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Extract from the Register of European Patents

EP About this file: EP1331710

EP1331710 - Semiconductor laser [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  17.09.2010
Database last updated on 19.10.2024
Most recent event   Tooltip17.09.2010Application deemed to be withdrawnpublished on 20.10.2010  [2010/42]
Applicant(s)For all designated states
Avago Technologies Fiber IP (Singapore) Pte. Ltd.
No. 1 Yishun Avenue 7
Singapore 768923 / SG
[2006/52]
Former [2003/31]For all designated states
Agilent Technologies, Inc. (a Delaware corporation)
395 Page Mill Road
Palo Alto, CA 94303 / US
Inventor(s)01 / Ash, Richard Mark
4 Westminster Drive
Bury St.Edmunds, Suffolk IP33 2EZ / GB
02 / Park, Christopher Anthony
Willowtree House, Church Road
Bacton, Stowmarket, Suffolk IP14 4LJ / GB
 [2003/31]
Representative(s)Dilg, Haeusler, Schindelmann Patentanwaltsgesellschaft mbH
Leonrodstraße 58
80636 München / DE
[N/P]
Former [2007/37]Dilg, Haeusler, Schindelmann Patentanwaltsgesellschaft mbH
Nußbaumstrasse 6
80336 München / DE
Former [2006/22]Schoppe, Fritz, et al
Schoppe, Zimmermann, Stöckeler & Zinkler Patentanwälte Postfach 246
82043 Pullach bei München / DE
Former [2003/31]Coker, David Graeme
Agilent Technologies UK Ltd, Legal Dept, Eskdale Road, Winnersh Triangle
Wokingham, Berks RG41 5DZ / GB
Application number, filing date02250465.823.01.2002
[2003/31]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1331710
Date:30.07.2003
Language:EN
[2003/31]
Search report(s)(Supplementary) European search report - dispatched on:EP23.01.2003
ClassificationIPC:H01S5/10, H01S5/06, H01S5/068
[2003/31]
CPC:
H01S5/1021 (EP,US); H01S5/0607 (EP,US); H01S5/068 (EP,US);
H01S5/02325 (EP,US); H01S5/06804 (EP,US); H01S5/06837 (EP,US);
H01S5/0687 (EP,US); H01S5/1017 (EP,US) (-)
Designated contracting statesDE,   FR,   GB [2004/17]
Former [2003/31]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Halbleiterlaser[2003/31]
English:Semiconductor laser[2003/31]
French:Laser à semiconducteur[2003/31]
Examination procedure30.01.2004Examination requested  [2004/14]
10.07.2009Despatch of a communication from the examining division (Time limit: M01)
20.07.2009Reply to a communication from the examining division
25.11.2009Communication of intention to grant the patent
07.04.2010Application deemed to be withdrawn, date of legal effect  [2010/42]
18.05.2010Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time  [2010/42]
Fees paidRenewal fee
26.01.2004Renewal fee patent year 03
20.01.2005Renewal fee patent year 04
27.01.2006Renewal fee patent year 05
29.01.2007Renewal fee patent year 06
25.01.2008Renewal fee patent year 07
14.01.2009Renewal fee patent year 08
Penalty fee
Additional fee for renewal fee
31.01.201009   M06   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]JP2000031603  ;
 [A]  - EBELING K J, "ABSTIMMBARE, MONOMODE EMITTIERENDE HALBLEITERLASER. TUNABLE SINGLE-LONGITUDINAL MODE EMISSION OF SEMICONDUCTOR LASERS", LASER UND OPTOELEKTRONIK, FACHVERLAG GMBH. STUTTGART, DE, (19840901), vol. 16, no. 3, ISSN 0722-9003, pages 176 - 186, XP000712300 [A] 1,14,18,19 * page 180, paragraph 4 *
 [A]  - SHIN K-C ET AL, "LOW THRESHOLD CURRENT DENSITY OPERATION OF GAINASP-INP LASER WITH MULTIPLE REFLECTOR MICROCAVITIES", IEEE PHOTONICS TECHNOLOGY LETTERS, IEEE INC. NEW YORK, US, (19951001), vol. 7, no. 10, ISSN 1041-1135, pages 1119 - 1121, XP000537212 [A] 1,14,18,19 * figure 1 *

DOI:   http://dx.doi.org/10.1109/68.466562
 [A]  - HUNG C Y ET AL, "PIEZOELECTRICALLY INDUCED STRESS TUNING OF ELECTRO-OPTIC DEVICES", APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, (19911230), vol. 59, no. 27, ISSN 0003-6951, pages 3598 - 3600, XP000257112 [A] 1,14,18,19 * paragraph [0004]; figures 1,3 *

DOI:   http://dx.doi.org/10.1063/1.105644
 [A]  - PATENT ABSTRACTS OF JAPAN, (20000831), vol. 2000, no. 04, & JP2000031603 A 20000128 (SUMITOMO ELECTRIC IND LTD) [A] 1,14,18,19 * abstract *
 [A]  - COHEN D A ET AL, "Temperature compensation of the threshold current, differential efficiency, and refractive index of a GaInAs/InP MQW diode laser mounted on a bimetallic heatsink", ELECTRONICS LETTERS, IEE STEVENAGE, GB, (19961121), vol. 32, no. 24, ISSN 0013-5194, pages 2245 - 2247, XP006005988 [A] 1,14,18,19 * the whole document *

DOI:   http://dx.doi.org/10.1049/el:19961481
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