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Extract from the Register of European Patents

EP About this file: EP1237161

EP1237161 - Method and apparatus for performing atomic force microscopy measurements [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  20.03.2015
Database last updated on 05.07.2024
Most recent event   Tooltip13.10.2017Lapse of the patent in a contracting state
New state(s): TR		published on 15.11.2017  [2017/46]
Applicant(s)For all designated states
IMEC
Kapeldreef 75
3001 Leuven / BE
[2009/33]
Former [2002/36]For all designated states
INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM VZW
Kapeldreef 75
3001 Leuven / BE
Inventor(s)01 / Vandervorst, Wilfried
Stuivenberglaan 106
2800 Mechelen / BE
02 / Eyben, Pierre
Rue Charlemagne 138
4020 Liege / BE
 [2014/02]
Former [2002/36]01 / Vandervorst, Wilfried
Stuivenberglaan 106
2800 Mechelen / BE
02 / Eyben, Pierre
Rue Charlemagne 138
4020 Li-ge / BE
Representative(s)Van Malderen, Joëlle, et al
pronovem - Office Van Malderen
Avenue Josse Goffin 158
1082 Bruxelles / BE
[2014/20]
Former [2002/36]Van Malderen, Joelle, et al
Office Van Malderen, Place Reine Fabiola 6/1
1083 Bruxelles / BE
Application number, filing date02447029.627.02.2002
[2002/36]
Priority number, dateUS20010272249P28.02.2001         Original published format: US 272249 P
[2002/36]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1237161
Date:04.09.2002
Language:EN
[2002/36]
Type: A3 Search report 
No.:EP1237161
Date:21.01.2004
[2004/04]
Type: B1 Patent specification 
No.:EP1237161
Date:14.05.2014
Language:EN
[2014/20]
Search report(s)(Supplementary) European search report - dispatched on:EP11.12.2003
ClassificationIPC:G01Q10/06
[2014/01]
CPC:
G01Q10/06 (EP,US); B82Y35/00 (US); Y10S977/85 (EP,US);
Y10S977/871 (EP,US)
Former IPC [2004/03]G12B21/08, G01B7/34
Former IPC [2002/36]G12B21/08, G12B21/20
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   TR [2004/47]
Former [2004/42]
Former [2002/36]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Verfahren und Vorrichtung zur Durchführung von Rasterkraftmikroskop-Messungen[2002/36]
English:Method and apparatus for performing atomic force microscopy measurements[2002/36]
French:Méthode et dispositif pour effectuer des mesures de microscopie à force atomique[2002/36]
Examination procedure13.09.2004Examination requested  [2004/47]
15.06.2009Despatch of a communication from the examining division (Time limit: M06)
02.02.2010Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
17.02.2010Reply to a communication from the examining division
11.05.2012Despatch of a communication from the examining division (Time limit: M06)
19.09.2012Reply to a communication from the examining division
11.09.2013Despatch of a communication from the examining division (Time limit: M02)
15.10.2013Reply to a communication from the examining division
10.12.2013Communication of intention to grant the patent
07.04.2014Fee for grant paid
07.04.2014Fee for publishing/printing paid
07.04.2014Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  15.06.2009
Opposition(s)17.02.2015No opposition filed within time limit [2015/17]
Request for further processing for:The application is deemed to be withdrawn due to failure to reply to the examination report
17.02.2010Request for further processing filed
17.02.2010Full payment received (date of receipt of payment)
Fees paidRenewal fee
24.02.2004Renewal fee patent year 03
25.02.2005Renewal fee patent year 04
27.02.2006Renewal fee patent year 05
26.02.2007Renewal fee patent year 06
27.02.2008Renewal fee patent year 07
25.02.2009Renewal fee patent year 08
24.02.2010Renewal fee patent year 09
23.02.2011Renewal fee patent year 10
27.02.2012Renewal fee patent year 11
27.02.2013Renewal fee patent year 12
24.02.2014Renewal fee patent year 13
Penalty fee
Penalty fee Rule 85a EPC 1973
27.08.2004AT   M01   Fee paid on   13.09.2004
27.08.2004BE   M01   Fee paid on   13.09.2004
27.08.2004CH   M01   Fee paid on   13.09.2004
27.08.2004CY   M01   Fee paid on   13.09.2004
27.08.2004DE   M01   Fee paid on   13.09.2004
27.08.2004DK   M01   Fee paid on   13.09.2004
27.08.2004ES   M01   Fee paid on   13.09.2004
27.08.2004FI   M01   Fee paid on   13.09.2004
27.08.2004FR   M01   Fee paid on   13.09.2004
27.08.2004GB   M01   Fee paid on   13.09.2004
27.08.2004GR   M01   Fee paid on   13.09.2004
27.08.2004IE   M01   Fee paid on   13.09.2004
27.08.2004IT   M01   Fee paid on   13.09.2004
27.08.2004LU   M01   Fee paid on   13.09.2004
27.08.2004MC   M01   Fee paid on   13.09.2004
27.08.2004NL   M01   Fee paid on   13.09.2004
27.08.2004PT   M01   Fee paid on   13.09.2004
27.08.2004SE   M01   Fee paid on   13.09.2004
27.08.2004TR   M01   Fee paid on   13.09.2004
Penalty fee Rule 85b EPC 1973
27.08.2004M01   Fee paid on   13.09.2004
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT14.05.2014
BE14.05.2014
CY14.05.2014
DK14.05.2014
ES14.05.2014
FI14.05.2014
IT14.05.2014
MC14.05.2014
NL14.05.2014
SE14.05.2014
TR14.05.2014
GR15.08.2014
PT15.09.2014
[2017/46]
Former [2015/46]AT14.05.2014
BE14.05.2014
CY14.05.2014
DK14.05.2014
ES14.05.2014
FI14.05.2014
IT14.05.2014
MC14.05.2014
NL14.05.2014
SE14.05.2014
GR15.08.2014
PT15.09.2014
Former [2015/22]AT14.05.2014
BE14.05.2014
CY14.05.2014
DK14.05.2014
ES14.05.2014
FI14.05.2014
IT14.05.2014
NL14.05.2014
SE14.05.2014
GR15.08.2014
PT15.09.2014
Former [2015/12]AT14.05.2014
BE14.05.2014
CY14.05.2014
DK14.05.2014
ES14.05.2014
FI14.05.2014
NL14.05.2014
SE14.05.2014
GR15.08.2014
PT15.09.2014
Former [2015/08]AT14.05.2014
BE14.05.2014
CY14.05.2014
DK14.05.2014
ES14.05.2014
FI14.05.2014
SE14.05.2014
GR15.08.2014
PT15.09.2014
Former [2015/02]AT14.05.2014
CY14.05.2014
ES14.05.2014
FI14.05.2014
SE14.05.2014
GR15.08.2014
PT15.09.2014
Former [2014/51]AT14.05.2014
CY14.05.2014
ES14.05.2014
FI14.05.2014
SE14.05.2014
GR15.08.2014
Former [2014/50]CY14.05.2014
ES14.05.2014
FI14.05.2014
SE14.05.2014
GR15.08.2014
Former [2014/49]CY14.05.2014
FI14.05.2014
Former [2014/47]CY14.05.2014
Documents cited:Search[Y]EP0729006  (CANON KK [JP]) [Y] 8 * column 8, line 18 - line 49 * * figures 1,5 *;
 [A]US5744799  (OHARA TETSUO [US]) [A] 1-8* the whole document *;
 [XA]US5866807  (ELINGS JEFFREY R [US], et al) [X] 1,2,6 * column 10, line 65 - column 14, line 25 * * figures 8,14,15 * [A] 3-5,7,8;
 [XAY]WO9945361  (UNIV COVENTRY [GB], et al) [X] 1,2,6 * page 8, line 10 - line 18 * * page 9, line 15 - page 11, line 25 * * figure 3 * [A] 3-5,7 [Y] 8
by applicantEP0729006
 US5744799
 US5866807
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.