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Extract from the Register of European Patents

EP About this file: EP1251189

EP1251189 - Controlling the thickness of an evaporated or sublimed organic layer during production of an organic light-emitting device [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  15.04.2005
Database last updated on 26.06.2024
Most recent event   Tooltip15.08.2008Change - applicantpublished on 17.09.2008  [2008/38]
Applicant(s)For all designated states
Eastman Kodak Company
343 State Street
Rochester, NY 14650-2201 / US
[N/P]
Former [2008/38]For all designated states
Eastman Kodak Company
343 State Street
Rochester NY 14650-2201 / US
Former [2002/43]For all designated states
EASTMAN KODAK COMPANY
343 State Street
Rochester, New York 14650 / US
Inventor(s)01 / Van Slyke, Steven A.
Eastman Kodak Company, 343 State Street
Rochester, New York 14650-2201 / US
02 / Marcus, Michael A.
Eastman Kodak Company, 343 State Street
Rochester, New York 14650-2201 / US
03 / Spoonhower, John P.
Eastman Kodak Company, 343 State Street
Rochester, New York 14650-2201 / US
04 / Spahn, Robert G.
Eastman Kodak Company, 343 State Street
Rochester, New York 14650-2201 / US
05 / Freeman, Dennis R.
Eastman Kodak Company, 343 State Street
Rochester, New York 14650-2201 / US
 [2002/43]
Representative(s)Haile, Helen Cynthia, et al
Kodak Limited
Patent Department (W160-G)
Headstone Drive
Harrow, Middlesex
HA1 4TY / GB
[N/P]
Former [2002/49]Haile, Helen Cynthia, et al
Kodak Limited Patent, W92-3A, Headstone Drive
Harrow, Middlesex HA1 4TY / GB
Former [2002/43]Nunney, Ronald Frederick Adolphe
Kodak Limited, Patent Department (W92)-3A, Headstone Drive
Harrow, Middlesex HA1 4TY / GB
Application number, filing date02076381.908.04.2002
[2002/43]
Priority number, dateUS2001083988520.04.2001         Original published format: US 839885
[2002/43]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1251189
Date:23.10.2002
Language:EN
[2002/43]
Type: B1 Patent specification 
No.:EP1251189
Date:09.06.2004
Language:EN
[2004/24]
Search report(s)(Supplementary) European search report - dispatched on:EP20.08.2002
ClassificationIPC:C23C14/54
[2002/43]
CPC:
C23C14/547 (EP,US); H05B33/10 (KR); C23C14/12 (EP,US)
Designated contracting statesDE,   FR,   GB [2003/29]
Former [2002/43]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Kontrolle der Dicke einer aufgedampften oder aufsublimierten organischen Schicht während der Herstellung eines organischen licht-emittierenden Bauteils[2002/43]
English:Controlling the thickness of an evaporated or sublimed organic layer during production of an organic light-emitting device[2002/43]
French:Contrôle d'épaisseur d'une couche déposée par évaporation ou par sublimation pendant la fabrication d' un dispositif émetteur de lumière[2002/43]
Examination procedure03.04.2003Examination requested  [2003/23]
07.05.2003Despatch of a communication from the examining division (Time limit: M04)
29.08.2003Reply to a communication from the examining division
07.11.2003Communication of intention to grant the patent
02.02.2004Fee for grant paid
02.02.2004Fee for publishing/printing paid
Opposition(s)10.03.2005No opposition filed within time limit [2005/22]
Fees paidRenewal fee
06.04.2004Renewal fee patent year 03
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]JPS5860531  ;
 [A]US4676883  (NELSON ROGER E [US], et al) [A] 1-10 * abstract * * column 2, line 29 - column 3, line 6; figures 1,3-5 *;
 [AP]EP1170396  (JAPAN AVIATION ELECTRON [JP]) [AP] 1-10 * abstract * * page 6, line 30 - page 7, line 14; figures 14,15,16B *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19830629), vol. 007, no. 148, Database accession no. (E - 184), & JP58060531 A 19830411 (NIPPON SHINKU GIJUTSU KK) [A] 1-10 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.