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EP1477795
European procedure
Extract from the Register of European Patents
EP About this file: EP1477795
| EP1477795 - X-ray diffractometer for grazing incidence diffraction of horizontally and vertically oriented samples [Right-click to bookmark this link] | |||
| Former [2004/47] | X-ray diffractometer for grazing incidence diffraction of horizontally oriented samples | ||
| [2006/34] | Status | No opposition filed within time limit Status updated on 18.01.2008 Database last updated on 03.09.2024 | Most recent event Tooltip | 22.05.2009 | Change - representative | published on 24.06.2009 [2009/26] | Applicant(s) | For all designated states Bruker AXS GmbH Östliche Rheinbrückenstrasse 50 76187 Karlsruhe / DE | [2007/11] |
| Former [2004/47] | For all designated states Bruker AXS GmbH Östliche Rheinbrückenstrasse 50 76187 Karlsruhe / DE | Inventor(s) | 01 /
Vigliante, Assunta Jelinstrasse 16 70567 Stuttgart / DE | [2004/47] | Representative(s) | Kohler Schmid Möbus Patentanwälte Partnerschaftsgesellschaft mbB Gropiusplatz 10 70563 Stuttgart / DE | [N/P] |
| Former [2009/26] | Kohler Schmid Möbus Patentanwälte Ruppmannstrasse 27 70565 Stuttgart / DE | ||
| Former [2004/47] | KOHLER SCHMID + PARTNER Patentanwälte GbR, Ruppmannstrasse 27 70565 Stuttgart / DE | Application number, filing date | 03010763.5 | 14.05.2003 | [2004/47] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP1477795 | Date: | 17.11.2004 | Language: | EN | [2004/47] | Type: | B1 Patent specification | No.: | EP1477795 | Date: | 14.03.2007 | Language: | EN | [2007/11] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 15.12.2003 | Classification | IPC: | G01N23/201, G01N23/20 | [2004/47] | CPC: |
G01N23/201 (EP,US);
G01N23/207 (EP,US)
| Designated contracting states | DE, GB, NL [2005/31] |
| Former [2004/47] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LI, LU, MC, NL, PT, RO, SE, SI, SK, TR | Title | German: | Röntgendiffraktometer für die Diffraktion von horizontal und vertikal orientierten Proben unter streifendem Einfallswinkel | [2006/34] | English: | X-ray diffractometer for grazing incidence diffraction of horizontally and vertically oriented samples | [2006/34] | French: | Diffractomètre à rayons X pour la diffraction à incidence rasante d'échantillons orientés horizontalement et verticalement | [2006/34] |
| Former [2004/47] | Röntgendiffraktometer für die Diffraktion von horizontal orientierten Proben unter streifendem Einfallswinkel | ||
| Former [2004/47] | X-ray diffractometer for grazing incidence diffraction of horizontally oriented samples | ||
| Former [2004/47] | Diffractomètre à rayons X pour la diffraction à incidence rasante d'échantillons orientés horizontalement | Examination procedure | 19.12.2003 | Amendment by applicant (claims and/or description) | 09.07.2004 | Examination requested [2004/47] | 18.05.2005 | Loss of particular rights, legal effect: designated state(s) | 09.09.2005 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, FR, GR, HU, IE, IT, LU, MC, PT, RO, SE, SI, SK, TR | 28.09.2006 | Communication of intention to grant the patent | 26.01.2007 | Fee for grant paid | 26.01.2007 | Fee for publishing/printing paid | Opposition(s) | 17.12.2007 | No opposition filed within time limit [2008/08] | Fees paid | Renewal fee | 21.04.2005 | Renewal fee patent year 03 | 27.05.2006 | Renewal fee patent year 04 | Penalty fee | Penalty fee Rule 85a EPC 1973 | 21.06.2005 | AT M01 Not yet paid | 21.06.2005 | BE M01 Not yet paid | 21.06.2005 | BG M01 Not yet paid | 21.06.2005 | CH M01 Not yet paid | 21.06.2005 | CY M01 Not yet paid | 21.06.2005 | CZ M01 Not yet paid | 21.06.2005 | DK M01 Not yet paid | 21.06.2005 | EE M01 Not yet paid | 21.06.2005 | ES M01 Not yet paid | 21.06.2005 | FI M01 Not yet paid | 21.06.2005 | FR M01 Not yet paid | 21.06.2005 | GR M01 Not yet paid | 21.06.2005 | HU M01 Not yet paid | 21.06.2005 | IE M01 Not yet paid | 21.06.2005 | IT M01 Not yet paid | 21.06.2005 | LU M01 Not yet paid | 21.06.2005 | MC M01 Not yet paid | 21.06.2005 | PT M01 Not yet paid | 21.06.2005 | RO M01 Not yet paid | 21.06.2005 | SE M01 Not yet paid | 21.06.2005 | SI M01 Not yet paid | 21.06.2005 | SK M01 Not yet paid | 21.06.2005 | TR M01 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US5214685 (HOWELLS MALCOLM R [US]) [A] 1-12 * column 5, line 10 - column 6, line 30 ** figure 1 *; | [A]US2002160305 (HORIE MICHIKAZU [JP], et al) [A] 1-12 * page 18, paragraphs 215,216 * * figure 3 *; | [A]US2003009316 (YOKOYAMA RYOUICHI [JP], et al) [A] 1-12 * page 7, paragraph 108 - page 11, paragraph 192 * * figures 15,16 *; | [X] - DAILLANT J ET AL., "High-resolution x-ray scattering measurements: I. Surfaces", REPORTS ON PROGRESS IN PHYSICS, (2000), vol. 63, pages 1725 - 1777, XP002262819 [X] 5-12 * page 1735, paragraph 3 - page 1736, paragraph 2 * * page 1740, paragraph 4 - page 1743 * * figures 2,4,5 * DOI: http://dx.doi.org/10.1088/0034-4885/63/10/203 | [A] - SAKATA O ET AL, "Ultrahigh-vacuum facility for high-resolution grazing-angle X-ray diffraction at a vertical wiggler source of synchrotron radiation", JOURNAL OF SYNCHROTRON RADIATION, 1 JULY 1998, MUNKSGAARD INTERNATIONAL BOOKSELLERS AND PUBLISHERS FOR INT. UNION CRYSTALLOGR, DENMARK, vol. 63, ISSN 0909-0495, pages 1222 - 1226, XP009021719 [A] 1-12 * abstract * DOI: http://dx.doi.org/10.1107/S0909049598000806 |