EP1273906 - X-ray analysis apparatus with an X-ray generator [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 29.06.2018 Database last updated on 30.07.2024 | |
Former | Examination is in progress Status updated on 07.03.2018 | Most recent event Tooltip | 11.01.2019 | Change - classification | published on 13.02.2019 [2019/07] | Applicant(s) | For all designated states Rigaku Corporation 3-9-12, Matsubara-cho Akishima-shi Tokyo 196-8666 / JP | [N/P] |
Former [2003/02] | For all designated states Rigaku Corporation 3-9-12, Matsubara-cho Akishima-shi, Tokyo 196-8666 / JP | Inventor(s) | 01 /
Hayashi, Seiichi 50-18, Torigaoka, Totsuka-ku Yokohama-shi, 244-0001 / JP | 02 /
Harada, Jimpei 3-47-8 Kugayama, Suginami-ku Tokyo 168-0082 / JP | 03 /
Takahashi, Sadayuki 2276-3, Hirai, Hinode-cho Nishitama-gun, Tokyo 198-0182 / JP | 04 /
Kuribayashi, Masaru 4-12-33-A203, Midori-cho Akishima-shi, Tokyo 196-0004 / JP | [2003/02] | Representative(s) | Geyer, Ulrich F., et al Wagner & Geyer Partnerschaft mbB Patent- und Rechtsanwälte Gewürzmühlstrasse 5 80538 München / DE | [N/P] |
Former [2003/02] | Geyer, Ulrich F., Dr. Dipl.-Phys., et al WAGNER & GEYER, Patentanwälte, Gewürzmühlstrasse 5 80538 München / DE | Application number, filing date | 02014738.5 | 03.07.2002 | [2003/02] | Priority number, date | JP20010202762 | 03.07.2001 Original published format: JP 2001202762 | [2003/02] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1273906 | Date: | 08.01.2003 | Language: | EN | [2003/02] | Type: | A3 Search report | No.: | EP1273906 | Date: | 11.02.2004 | [2004/07] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 02.01.2004 | Classification | IPC: | G21K1/06 | [2004/07] | CPC: |
G01N23/00 (EP,US)
|
Former IPC [2003/02] | G01N23/00 | Designated contracting states | DE [2004/45] |
Former [2003/02] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, SK, TR | Title | German: | Röntgenstrahlenanalysevorrichtung mit einem Röntgengenerator | [2003/02] | English: | X-ray analysis apparatus with an X-ray generator | [2003/02] | French: | Appareil d'analyse à rayons X avec un générateur à rayons X | [2003/02] | Examination procedure | 10.08.2004 | Examination requested [2004/41] | 20.02.2009 | Despatch of a communication from the examining division (Time limit: M06) | 02.09.2009 | Reply to a communication from the examining division | 07.05.2012 | Date of oral proceedings | 06.07.2012 | Minutes of oral proceedings despatched | 10.07.2012 | Despatch of communication that the application is refused, reason: substantive examination {1} | 01.02.2018 | Application deemed to be withdrawn, date of legal effect [2018/31] | 08.03.2018 | Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time [2018/31] | Appeal following examination | 30.08.2012 | Appeal received No. T0164/13 | 12.11.2012 | Statement of grounds filed | 18.05.2018 | Result of appeal procedure: the application was deemed to be withdrawn | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 20.02.2009 | Fees paid | Renewal fee | 28.07.2004 | Renewal fee patent year 03 | 28.07.2005 | Renewal fee patent year 04 | 31.07.2006 | Renewal fee patent year 05 | 31.07.2007 | Renewal fee patent year 06 | 31.03.2008 | Renewal fee patent year 07 | 29.07.2009 | Renewal fee patent year 08 | 26.07.2010 | Renewal fee patent year 09 | 26.07.2011 | Renewal fee patent year 10 | 30.07.2012 | Renewal fee patent year 11 | 29.07.2013 | Renewal fee patent year 12 | 30.07.2014 | Renewal fee patent year 13 | 28.07.2015 | Renewal fee patent year 14 | 29.07.2016 | Renewal fee patent year 15 | Penalty fee | Additional fee for renewal fee | 31.07.2017 | 16   M06   Not yet paid |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US4145616 (TANABE KANAME) [A] 1,5* column 2, line 40 - column 5, line 20 *; | [A]US6014423 (GUTMAN GEORGE [US], et al) [A] 1-8 * column 2, line 66 - column 4, line 6 *; | [A]US6249566 (HAYASHI SEIICHI [JP], et al) [A] 1-8 * column 6, line 14 - column 11, line 28 * | Examination | EP0210076 | WO9943009 | by applicant | US4521902 | US4607380 | US4899354 | US6075839 |