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EP1472522
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EP About this file: EP1472522
| EP1472522 - X-RAY INSPECTION SYSTEM AND METHOD [Right-click to bookmark this link] | Status | The application has been refused Status updated on 10.06.2011 Database last updated on 04.11.2024 | Most recent event Tooltip | 10.06.2011 | Refusal of application | published on 13.07.2011 [2011/28] | Applicant(s) | For all designated states Smiths Heimann GmbH Im Herzen 4 65205 Wiesbaden / DE | [2007/31] |
| Former [2004/45] | For all designated states Cambridge Imaging Limited St. John's Innovation Centre Cowley Road Cambridge CB4 4WS / GB | Inventor(s) | 01 /
RUSHBROOKE, John, Gordon deceased / US | 02 /
HOOPER, Claire, Elizabeth 5 Rotherwick Way Cambridge, CB1 8RX / GB | [2005/01] |
| Former [2005/01] | 01 /
RUSHBROOKE, John, Gordon 1308 Colony Plaza Newport Beach, CA 92660 / US | ||
| 02 /
HOOPER, Claire, Elizabeth 5 Rotherwick Way Cambridge, CB1 8RX / GB | |||
| Former [2004/45] | 01 /
RUSHBROOKE, John, Gordon 1308 Colony Plaza Newport Beach, CA 92660 / US | ||
| 02 /
HOOPER, Claire, Elizabeth 1308 Colony Plaza Newport Beach, CA 92660 / US | Representative(s) | Cournarie, Michèle, et al Brema-Loyer Le Centralis 63 avenue du Général Leclerc 92340 Bourg-la-Reine / FR | [N/P] |
| Former [2011/12] | Cournarie, Michèle, et al Brema-Loyer Le Centralis 63 avenue du Général Leclerc 92340 Bourg-la-Reine / FR | ||
| Former [2004/45] | Nash, Keith Wilfrid, et al KEITH W. NASH & Co., 90-92 Regent Street Cambridge CB2 1DP / GB | Application number, filing date | 02715583.7 | 28.01.2002 | [2004/45] | WO2002GB00353 | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO03065023 | Date: | 07.08.2003 | Language: | EN | [2003/32] | Type: | A1 Application with search report | No.: | EP1472522 | Date: | 03.11.2004 | Language: | EN | The application published by WIPO in one of the EPO official languages on 07.08.2003 takes the place of the publication of the European patent application. | [2004/45] | Search report(s) | International search report - published on: | EP | 07.08.2003 | Classification | IPC: | G01N23/04, G01V5/00, G01N23/10 | [2004/45] | CPC: |
H01L27/14658 (EP,US);
G01N23/083 (EP,US);
G01N23/10 (EP,US);
G01V5/22 (EP,US)
| Designated contracting states | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR [2004/45] | Title | German: | RÖNTGENSTRAHLUNTERSUCHUNGSSYSTEM UND -VERFAHREN | [2004/45] | English: | X-RAY INSPECTION SYSTEM AND METHOD | [2004/45] | French: | SYSTEME ET PROCEDE DE CONTROLE AUX RAYONS X | [2004/45] | Entry into regional phase | 19.08.2004 | National basic fee paid | 19.08.2004 | Designation fee(s) paid | 19.08.2004 | Examination fee paid | Examination procedure | 08.08.2003 | Request for preliminary examination filed International Preliminary Examining Authority: EP | 19.08.2004 | Examination requested [2004/52] | 13.10.2004 | Amendment by applicant (claims and/or description) | 28.05.2010 | Despatch of a communication from the examining division (Time limit: M06) | 30.11.2010 | Reply to a communication from the examining division | 25.02.2011 | Despatch of communication that the application is refused, reason: substantive examination [2011/28] | 07.03.2011 | Application refused, date of legal effect [2011/28] | Divisional application(s) | EP10193028.7 / EP2447709 | EP12169892.2 / EP2538205 | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 28.05.2010 | Fees paid | Renewal fee | 19.08.2004 | Renewal fee patent year 03 | 21.03.2005 | Renewal fee patent year 04 | 11.01.2006 | Renewal fee patent year 05 | 11.01.2007 | Renewal fee patent year 06 | 10.01.2008 | Renewal fee patent year 07 | 15.12.2008 | Renewal fee patent year 08 | 28.12.2009 | Renewal fee patent year 09 | Penalty fee | Additional fee for renewal fee | 31.01.2005 | 04 M06 Fee paid on 21.03.2005 | 31.01.2011 | 10 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [Y]SU1004834 ; | [YA]WO9314419 (CAMBRIDGE IMAGING LTD [GB]) [Y] 1-4,10,41,42 * page 6, paragraph 3 - page 7, paragraph 1; figure - * [A] 8; | [YA]GB2295454 (HITACHI LTD [JP], et al) [Y] 10 * abstract * * page 5, line 25 - page 6, line 2 * * page 7, line 5 - line 10 * [A] 8; | [Y]US5960057 (MAJEWSKI STANISLAW [US], et al) [Y] 1-3,10,41,42 * column 2, line 52 - line 65; figure 1 * * column 3, line 59 - line 65 * * column 4, line 53 - line 57 *; | [Y] - MAEDA K ET AL, "Development of an in-air high-resolution PIXE system", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, SECTION - B: BEAM INTERACTIONS WITH MATERIALS AND ATOMS, NORTH-HOLLAND PUBLISHING COMPANY. AMSTERDAM, NL, (19980301), vol. 134, no. 3-4, ISSN 0168-583X, pages 418 - 426, XP004122869 [Y] 1-4,10 * abstract * * page 420, column L, line 4 - line 10; figure 1 * DOI: http://dx.doi.org/10.1016/S0168-583X(97)00918-X | [Y] - DATABASE WPI, 1, Derwent World Patents Index, Database accession no. 1984-016591, XP002220277 & SU1004834 A 19830315 (CRYSTALLOGRAPHY INS) [Y] 1-3,10 * abstract * | [A] - KALININ B N ET AL, "Investigation of positron generation by relativistic electrons in aligned crystals", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, SECTION - B: BEAM INTERACTIONS WITH MATERIALS AND ATOMS, NORTH-HOLLAND PUBLISHING COMPANY. AMSTERDAM, NL, (19981002), vol. 145, no. 1-2, ISSN 0168-583X, pages 209 - 220, XP004150616 [A] 1 * page 212, column R, line 10 - line 14 * DOI: http://dx.doi.org/10.1016/S0168-583X(98)00365-6 |