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Extract from the Register of European Patents

EP About this file: EP1227313

EP1227313 - Surface plasmon resonance measuring chip and method of manufacture thereof [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  21.03.2014
Database last updated on 05.10.2024
Most recent event   Tooltip21.03.2014Application deemed to be withdrawnpublished on 23.04.2014  [2014/17]
Applicant(s)For all designated states
FUJIFILM Corporation
26-30, Nishiazabu 2-chome
Minato-ku
Tokyo / JP
[2011/35]
Former [2007/11]For all designated states
FUJIFILM Corporation
26-30, Nishiazabu 2-chome Minato-ku
Tokyo / JP
For all designated states
Fujinon Corporation
1-324 Uetake-cho, Kita-ku, Saitama
Saitama / JP
Former [2005/19]For all designated states
FUJI PHOTO FILM CO., LTD.
210 Nakanuma Minamiashigara-shi
Kanagawa-ken, 250-01 / JP
For all designated states
Fujinon Corporation
1-324 Uetake-cho, Kita-ku, Saitama
Saitama / JP
Former [2002/31]For all designated states
FUJI PHOTO FILM CO., LTD.
210 Nakanuma Minamiashigara-shi
Kanagawa-ken, 250-01 / JP
For all designated states
Fuji Photo Optical Co., Ltd.
1-324 Uetake-machi Omiya-shi
Saitama-ken / JP
Inventor(s)01 / Naya, Masayuki
Fuji Photo Film Co.Ltd. 798 Miyanodai,Kaisei-machi
Ashigarakami-gun, Kanagawa-ken / JP
02 / Kubo, Takashi
Fuji Photo Film Co.Ltd. 798 Miyanodai,Kaisei-machi
Ashigarakami-gun, Kanagawa-ken / JP
03 / Ito, Takashi
Fuji Photo Optical Co., Ltd., 1-324 Uetake-machi
Ohmiya-shi, Saitama-ken / JP
04 / Nomura, Yoshimitsu
Fuji Photo Optical Co., Ltd., 1-324 Uetake-machi
Ohmiya-shi, Saitama-ken / JP
 [2002/31]
Representative(s)Klunker . Schmitt-Nilson . Hirsch
Patentanwälte
Destouchesstraße 68
80796 München / DE
[N/P]
Former [2002/31]Klunker . Schmitt-Nilson . Hirsch
Winzererstrasse 106
80797 München / DE
Application number, filing date02001783.625.01.2002
[2002/31]
Priority number, dateJP2001001663225.01.2001         Original published format: JP 2001016632
JP2001029956828.09.2001         Original published format: JP 2001299568
[2002/31]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1227313
Date:31.07.2002
Language:EN
[2002/31]
Type: A3 Search report 
No.:EP1227313
Date:19.05.2004
[2004/21]
Search report(s)(Supplementary) European search report - dispatched on:EP06.04.2004
ClassificationIPC:G01N21/55, G01N21/21, B29C45/56
[2004/21]
CPC:
G01N21/553 (EP,US); B29C45/0025 (EP,US); B29C2045/0027 (EP,US);
G01N2201/0415 (EP,US)
Former IPC [2002/31]G01N21/55
Designated contracting statesDE,   GB,   SE [2005/06]
Former [2002/31]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Chip zur Messung durch Oberflächenplasmonenresonanz und Verfahren zu deren Herstellung[2002/31]
English:Surface plasmon resonance measuring chip and method of manufacture thereof[2002/31]
French:Puce pour la mesure par resonance de plasmons de surface et procédé de fabrication associé[2002/31]
Examination procedure03.09.2004Examination requested  [2004/45]
20.11.2004Loss of particular rights, legal effect: designated state(s)
14.03.2005Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, CY, DK, ES, FI, FR, GR, IE, IT, LU, MC, NL, PT, TR
04.02.2008Despatch of a communication from the examining division (Time limit: M06)
14.08.2008Reply to a communication from the examining division
11.07.2013Despatch of a communication from the examining division (Time limit: M04)
22.11.2013Application deemed to be withdrawn, date of legal effect  [2014/17]
16.12.2013Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2014/17]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  04.02.2008
Fees paidRenewal fee
28.01.2004Renewal fee patent year 03
28.01.2005Renewal fee patent year 04
27.01.2006Renewal fee patent year 05
29.01.2007Renewal fee patent year 06
30.01.2008Renewal fee patent year 07
29.01.2009Renewal fee patent year 08
29.01.2010Renewal fee patent year 09
28.01.2011Renewal fee patent year 10
27.01.2012Renewal fee patent year 11
30.01.2013Renewal fee patent year 12
Penalty fee
Penalty fee Rule 85a EPC 1973
28.12.2004AT   M01   Not yet paid
28.12.2004BE   M01   Not yet paid
28.12.2004CH   M01   Not yet paid
28.12.2004CY   M01   Not yet paid
28.12.2004DK   M01   Not yet paid
28.12.2004ES   M01   Not yet paid
28.12.2004FI   M01   Not yet paid
28.12.2004FR   M01   Not yet paid
28.12.2004GR   M01   Not yet paid
28.12.2004IE   M01   Not yet paid
28.12.2004IT   M01   Not yet paid
28.12.2004LU   M01   Not yet paid
28.12.2004MC   M01   Not yet paid
28.12.2004NL   M01   Not yet paid
28.12.2004PT   M01   Not yet paid
28.12.2004TR   M01   Not yet paid
Additional fee for renewal fee
31.01.201413   M06   Not yet paid
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[XY]JPH09257699  ;
 [XY]JPH09257701  ;
 [Y]JPS6283121  ;
 [Y]JPH09207178  ;
 [A]JP2000178317  ;
 [A]JPH1129526  ;
 [E]JP2002296177  ;
 [A]EP0936227  (MITSUBISHI RAYON CO [JP]) [A] 1-6,13 * paragraphs [0001] - [0003] - [0008] , [0010] , [0047] , [0063] , [0064] , [0085] , [0093] *;
 [PX]WO0169207  (FUJI PHOTO FILM CO LTD [JP], et al) [PX] 1-13 * Document language: Japanese (for English text see EP1186881) *;
 [E]EP1186881  (FUJI PHOTO FILM CO LTD [JP]) [E] 1-13 * paragraphs [0092] , [0093] , [0096] , [0135] , [0170] , [0269]; figure 2 *;
 [XY]  - PATENT ABSTRACTS OF JAPAN, (19980130), vol. 1998, no. 02, & JP09257699 A 19971003 (TOTO LTD) [X] 1-12 * abstract * [Y] 13
 [XY]  - PATENT ABSTRACTS OF JAPAN, (19980130), vol. 1998, no. 02, & JP09257701 A 19971003 (TOTO LTD) [X] 1-12 * abstract * [Y] 13
 [X]  - CARR R ET AL, "Development of a surface plasmon resonance sensor for commercial applications", SENSORS AND ACTUATORS B, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, (19970301), vol. 39, no. 1-3, ISSN 0925-4005, pages 375 - 379, XP004087775 [X] 1-3,7-13 * the whole document *

DOI:   http://dx.doi.org/10.1016/S0925-4005(97)80237-7
 [Y]  - PATENT ABSTRACTS OF JAPAN, (19870918), vol. 011, no. 289, Database accession no. (M - 625), & JP62083121 A 19870416 (HITACHI LTD) [Y] 13 * abstract *
 [Y]  - PATENT ABSTRACTS OF JAPAN, (19971225), vol. 1997, no. 12, & JP09207178 A 19970812 (SHARP CORP) [Y] 13 * abstract *
 [A]  - NATSUUME T ET AL, "A NEW HIGH HEAT RESISTANT, HIGH CLARITY, AND HIGH HUMIDITY RESISTANT POLYMER FOR OPTICAL USES", MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, MATERIALS RESEARCH SOCIETY, PITTSBURG, PA, US, (19890425), vol. 150, ISSN 0272-9172, pages 245 - 250, XP009007850 [A] 1-6,13 * the whole document *
 [A]  - PATENT ABSTRACTS OF JAPAN, (20001013), vol. 2000, no. 09, & JP2000178317 A 20000627 (MITSUBISHI RAYON CO LTD) [A] 1-6,13 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19990531), vol. 1999, no. 05, & JP11029526 A 19990202 (MITSUI CHEM INC) [A] 1-6 * abstract *
 [PX]  - JORGENSON R C, "A surface plasmon resonance side active retro-reflecting sensor", SENSORS AND ACTUATORS B, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, (20010310), vol. 73, no. 2-3, ISSN 0925-4005, pages 236 - 248, XP004317284 [PX] 1-13 * the whole document *

DOI:   http://dx.doi.org/10.1016/S0925-4005(00)00690-0
 [E]  - PATENT ABSTRACTS OF JAPAN, (20030205), vol. 2003, no. 02, & JP2002296177 A 20021009 (FUJI PHOTO FILM CO LTD) [E] 1-12 * abstract *
ExaminationUS5359681
 US5606633
 JPH11344437
 DE19923820
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.