EP1332612 - FOCAL PLANE ARRAY CALIBRATION SYSTEM [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 14.03.2008 Database last updated on 17.07.2024 | Most recent event Tooltip | 13.11.2009 | Change - representative | published on 16.12.2009 [2009/51] | Applicant(s) | For all designated states RAYTHEON COMPANY EO/E1/E150 2000 East El Segundo Blvd P O Box 902 El Segundo, CA 90245-0902 / US | [N/P] |
Former [2007/19] | For all designated states RAYTHEON COMPANY EO/E1/E150, 2000 East El Segundo Blvd, P O Box 902 El Segundo, CA 90245-0902 / US | ||
Former [2003/32] | For all designated states Raytheon Company EO/E1/E150, 2000 East El Segundo Blvd, P O Box 902 El Segundo, CA 90245-0902 / US | Inventor(s) | 01 /
TSAI, Cheng-Chih 12151 Cam Valencia Cerritos, CA 90703 / US | 02 /
CHEN, Chungte, W. 33 Allegheny Drive Irvine, CA 92620 / US | [2003/32] | Representative(s) | Jackson, Richard Eric, et al Carpmaels & Ransford LLP One Southampton Row London WC1B 5HA / GB | [N/P] |
Former [2009/51] | Jackson, Richard Eric, et al Carpmaels & Ransford 43-45 Bloomsbury Square London WC1A 2RA / GB | ||
Former [2003/32] | Jackson, Richard Eric, et al Carpmaels & Ransford, 43 Bloomsbury Square London WC1A 2RA / GB | Application number, filing date | 02763419.5 | 06.08.2002 | [2003/32] | WO2002US24931 | Priority number, date | US20010923162 | 06.08.2001 Original published format: US 923162 | [2003/32] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO03015397 | Date: | 20.02.2003 | Language: | EN | [2003/08] | Type: | A1 Application with search report | No.: | EP1332612 | Date: | 06.08.2003 | Language: | EN | The application published by WIPO in one of the EPO official languages on 20.02.2003 takes the place of the publication of the European patent application. | [2003/32] | Type: | B1 Patent specification | No.: | EP1332612 | Date: | 09.05.2007 | Language: | EN | [2007/19] | Search report(s) | International search report - published on: | EP | 20.02.2003 | Classification | IPC: | H04N5/217, G01J5/52 | [2003/32] | CPC: |
G01J5/52 (EP,US);
H04N25/672 (EP,US);
H04N23/20 (EP);
H04N5/33 (US)
| Designated contracting states | DE, FR, GB [2006/45] |
Former [2003/32] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, SK, TR | Title | German: | FOKALEBENEN-ARRAY-KALIBRATIONSSYSTEM | [2003/32] | English: | FOCAL PLANE ARRAY CALIBRATION SYSTEM | [2003/32] | French: | SYSTEME DE CALIBRAGE D'UNE MATRICE A PLAN FOCAL | [2003/32] | Entry into regional phase | 11.04.2003 | National basic fee paid | 11.04.2003 | Designation fee(s) paid | 11.04.2003 | Examination fee paid | Examination procedure | 11.04.2003 | Examination requested [2003/32] | 30.09.2005 | Despatch of a communication from the examining division (Time limit: M06) | 08.03.2006 | Reply to a communication from the examining division | 20.10.2006 | Communication of intention to grant the patent | 05.01.2007 | Fee for grant paid | 05.01.2007 | Fee for publishing/printing paid | Opposition(s) | 12.02.2008 | No opposition filed within time limit [2008/16] | Fees paid | Renewal fee | 13.07.2004 | Renewal fee patent year 03 | 15.07.2005 | Renewal fee patent year 04 | 13.07.2006 | Renewal fee patent year 05 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [A]US4876453 (WIRICK MICHAEL P [US]); | [A]US5302824 (PRAGER KENNETH E [US]); | [A]US5514865 (O'NEIL WILLIAM F [US]) |