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Extract from the Register of European Patents

EP About this file: EP1313141

EP1313141 - Semiconductor device and method of manufacturing the same [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  20.03.2015
Database last updated on 11.09.2024
Most recent event   Tooltip24.04.2015Lapse of the patent in a contracting statepublished on 27.05.2015  [2015/22]
Applicant(s)For all designated states
Fujitsu Semiconductor Limited
2-10-23 Shin-Yokohama Kohoku-ku, Yokohama-shi
Kanagawa 222-0033 / JP
[2010/25]
Former [2009/04]For all designated states
Fujitsu Microelectronics Limited
7-1, Nishi-Shinjuku 2-chome Shinjuku-ku
Tokyo 163-0722 / JP
Former [2003/21]For all designated states
FUJITSU LIMITED
1-1, Kamikodanaka 4-chome, Nakahara-ku
Kawasaki-shi, Kanagawa 211-8588 / JP
Inventor(s)01 / Sashida, Naoya, c/o Fujitsu Limited
1-1, Kamikodanaka 4-chome
Nakahara-ku
Kawasaki-shi, Kanagawa 211-8588 / JP
 [2014/20]
Former [2003/21]01 / Sashida, Naoya, c/o Fujitsu Limited
1-1, Kamikodanaka 4-chome, Nakahara-ku
Kawasaki-shi, Kanagawa 211-8588 / JP
Representative(s)Stebbing, Timothy Charles, et al
Haseltine Lake LLP
Lincoln House, 5th Floor
300 High Holborn
London WC1V 7JH / GB
[2014/20]
Former [2003/21]Stebbing, Timothy Charles, et al
Haseltine Lake & Co., Imperial House, 15-19 Kingsway
London WC2B 6UD / GB
Application number, filing date02251817.914.03.2002
[2003/21]
Priority number, dateJP2001035032315.11.2001         Original published format: JP 2001350323
[2003/21]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1313141
Date:21.05.2003
Language:EN
[2003/21]
Type: A3 Search report 
No.:EP1313141
Date:04.05.2005
[2005/18]
Type: B1 Patent specification 
No.:EP1313141
Date:14.05.2014
Language:EN
[2014/20]
Search report(s)(Supplementary) European search report - dispatched on:EP23.03.2005
ClassificationIPC:H01L27/115, H01L21/8246, H01L21/768
[2013/50]
CPC:
H01L21/7687 (EP,US); H01L27/105 (KR); H01L21/76877 (EP,US);
H10B53/00 (EP,US); H10B53/30 (EP,US); H01L28/55 (EP,US);
H01L28/60 (EP,US) (-)
Former IPC [2003/21]H01L21/8246, H01L27/115
Designated contracting statesDE,   FR,   GB,   IT [2006/04]
Former [2003/21]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Halbleiterbauelement und dessen Herstellungsverfahren[2003/21]
English:Semiconductor device and method of manufacturing the same[2003/21]
French:Dispositif semi-conducteur et son procédé de fabrication[2003/21]
Examination procedure02.08.2005Amendment by applicant (claims and/or description)
31.10.2005Examination requested  [2005/52]
14.11.2007Despatch of a communication from the examining division (Time limit: M06)
15.05.2008Reply to a communication from the examining division
03.02.2011Despatch of a communication from the examining division (Time limit: M06)
09.08.2011Reply to a communication from the examining division
07.11.2013Cancellation of oral proceeding that was planned for 03.12.2013
03.12.2013Date of oral proceedings (cancelled)
10.12.2013Communication of intention to grant the patent
26.03.2014Fee for grant paid
26.03.2014Fee for publishing/printing paid
03.04.2014Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  14.11.2007
Opposition(s)17.02.2015No opposition filed within time limit [2015/17]
Fees paidRenewal fee
29.03.2004Renewal fee patent year 03
31.03.2005Renewal fee patent year 04
29.03.2006Renewal fee patent year 05
28.03.2007Renewal fee patent year 06
17.03.2008Renewal fee patent year 07
30.03.2009Renewal fee patent year 08
29.03.2010Renewal fee patent year 09
30.03.2011Renewal fee patent year 10
06.01.2012Renewal fee patent year 11
03.01.2013Renewal fee patent year 12
06.01.2014Renewal fee patent year 13
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Lapses during opposition  TooltipIT14.05.2014
[2015/22]
Documents cited:Search[X]EP0642167  (MATSUSHITA ELECTRONICS CORP [JP]);
 [X]US5716875  (JONES JR ROBERT E [US], et al);
 [XA]GB2338595  (SAMSUNG ELECTRONICS CO LTD [KR]);
 [XA]DE10001118  (INFINEON TECHNOLOGIES AG [DE])
ExaminationUS6313491
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.