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Extract from the Register of European Patents

EP About this file: EP1229135

EP1229135 - Method and system for DNA mixture analysis [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  28.11.2014
Database last updated on 29.03.2025
Most recent event   Tooltip15.07.2016Lapse of the patent in a contracting state
New state(s): LU, TR
published on 17.08.2016  [2016/33]
Applicant(s)For all designated states
Perlin, Mark W.
5904 Beacon Street
Pittsburgh, PA 15217 / US
[2002/32]
Inventor(s)01 / see applicant
...
 [2002/32]
Representative(s)O'Connell, David Christopher
Haseltine Lake LLP
Redcliff Quay
120 Redcliff Street
Bristol BS1 6HU / GB
[2014/04]
Former [2002/32]O'Connell, David Christopher
Haseltine Lake & Co., Imperial House, 15-19 Kingsway
London WC2B 6UD / GB
Application number, filing date02250686.931.01.2002
[2002/32]
Priority number, dateUS2001077609602.02.2001         Original published format: US 776096
[2002/32]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1229135
Date:07.08.2002
Language:EN
[2002/32]
Type: A3 Search report 
No.:EP1229135
Date:02.01.2004
[2004/01]
Type: B1 Patent specification 
No.:EP1229135
Date:22.01.2014
Language:EN
[2014/04]
Search report(s)(Supplementary) European search report - dispatched on:EP14.11.2003
ClassificationIPC:C12Q1/68, G06F19/00, G06F17/00
[2002/32]
CPC:
G16B40/10 (EP,US); C12Q1/68 (US); C12Q1/6851 (EP,US);
G06F16/22 (EP,US); G06F17/153 (US); G16B20/00 (EP,US);
G16B20/20 (EP,US); G16B30/20 (EP,US); H04L9/0816 (US);
G06F17/11 (US); G06F17/16 (US); G16B30/00 (EP,US);
G16B40/00 (EP,US); H04L2209/24 (US) (-)
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   TR [2002/32]
TitleGerman:Methode und System für DNA-Mischung Analyse[2002/32]
English:Method and system for DNA mixture analysis[2002/32]
French:Méthode et système pour l'analyse de mélange d'ADN[2002/32]
Examination procedure30.06.2004Examination requested  [2004/36]
16.08.2004Despatch of a communication from the examining division (Time limit: M06)
15.06.2005Reply to a communication from the examining division
05.08.2005Despatch of a communication from the examining division (Time limit: M06)
23.03.2006Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
08.05.2006Reply to a communication from the examining division
22.02.2007Cancellation of oral proceeding that was planned for 23.02.2007
22.02.2007Minutes of oral proceedings despatched
23.02.2007Date of oral proceedings (cancelled)
24.07.2007Despatch of communication that the application is refused, reason: substantive examination {1}
25.07.2013Communication of intention to grant the patent
04.12.2013Fee for grant paid
04.12.2013Fee for publishing/printing paid
Appeal following examination01.10.2007Appeal received No.  T2050/07
03.12.2007Statement of grounds filed
19.02.2013Result of appeal procedure: continuation of examination procedure
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  16.08.2004
Opposition(s)23.10.2014No opposition filed within time limit [2015/01]
Request for further processing for:08.05.2006Request for further processing filed
17.05.2006Full payment received (date of receipt of payment)
Request granted
07.06.2006Decision despatched
15.06.2005Request for further processing filed
13.06.2005Full payment received (date of receipt of payment)
Request granted
27.06.2005Decision despatched
Fees paidRenewal fee
30.01.2004Renewal fee patent year 03
26.01.2005Renewal fee patent year 04
30.01.2006Renewal fee patent year 05
30.01.2007Renewal fee patent year 06
30.01.2008Renewal fee patent year 07
28.01.2009Renewal fee patent year 08
27.01.2010Renewal fee patent year 09
28.01.2011Renewal fee patent year 10
26.01.2012Renewal fee patent year 11
29.01.2013Renewal fee patent year 12
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Lapses during opposition  TooltipAT22.01.2014
BE22.01.2014
CY22.01.2014
DK22.01.2014
ES22.01.2014
FI22.01.2014
IT22.01.2014
MC22.01.2014
SE22.01.2014
TR22.01.2014
CH31.01.2014
IE31.01.2014
LI31.01.2014
LU31.01.2014
FR24.03.2014
GR23.04.2014
PT22.05.2014
[2016/33]
Former [2016/29]AT22.01.2014
BE22.01.2014
CY22.01.2014
DK22.01.2014
ES22.01.2014
FI22.01.2014
IT22.01.2014
MC22.01.2014
SE22.01.2014
CH31.01.2014
IE31.01.2014
LI31.01.2014
FR24.03.2014
GR23.04.2014
PT22.05.2014
Former [2016/28]AT22.01.2014
BE22.01.2014
CY22.01.2014
DK22.01.2014
ES22.01.2014
FI22.01.2014
MC22.01.2014
SE22.01.2014
CH31.01.2014
IE31.01.2014
LI31.01.2014
FR24.03.2014
GR23.04.2014
PT22.05.2014
Former [2015/08]AT22.01.2014
BE22.01.2014
CY22.01.2014
DK22.01.2014
ES22.01.2014
FI22.01.2014
MC22.01.2014
SE22.01.2014
CH31.01.2014
IE31.01.2014
LI31.01.2014
FR24.03.2014
PT22.05.2014
Former [2015/07]AT22.01.2014
BE22.01.2014
CY22.01.2014
DK22.01.2014
ES22.01.2014
FI22.01.2014
MC22.01.2014
SE22.01.2014
CH31.01.2014
IE31.01.2014
LI31.01.2014
PT22.05.2014
Former [2014/48]AT22.01.2014
BE22.01.2014
CY22.01.2014
DK22.01.2014
ES22.01.2014
FI22.01.2014
MC22.01.2014
SE22.01.2014
CH31.01.2014
LI31.01.2014
PT22.05.2014
Former [2014/46]AT22.01.2014
BE22.01.2014
CY22.01.2014
ES22.01.2014
FI22.01.2014
MC22.01.2014
SE22.01.2014
CH31.01.2014
LI31.01.2014
PT22.05.2014
Former [2014/41]AT22.01.2014
BE22.01.2014
CY22.01.2014
ES22.01.2014
FI22.01.2014
SE22.01.2014
PT22.05.2014
Former [2014/37]AT22.01.2014
CY22.01.2014
ES22.01.2014
FI22.01.2014
SE22.01.2014
PT22.05.2014
Documents cited:Search[X]US5541067  (PERLIN MARK W [US]) [X] 1,2,5,8-17 * column 5, lines 55-63 * * column 7, lines 46-49 * * column 13, lines 11,12 * * column 29, lines 8-21 * * column 31, lines 58,59 * * column 33, lines 19,20 * * column 33, lines 56,57 * * column 37, lines 39,40 * * column 38, lines 3-17 * * column 38, lines 52-55 * * figure 2 * * figures 1,2 * * figure 8 *;
 [X]US5580728  (PERLIN MARK W [US]) [X] 1,2,5,8-17 * column 7, lines 36-39 * * column 13, lines 6-8 * * column 22, lines 38-65 * * column 25, lines 18,19 * * column 26, lines 39,40 * * column 28, line 57 - column 29, line 31 * * column 29, line 45 - column 30, line 24 * * column 33, lines 56,57 * * figures 1,2,8 *;
 [PX]EP1128311  (PERLIN MARK W [US]) [PX] 11,12 * page 3, paragraph 15 * * page 23, paragraph 138 * * page 25, paragraph 153 - page 26, paragraph 157 * * page 32; claim 11 * * page 33; claims 17,22 * * figures 4,6,7,9,11 *;
 [XD]  - EVETT I W ET AL, "TAKING ACCOUNT OF PEAK AREAS WHEN INTERPRETING MIXED DNA PROFILES", JOURNAL OF FORENSIC SCIENCES, CALLAGHAN AND CO, CHICAGO, IL, US, (199801), vol. 43, no. 1, ISSN 0022-1198, pages 62 - 69, XP001012654 [XD] 1,2,6,9-12 * page 62, column 2, lines 21-27 * * page 65; figures 1,2 * * page 66, lines 4-12 * * page 67; table 13 *
 [XD]  - GILL P ET AL, "INTERPRETING SIMPLE STR MIXTURES USING ALLELE PAEK AREAS", FORENSIC SCIENCE INTERNATIONAL, ELSEVIER SCIENTIFIC PUBLISHERS IRELAND LTD, IE, (1998), vol. 91, no. 1, ISSN 0379-0738, pages 41 - 53, XP001012655 [XD] 1-5,7,9-12 * page 42, lines 32-40 * * page 43; table 1 * * page 44, lines 1-4 * * page 44, lines 8,9 * * page 44 - page 45; tables 2-4 * * page 53, lines 4-10 *

DOI:   http://dx.doi.org/10.1016/S0379-0738(97)00174-6
 [XD]  - CLAYTON T M ET AL, "ANALYSIS AND INTERPRETATION OF MIXED FORENSIC STAINS USING DNA STR PROFILING", FORENSIC SCIENCE INTERNATIONAL, ELSEVIER SCIENTIFIC PUBLISHERS IRELAND LTD, IE, (19980109), vol. 91, no. 1, ISSN 0379-0738, pages 55 - 70, XP001013202 [XD] 1-4,6,7,9-12 * abstract * * page 64, paragraph 6 * * pages 65-69; examples A-C *

DOI:   http://dx.doi.org/10.1016/S0379-0738(97)00175-8
 [X]  - PERLIN M W, "An Expert System for Scoring DNA Database Profiles", GENETIC IDENTITY CONFERENCE PROCEEDINGS. INTERNATIONAL SYMPOSIUM ON HUMAN IDENTIFICATION, XX, XX, (20001007), pages 1 - 30, XP002228697 [X] 11,12 * page 4, lines 25-40 * * page 8, lines 16-19 * * page 9, line 15 - page 10, line 9 * * figures 8,13,14,19 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.