EP1241458 - Optical sampling waveform measuring apparatus with high bandwidth [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 14.04.2006 Database last updated on 31.05.2024 | Most recent event Tooltip | 14.04.2006 | No opposition filed within time limit | published on 31.05.2006 [2006/22] | Applicant(s) | For all designated states ANRITSU CORPORATION 5-10-27, Minamiazabu Minato-ku Tokyo / JP | For all designated states NIPPON TELEGRAPH AND TELEPHONE CORPORATION 3-1, Otemachi 2-chome, Chiyoda-ku Tokyo 100-8116 / JP | [N/P] |
Former [2002/38] | For all designated states ANRITSU CORPORATION 5-10-27, Minamiazabu Minato-ku Tokyo / JP | ||
For all designated states Nippon Telegraph and Telephone Corporation 3-1, Otemachi 2-chome, Chiyoda-ku Tokyo 100-8116 / JP | Inventor(s) | 01 /
Otani, Akihito 12-4-102, Morinosato 3-chome Atsugi-shi, Kanagawa-ken / JP | 02 /
Otsubo, Toshinobu 202, Corpo Avano, 1210-7, Sanda Atsugi-shi, Kanagawa-ken / JP | 03 /
Takara, Hidehiko NTT Intell. Prop. Center, 9-11, Midori-cho 3-chome Musashino-shi, Tokyo 180-8585 / JP | 04 /
Shake, Ippei NTT Intell. Prop. Center, 9-11, Midori-cho 3-chome Musashino-shi, Tokyo 180-8585 / JP | 05 /
Kawanishi, Satoki NTT Intell. Prop. Center, 9-11, Midori-cho 3-chome Musashino-shi, Tokyo 180-8585 / JP | [2002/38] | Representative(s) | Sajda, Wolf E., et al Meissner Bolte Patentanwälte Rechtsanwälte Partnerschaft mbB Postfach 86 06 24 81633 München / DE | [N/P] |
Former [2002/38] | Sajda, Wolf E., Dipl.-Phys., et al MEISSNER, BOLTE & PARTNER Postfach 86 06 24 81633 München / DE | Application number, filing date | 02005918.4 | 14.03.2002 | [2002/38] | Priority number, date | JP20010074684 | 15.03.2001 Original published format: JP 2001074684 | [2002/38] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP1241458 | Date: | 18.09.2002 | Language: | EN | [2002/38] | Type: | B1 Patent specification | No.: | EP1241458 | Date: | 08.06.2005 | Language: | EN | [2005/23] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 24.06.2002 | Classification | IPC: | G01J11/00 | [2002/38] | CPC: |
G01J11/00 (EP,US);
G02F1/3534 (EP,US)
| Designated contracting states | DE, FR, GB, IT [2003/23] |
Former [2002/38] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR | Title | German: | Optisch abtastendes Wellenform-Messgerät mit hoher Bandbreite | [2002/38] | English: | Optical sampling waveform measuring apparatus with high bandwidth | [2002/38] | French: | Appareil de mesure de forme d'onde à échantillonnage optique possédant une large bande passante | [2002/38] | Examination procedure | 14.03.2002 | Examination requested [2002/38] | 16.09.2004 | Communication of intention to grant the patent | 24.01.2005 | Fee for grant paid | 24.01.2005 | Fee for publishing/printing paid | Opposition(s) | 09.03.2006 | No opposition filed within time limit [2006/22] | Fees paid | Renewal fee | 30.03.2004 | Renewal fee patent year 03 | 29.03.2005 | Renewal fee patent year 04 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [AD]JPH02311722 ; | [A]JPH0540287 ; | [A]US4510402 (SUMMERS MARK A [US], et al) [A] 3* abstract * | [AD] - PATENT ABSTRACTS OF JAPAN, (19910312), vol. 015, no. 103, & JP02311722 A 19901227 (NTT) [AD] 1-3 * abstract * | [A] - PATENT ABSTRACTS OF JAPAN, (19930623), vol. 17, no. 332, & JP05040287 A 19930219 (NTT) [A] 1,3 * abstract * |