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Extract from the Register of European Patents

EP About this file: EP1241458

EP1241458 - Optical sampling waveform measuring apparatus with high bandwidth [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  14.04.2006
Database last updated on 31.05.2024
Most recent event   Tooltip14.04.2006No opposition filed within time limitpublished on 31.05.2006  [2006/22]
Applicant(s)For all designated states
ANRITSU CORPORATION
5-10-27, Minamiazabu Minato-ku
Tokyo / JP
For all designated states
NIPPON TELEGRAPH AND TELEPHONE CORPORATION
3-1, Otemachi 2-chome, Chiyoda-ku
Tokyo 100-8116 / JP
[N/P]
Former [2002/38]For all designated states
ANRITSU CORPORATION
5-10-27, Minamiazabu
Minato-ku Tokyo / JP
For all designated states
Nippon Telegraph and Telephone Corporation
3-1, Otemachi 2-chome, Chiyoda-ku
Tokyo 100-8116 / JP
Inventor(s)01 / Otani, Akihito
12-4-102, Morinosato 3-chome
Atsugi-shi, Kanagawa-ken / JP
02 / Otsubo, Toshinobu
202, Corpo Avano, 1210-7, Sanda
Atsugi-shi, Kanagawa-ken / JP
03 / Takara, Hidehiko
NTT Intell. Prop. Center, 9-11, Midori-cho 3-chome
Musashino-shi, Tokyo 180-8585 / JP
04 / Shake, Ippei
NTT Intell. Prop. Center, 9-11, Midori-cho 3-chome
Musashino-shi, Tokyo 180-8585 / JP
05 / Kawanishi, Satoki
NTT Intell. Prop. Center, 9-11, Midori-cho 3-chome
Musashino-shi, Tokyo 180-8585 / JP
 [2002/38]
Representative(s)Sajda, Wolf E., et al
Meissner Bolte Patentanwälte
Rechtsanwälte Partnerschaft mbB
Postfach 86 06 24
81633 München / DE
[N/P]
Former [2002/38]Sajda, Wolf E., Dipl.-Phys., et al
MEISSNER, BOLTE & PARTNER Postfach 86 06 24
81633 München / DE
Application number, filing date02005918.414.03.2002
[2002/38]
Priority number, dateJP2001007468415.03.2001         Original published format: JP 2001074684
[2002/38]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1241458
Date:18.09.2002
Language:EN
[2002/38]
Type: B1 Patent specification 
No.:EP1241458
Date:08.06.2005
Language:EN
[2005/23]
Search report(s)(Supplementary) European search report - dispatched on:EP24.06.2002
ClassificationIPC:G01J11/00
[2002/38]
CPC:
G01J11/00 (EP,US); G02F1/3534 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT [2003/23]
Former [2002/38]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Optisch abtastendes Wellenform-Messgerät mit hoher Bandbreite[2002/38]
English:Optical sampling waveform measuring apparatus with high bandwidth[2002/38]
French:Appareil de mesure de forme d'onde à échantillonnage optique possédant une large bande passante[2002/38]
Examination procedure14.03.2002Examination requested  [2002/38]
16.09.2004Communication of intention to grant the patent
24.01.2005Fee for grant paid
24.01.2005Fee for publishing/printing paid
Opposition(s)09.03.2006No opposition filed within time limit [2006/22]
Fees paidRenewal fee
30.03.2004Renewal fee patent year 03
29.03.2005Renewal fee patent year 04
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[AD]JPH02311722  ;
 [A]JPH0540287  ;
 [A]US4510402  (SUMMERS MARK A [US], et al) [A] 3* abstract *
 [AD]  - PATENT ABSTRACTS OF JAPAN, (19910312), vol. 015, no. 103, & JP02311722 A 19901227 (NTT) [AD] 1-3 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19930623), vol. 17, no. 332, & JP05040287 A 19930219 (NTT) [A] 1,3 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.