patent year 04
29.11.2005Renewal fee patent year 05
10.11.2006Renewal fee patent year 06
25.01.2008Renewal fee patent year 07
Penalty fee
Penalty fee Rule 85a EPC 1973
11.01.2006BE   M01   Not yet paid
11.01.2006CH   M01   Not yet paid
11.01.2006CY   M01   Not yet paid
11.01.2006DK   M01   Not yet paid
11.01.2006ES   M01   Not yet paid
11.01.2006FI   M01   Not yet paid
11.01.2006FR   M01   Not yet paid
11.01.2006GB   M01   Not yet paid
11.01.2006GR   M01   Not yet paid
11.01.2006IE   M01   Not yet paid
11.01.2006LU   M01   Not yet paid
11.01.2006MC   M01   Not yet paid
11.01.2006NL   M01   Not yet paid
11.01.2006PT   M01   Not yet paid
11.01.2006SE   M01   Not yet paid
11.01.2006TR   M01   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipIT25.06.2008
AT17.01.2009
[2010/30]
Former [2009/39]IT25.06.2008
Documents cited:Search[A]EP0125246  (IND HOLOGRAPHICS INC [US]) [A] 1* abstract *;
 [A]US4936138  (CUSHMAN CHARLES R [US], et al) [A] 1 * abstract *;
 [AD]DE4036120  (STEINBICHLER HANS [DE]) [AD] 1-17 * claim 1 *
ExaminationGB1278476
 DE19856398
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.