-
EP1282137
European procedure
Extract from the Register of European Patents
EP About this file: EP1282137
| EP1282137 - Redundancy circuit and method for replacing defective memory cells in a flash memory device [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 17.07.2009 Database last updated on 22.05.2024 | Most recent event Tooltip | 21.08.2009 | Lapse of the patent in a contracting state | published on 23.09.2009 [2009/39] | Applicant(s) | For all designated states STMicroelectronics, Inc. 1310 Electronics Drive Carrollton Texas 75006-5309 / US | [2008/37] |
| Former [2003/06] | For all designated states STMicroelectronics, Inc. 1310 Electronics Drive Carrollton, Texas 75006-5309 / US | Inventor(s) | 01 /
Matarrese, Stella 37250 Sequoia Gerrace No. 2035 Fremont, California 94536 / US | 02 /
Fasoli, Luca Giovanni 37250 Sequoia Terrace No. 2035 Fremont, California 94536 / US | [2003/06] | Representative(s) | Style, Kelda Camilla Karen, et al Page White & Farrer Limited Bedford House 21A John Street London WC1N 2BF / GB | [N/P] |
| Former [2003/06] | Style, Kelda Camilla Karen, et al Page White & Farrer, 54 Doughty Street London WC1N 2LS / GB | Application number, filing date | 02255361.4 | 31.07.2002 | [2003/06] | Priority number, date | US20010922176 | 02.08.2001 Original published format: US 922176 | [2003/06] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP1282137 | Date: | 05.02.2003 | Language: | EN | [2003/06] | Type: | B1 Patent specification | No.: | EP1282137 | Date: | 10.09.2008 | Language: | EN | [2008/37] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 04.12.2002 | Classification | IPC: | G11C29/00 | [2003/06] | CPC: |
G11C29/808 (EP,US);
G11C29/81 (EP,US)
| Designated contracting states | DE, FR, GB, IT [2003/43] |
| Former [2003/06] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, SK, TR | Title | German: | Redundanzschaltung und Verfahren zum Ersetzen fehlerhafter Speicherzellen eines Flash-Speichers | [2003/06] | English: | Redundancy circuit and method for replacing defective memory cells in a flash memory device | [2003/06] | French: | Circuit redondant et méthode pour remplacer les cellules de mémoire défectueuses dans une mémoire flash | [2003/06] | Examination procedure | 31.07.2003 | Examination requested [2003/40] | 11.09.2003 | Despatch of a communication from the examining division (Time limit: M06) | 10.03.2004 | Reply to a communication from the examining division | 02.08.2004 | Despatch of a communication from the examining division (Time limit: M06) | 01.03.2005 | Reply to a communication from the examining division | 26.01.2006 | Despatch of a communication from the examining division (Time limit: M06) | 28.07.2006 | Reply to a communication from the examining division | 06.08.2007 | Communication of intention to grant the patent | 22.01.2008 | Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time | 19.03.2008 | Fee for grant paid | 19.03.2008 | Fee for publishing/printing paid | Opposition(s) | 11.06.2009 | No opposition filed within time limit [2009/34] | Request for further processing for: | The application is deemed to be withdrawn due to failure to fulfill actions required for granting the patent | 19.03.2008 | Request for further processing filed | 19.03.2008 | Full payment received (date of receipt of payment) Request granted | 28.04.2008 | Decision despatched | 01.03.2005 | Request for further processing filed | 01.03.2005 | Full payment received (date of receipt of payment) Request granted | 14.03.2005 | Decision despatched | Fees paid | Renewal fee | 08.06.2004 | Renewal fee patent year 03 | 13.07.2005 | Renewal fee patent year 04 | 12.07.2006 | Renewal fee patent year 05 | 13.07.2007 | Renewal fee patent year 06 | 14.07.2008 | Renewal fee patent year 07 |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | IT | 10.09.2008 | [2009/39] | Documents cited: | Search | [X]WO9631882 (MICRON TECHNOLOGY INC [US]) [X] 1-23 * abstract * * page 3, line 1 - page 4, line 26 * * page 9, line 25 - page 12, line 5 * * page 19 - page 21 * * claims 1,9,11-14 * * figures 1,2,8 *; | [X]EP0745995 (SGS THOMSON MICROELECTRONICS [IT]) [X] 1-23 * abstract * * column 9, line 25 - column 10, line 13; figure 10 *; | [A]US5592417 (MIRABEL JEAN-MICHEL [FR]) [A] 1-23* column 1, line 1 - column 2, line 48 *; | [X]DE19825012 (SIEMENS AG [DE]) [X] 1-23 * the whole document *; | [X]US5966336 (HORIGUCHI MASASHI [JP], et al) [X] 1-23 * abstract * * column 20, line 45 - column 22, line 64; figures 26,27,30; claims 1-6 * | Examination | US5808945 |