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Extract from the Register of European Patents

EP About this file: EP1332612

EP1332612 - FOCAL PLANE ARRAY CALIBRATION SYSTEM [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  14.03.2008
Database last updated on 17.07.2024
Most recent event   Tooltip13.11.2009Change - representativepublished on 16.12.2009  [2009/51]
Applicant(s)For all designated states
RAYTHEON COMPANY
EO/E1/E150
2000 East El Segundo Blvd
P O Box 902
El Segundo, CA 90245-0902 / US
[N/P]
Former [2007/19]For all designated states
RAYTHEON COMPANY
EO/E1/E150, 2000 East El Segundo Blvd, P O Box 902
El Segundo, CA 90245-0902 / US
Former [2003/32]For all designated states
Raytheon Company
EO/E1/E150, 2000 East El Segundo Blvd, P O Box 902
El Segundo, CA 90245-0902 / US
Inventor(s)01 / TSAI, Cheng-Chih
12151 Cam Valencia
Cerritos, CA 90703 / US
02 / CHEN, Chungte, W.
33 Allegheny Drive
Irvine, CA 92620 / US
 [2003/32]
Representative(s)Jackson, Richard Eric, et al
Carpmaels & Ransford LLP
One Southampton Row
London WC1B 5HA / GB
[N/P]
Former [2009/51]Jackson, Richard Eric, et al
Carpmaels & Ransford 43-45 Bloomsbury Square
London WC1A 2RA / GB
Former [2003/32]Jackson, Richard Eric, et al
Carpmaels & Ransford, 43 Bloomsbury Square
London WC1A 2RA / GB
Application number, filing date02763419.506.08.2002
[2003/32]
WO2002US24931
Priority number, dateUS2001092316206.08.2001         Original published format: US 923162
[2003/32]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO03015397
Date:20.02.2003
Language:EN
[2003/08]
Type: A1 Application with search report 
No.:EP1332612
Date:06.08.2003
Language:EN
The application published by WIPO in one of the EPO official languages on 20.02.2003 takes the place of the publication of the European patent application.
[2003/32]
Type: B1 Patent specification 
No.:EP1332612
Date:09.05.2007
Language:EN
[2007/19]
Search report(s)International search report - published on:EP20.02.2003
ClassificationIPC:H04N5/217, G01J5/52
[2003/32]
CPC:
G01J5/52 (EP,US); H04N25/672 (EP,US); H04N23/20 (EP);
H04N5/33 (US)
Designated contracting statesDE,   FR,   GB [2006/45]
Former [2003/32]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  SK,  TR 
TitleGerman:FOKALEBENEN-ARRAY-KALIBRATIONSSYSTEM[2003/32]
English:FOCAL PLANE ARRAY CALIBRATION SYSTEM[2003/32]
French:SYSTEME DE CALIBRAGE D'UNE MATRICE A PLAN FOCAL[2003/32]
Entry into regional phase11.04.2003National basic fee paid 
11.04.2003Designation fee(s) paid 
11.04.2003Examination fee paid 
Examination procedure11.04.2003Examination requested  [2003/32]
30.09.2005Despatch of a communication from the examining division (Time limit: M06)
08.03.2006Reply to a communication from the examining division
20.10.2006Communication of intention to grant the patent
05.01.2007Fee for grant paid
05.01.2007Fee for publishing/printing paid
Opposition(s)12.02.2008No opposition filed within time limit [2008/16]
Fees paidRenewal fee
13.07.2004Renewal fee patent year 03
15.07.2005Renewal fee patent year 04
13.07.2006Renewal fee patent year 05
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Cited inInternational search[A]US4876453  (WIRICK MICHAEL P [US]);
 [A]US5302824  (PRAGER KENNETH E [US]);
 [A]US5514865  (O'NEIL WILLIAM F [US])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.