EP1324006 - Simultaneous self-calibrated sub-aperture stitching for surface figure measurement ( interferometer ) [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 09.02.2007 Database last updated on 19.10.2024 | Most recent event Tooltip | 12.12.2008 | Lapse of the patent in a contracting state New state(s): CY | published on 14.01.2009 [2009/03] | Applicant(s) | For all designated states QED TECHNOLOGIES INTERNATIONAL, INC. 870 N. Commons Drive Aurora, IL 60504 / US | [2006/52] |
Former [2003/27] | For all designated states QED Technologies, Inc. 1040 University Avenue Rochester, NY 14607 / US | Inventor(s) | 01 /
Golini, Donald 31 Palmerston Road Rochester, New York, 14618 USA / US | 02 /
Forbes, Gregory 16 Douglas Avenue, N. Epping Sydney, 2121 Australia / AU | 03 /
Murphy, Paul E. 122 Lattimore Road Rochester, New York, 14620 USA / US | [2003/27] | Representative(s) | Wagner, Karl H., et al Wagner & Geyer Partnerschaft mbB Patent- und Rechtsanwälte Gewürzmühlstrasse 5 80538 München / DE | [N/P] |
Former [2008/33] | Wagner, Karl H., et al Wagner & Geyer Partnerschaft Patent- und Rechtsanwälte Gewürzmühlstrasse 5 80538 München / DE | ||
Former [2003/27] | Wagner, Karl H., Dipl.-Ing., et al WAGNER & GEYER Patentanwälte Gewürzmühlstrasse 5 80538 München / DE | Application number, filing date | 02027674.7 | 12.12.2002 | [2003/27] | Priority number, date | US20020303236 | 25.11.2002 Original published format: US 303236 | US20010341549P | 18.12.2001 Original published format: US 341549 P | [2003/27] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP1324006 | Date: | 02.07.2003 | Language: | EN | [2003/27] | Type: | B1 Patent specification | No.: | EP1324006 | Date: | 29.03.2006 | Language: | EN | [2006/13] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 13.03.2003 | Classification | IPC: | G01B11/255, G06T11/00, G01M11/00, G02B7/00 | [2003/27] | CPC: |
G01M11/0271 (EP,US);
G01B11/255 (EP,US);
G01B9/02074 (EP,US);
G01B9/02085 (EP,US);
G01M11/0264 (EP,US);
G01B2210/52 (EP,US);
G01B2290/65 (EP,US)
(-)
| Designated contracting states | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, SI, SK, TR [2003/27] | Title | German: | Gleichzeitige und sich selbst kalibrierende Anpassung von Subaperturen zur Messung von Oberflächenformen ( Interferometer ) | [2003/27] | English: | Simultaneous self-calibrated sub-aperture stitching for surface figure measurement ( interferometer ) | [2003/27] | French: | Adaption simultanée et auto-étalonnée des ouvertures partielles pour mesurer la forme d'une surface ( interferomètre ) | [2003/27] | Examination procedure | 29.12.2003 | Examination requested [2004/10] | 26.10.2004 | Despatch of a communication from the examining division (Time limit: M04) | 03.03.2005 | Reply to a communication from the examining division | 25.04.2005 | Communication of intention to grant the patent | 05.09.2005 | Fee for grant paid | 05.09.2005 | Fee for publishing/printing paid | 29.09.2005 | Despatch of a communication from the examining division (Time limit: M04) | 26.01.2006 | Reply to a communication from the examining division | Opposition(s) | 02.01.2007 | No opposition filed within time limit [2007/11] | Fees paid | Renewal fee | 29.12.2004 | Renewal fee patent year 03 | 28.12.2005 | Renewal fee patent year 04 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | AT | 29.03.2006 | BE | 29.03.2006 | CY | 29.03.2006 | CZ | 29.03.2006 | EE | 29.03.2006 | FI | 29.03.2006 | IT | 29.03.2006 | SI | 29.03.2006 | SK | 29.03.2006 | TR | 29.03.2006 | BG | 29.06.2006 | DK | 29.06.2006 | SE | 29.06.2006 | GR | 30.06.2006 | ES | 10.07.2006 | PT | 29.08.2006 | IE | 12.12.2006 | LU | 12.12.2006 | MC | 31.12.2006 | [2009/03] |
Former [2008/37] | AT | 29.03.2006 | |
BE | 29.03.2006 | ||
CZ | 29.03.2006 | ||
EE | 29.03.2006 | ||
FI | 29.03.2006 | ||
IT | 29.03.2006 | ||
SI | 29.03.2006 | ||
SK | 29.03.2006 | ||
TR | 29.03.2006 | ||
BG | 29.06.2006 | ||
DK | 29.06.2006 | ||
SE | 29.06.2006 | ||
GR | 30.06.2006 | ||
ES | 10.07.2006 | ||
PT | 29.08.2006 | ||
IE | 12.12.2006 | ||
LU | 12.12.2006 | ||
MC | 31.12.2006 | ||
Former [2008/28] | AT | 29.03.2006 | |
BE | 29.03.2006 | ||
CZ | 29.03.2006 | ||
EE | 29.03.2006 | ||
FI | 29.03.2006 | ||
IT | 29.03.2006 | ||
SI | 29.03.2006 | ||
SK | 29.03.2006 | ||
BG | 29.06.2006 | ||
DK | 29.06.2006 | ||
SE | 29.06.2006 | ||
GR | 30.06.2006 | ||
ES | 10.07.2006 | ||
PT | 29.08.2006 | ||
IE | 12.12.2006 | ||
MC | 31.12.2006 | ||
Former [2008/22] | AT | 29.03.2006 | |
BE | 29.03.2006 | ||
CZ | 29.03.2006 | ||
IT | 29.03.2006 | ||
SI | 29.03.2006 | ||
SK | 29.03.2006 | ||
BG | 29.06.2006 | ||
DK | 29.06.2006 | ||
SE | 29.06.2006 | ||
GR | 30.06.2006 | ||
ES | 10.07.2006 | ||
PT | 29.08.2006 | ||
IE | 12.12.2006 | ||
MC | 31.12.2006 | ||
Former [2008/20] | AT | 29.03.2006 | |
BE | 29.03.2006 | ||
IT | 29.03.2006 | ||
SI | 29.03.2006 | ||
SK | 29.03.2006 | ||
BG | 29.06.2006 | ||
DK | 29.06.2006 | ||
SE | 29.06.2006 | ||
GR | 30.06.2006 | ||
ES | 10.07.2006 | ||
PT | 29.08.2006 | ||
IE | 12.12.2006 | ||
MC | 31.12.2006 | ||
Former [2007/48] | AT | 29.03.2006 | |
BE | 29.03.2006 | ||
IT | 29.03.2006 | ||
SI | 29.03.2006 | ||
SK | 29.03.2006 | ||
BG | 29.06.2006 | ||
DK | 29.06.2006 | ||
SE | 29.06.2006 | ||
ES | 10.07.2006 | ||
PT | 29.08.2006 | ||
IE | 12.12.2006 | ||
MC | 31.12.2006 | ||
Former [2007/38] | AT | 29.03.2006 | |
BE | 29.03.2006 | ||
IT | 29.03.2006 | ||
SI | 29.03.2006 | ||
SK | 29.03.2006 | ||
BG | 29.06.2006 | ||
DK | 29.06.2006 | ||
SE | 29.06.2006 | ||
ES | 10.07.2006 | ||
PT | 29.08.2006 | ||
MC | 31.12.2006 | ||
Former [2007/13] | AT | 29.03.2006 | |
BE | 29.03.2006 | ||
SI | 29.03.2006 | ||
SK | 29.03.2006 | ||
BG | 29.06.2006 | ||
DK | 29.06.2006 | ||
SE | 29.06.2006 | ||
ES | 10.07.2006 | ||
PT | 29.08.2006 | ||
Former [2007/11] | AT | 29.03.2006 | |
SI | 29.03.2006 | ||
SK | 29.03.2006 | ||
BG | 29.06.2006 | ||
DK | 29.06.2006 | ||
SE | 29.06.2006 | ||
ES | 10.07.2006 | ||
PT | 29.08.2006 | ||
Former [2007/03] | AT | 29.03.2006 | |
SI | 29.03.2006 | ||
SK | 29.03.2006 | ||
BG | 29.06.2006 | ||
SE | 29.06.2006 | ||
ES | 10.07.2006 | ||
Former [2006/50] | AT | 29.03.2006 | |
SI | 29.03.2006 | ||
BG | 29.06.2006 | ||
SE | 29.06.2006 | ||
ES | 10.07.2006 | ||
Former [2006/48] | AT | 29.03.2006 | |
SI | 29.03.2006 | ||
BG | 29.06.2006 | ||
SE | 29.06.2006 | ||
Former [2006/46] | AT | 29.03.2006 | |
SI | 29.03.2006 | ||
SE | 29.06.2006 | ||
Former [2006/43] | AT | 29.03.2006 | |
SI | 29.03.2006 | ||
Former [2006/40] | SI | 29.03.2006 | Documents cited: | Search | [A] - M. OTSUBO ET AL., "Measurement of large plane surface shapes by connecting small-aperture interferogramms", OPTICAL ENGINEERING, Bellingham, WA (US), (1994), vol. 33, no. 2, pages 608 - 613, XP000429932 [A] 1 * page 613; figures 1-3 * |